{"id":"https://openalex.org/W4285271281","doi":"https://doi.org/10.1109/tim.2022.3180436","title":"Enhanced Dynamic Dual-Latent Variable Model for Multirate Process Monitoring and Its Industrial Application","display_name":"Enhanced Dynamic Dual-Latent Variable Model for Multirate Process Monitoring and Its Industrial Application","publication_year":2022,"publication_date":"2022-06-06","ids":{"openalex":"https://openalex.org/W4285271281","doi":"https://doi.org/10.1109/tim.2022.3180436"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3180436","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3180436","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100642692","display_name":"Yuchen He","orcid":"https://orcid.org/0000-0002-0528-2778"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuchen He","raw_affiliation_strings":["Key Laboratory of Intelligent Manufacturing Quality Big Data Tracing and Analysis of Zhejiang Province, China Jiliang University, Hangzhou, China","Sicher Elevator Company Ltd., Huzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-0528-2778","affiliations":[{"raw_affiliation_string":"Key Laboratory of Intelligent Manufacturing Quality Big Data Tracing and Analysis of Zhejiang Province, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]},{"raw_affiliation_string":"Sicher Elevator Company Ltd., Huzhou, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028145248","display_name":"Ze Ying","orcid":"https://orcid.org/0000-0002-6210-0571"},"institutions":[{"id":"https://openalex.org/I55538621","display_name":"China Jiliang University","ror":"https://ror.org/05v1y0t93","country_code":"CN","type":"education","lineage":["https://openalex.org/I55538621"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ze Ying","raw_affiliation_strings":["Key Laboratory of Intelligent Manufacturing Quality Big Data Tracing and Analysis of Zhejiang Province, China Jiliang University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-6210-0571","affiliations":[{"raw_affiliation_string":"Key Laboratory of Intelligent Manufacturing Quality Big Data Tracing and Analysis of Zhejiang Province, China Jiliang University, Hangzhou, China","institution_ids":["https://openalex.org/I55538621"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100377634","display_name":"Yun Wang","orcid":"https://orcid.org/0000-0002-7512-0168"},"institutions":[{"id":"https://openalex.org/I4210151378","display_name":"Zhejiang Tongji Vocational College of Science and Technology","ror":"https://ror.org/04p4ra235","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210151378"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yun Wang","raw_affiliation_strings":["Mechanical and Electrical Engineering Department, Zhejiang Tongji Vocational College of Science and Technology, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-7512-0168","affiliations":[{"raw_affiliation_string":"Mechanical and Electrical Engineering Department, Zhejiang Tongji Vocational College of Science and Technology, Hangzhou, China","institution_ids":["https://openalex.org/I4210151378"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100440022","display_name":"Jie Wang","orcid":"https://orcid.org/0000-0001-8623-4622"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jie Wang","raw_affiliation_strings":["Hangzhou Yizhang Technology Company Ltd., Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou Yizhang Technology Company Ltd., Hangzhou, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.3458,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.88235644,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"72","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.7100631594657898},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6341119408607483},{"id":"https://openalex.org/keywords/latent-variable","display_name":"Latent variable","score":0.6295595169067383},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.5707089304924011},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5695608854293823},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5507684946060181},{"id":"https://openalex.org/keywords/markov-process","display_name":"Markov process","score":0.5063351392745972},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.4550330638885498},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.45030224323272705},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3583364188671112},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1651906967163086},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.1404472291469574},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13094115257263184},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0738241970539093}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.7100631594657898},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6341119408607483},{"id":"https://openalex.org/C51167844","wikidata":"https://www.wikidata.org/wiki/Q4422623","display_name":"Latent variable","level":2,"score":0.6295595169067383},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.5707089304924011},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5695608854293823},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5507684946060181},{"id":"https://openalex.org/C159886148","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov process","level":2,"score":0.5063351392745972},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.4550330638885498},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.45030224323272705},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3583364188671112},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1651906967163086},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.1404472291469574},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13094115257263184},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0738241970539093},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3180436","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3180436","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.4699999988079071}],"awards":[{"id":"https://openalex.org/G1794676425","display_name":null,"funder_award_id":"Y202249499","funder_id":"https://openalex.org/F4320338464","funder_display_name":"Natural Science Foundation of Zhejiang Province"},{"id":"https://openalex.org/G6049452134","display_name":null,"funder_award_id":"61903352","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7530914154","display_name":null,"funder_award_id":"2022YFB3304103","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320338464","display_name":"Natural Science Foundation of Zhejiang Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W291224904","https://openalex.org/W1986759966","https://openalex.org/W1990524187","https://openalex.org/W1998745983","https://openalex.org/W2041834949","https://openalex.org/W2072080277","https://openalex.org/W2077791644","https://openalex.org/W2081168814","https://openalex.org/W2090575729","https://openalex.org/W2120135212","https://openalex.org/W2303507108","https://openalex.org/W2342028629","https://openalex.org/W2466822794","https://openalex.org/W2592723677","https://openalex.org/W2594639291","https://openalex.org/W2741800562","https://openalex.org/W2762715547","https://openalex.org/W2765219101","https://openalex.org/W2770168992","https://openalex.org/W2811407124","https://openalex.org/W2888609085","https://openalex.org/W2889017122","https://openalex.org/W2901169631","https://openalex.org/W2907142691","https://openalex.org/W2910025884","https://openalex.org/W2913259000","https://openalex.org/W2913572852","https://openalex.org/W2942011131","https://openalex.org/W2959724594","https://openalex.org/W2977140118","https://openalex.org/W2999155157","https://openalex.org/W3011199358","https://openalex.org/W3045201207","https://openalex.org/W3082184637","https://openalex.org/W3115428558","https://openalex.org/W3127688238"],"related_works":["https://openalex.org/W1580685205","https://openalex.org/W2013493105","https://openalex.org/W2760382975","https://openalex.org/W3191856393","https://openalex.org/W2349716249","https://openalex.org/W1463864201","https://openalex.org/W2120941928","https://openalex.org/W4206770590","https://openalex.org/W2745986669","https://openalex.org/W2118844790"],"abstract_inverted_index":{"Quality-related":[0],"process":[1,9,18,36,43,89],"monitoring":[2,30,44],"is":[3,53,94,106,118,129],"an":[4,28],"important":[5],"tool":[6],"to":[7,26,34,71,81,108],"ensure":[8],"safety":[10],"and":[11,20,38,75,113,140],"product":[12],"quality.":[13],"However,":[14],"the":[15,88,91,110,126,141],"existence":[16],"of":[17,60,125],"dynamics":[19,37],"multirate":[21,39,42,98],"sampling":[22,85],"makes":[23],"it":[24],"difficult":[25],"construct":[27],"efficient":[29],"model.":[31],"In":[32,79],"order":[33],"handle":[35],"sampling,":[40],"a":[41,48,97,114,136],"method":[45,128],"based":[46],"on":[47],"dynamic":[49,77],"dual-latent":[50],"variable":[51],"model":[52,56,93],"proposed.":[54],"The":[55,120],"involves":[57],"two":[58,132],"sets":[59],"latent":[61],"variables":[62],"modeled":[63],"as":[64],"first-order":[65],"Markov":[66],"chains,":[67],"which":[68],"are":[69],"used":[70,107],"capture":[72],"both":[73],"quality-related":[74],"quality-unrelated":[76],"information.":[78],"addition,":[80],"deal":[82],"with":[83,96],"multiple":[84],"rates":[86],"in":[87],"data,":[90],"proposed":[92,127],"combined":[95],"Kalman":[99],"filtering":[100],"technique.":[101],"An":[102],"expectation-maximization":[103],"(EM)":[104],"algorithm":[105],"estimate":[109],"unknown":[111],"parameters,":[112],"fault":[115,122],"detection":[116,123],"strategy":[117],"developed.":[119],"higher":[121],"rate":[124],"verified":[130],"by":[131],"application":[133],"studies":[134],"including":[135],"real":[137],"industrial":[138],"experiment":[139],"Tennessee":[142],"Eastman":[143],"(TE)":[144],"process.":[145]},"counts_by_year":[{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}