{"id":"https://openalex.org/W4285066555","doi":"https://doi.org/10.1109/tim.2022.3180409","title":"Fault Diagnosis of DAB Converters Based on ResNet With Adaptive Threshold Denoising","display_name":"Fault Diagnosis of DAB Converters Based on ResNet With Adaptive Threshold Denoising","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285066555","doi":"https://doi.org/10.1109/tim.2022.3180409"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3180409","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3180409","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037477264","display_name":"Fenghuang Cai","orcid":"https://orcid.org/0000-0002-9484-3089"},"institutions":[{"id":"https://openalex.org/I80947539","display_name":"Fuzhou University","ror":"https://ror.org/011xvna82","country_code":"CN","type":"education","lineage":["https://openalex.org/I80947539"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Fenghuang Cai","raw_affiliation_strings":["College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","College of Electrical Engineering and Automation, Fuzhou University and Kehua Hengsheng Power Electronics Technology Research Center"],"raw_orcid":"https://orcid.org/0000-0002-9484-3089","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","institution_ids":["https://openalex.org/I80947539"]},{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University and Kehua Hengsheng Power Electronics Technology Research Center","institution_ids":["https://openalex.org/I80947539"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Mingsong Zhan","orcid":"https://orcid.org/0000-0003-0355-1353"},"institutions":[{"id":"https://openalex.org/I80947539","display_name":"Fuzhou University","ror":"https://ror.org/011xvna82","country_code":"CN","type":"education","lineage":["https://openalex.org/I80947539"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingsong Zhan","raw_affiliation_strings":["College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","College of Electrical Engineering and Automation, Fuzhou University and Kehua Hengsheng Power Electronics Technology Research Center"],"raw_orcid":"https://orcid.org/0000-0003-0355-1353","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","institution_ids":["https://openalex.org/I80947539"]},{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University and Kehua Hengsheng Power Electronics Technology Research Center","institution_ids":["https://openalex.org/I80947539"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009886240","display_name":"Qinqin Chai","orcid":"https://orcid.org/0000-0002-4742-7808"},"institutions":[{"id":"https://openalex.org/I80947539","display_name":"Fuzhou University","ror":"https://ror.org/011xvna82","country_code":"CN","type":"education","lineage":["https://openalex.org/I80947539"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qinqin Chai","raw_affiliation_strings":["College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","College of Electrical Engineering and Automation, Fuzhou University and Kehua Hengsheng Power Electronics Technology Research Center"],"raw_orcid":"https://orcid.org/0000-0002-4742-7808","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China","institution_ids":["https://openalex.org/I80947539"]},{"raw_affiliation_string":"College of Electrical Engineering and Automation, Fuzhou University and Kehua Hengsheng Power Electronics Technology Research Center","institution_ids":["https://openalex.org/I80947539"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032530861","display_name":"Jiahui Jiang","orcid":"https://orcid.org/0000-0003-0306-3448"},"institutions":[{"id":"https://openalex.org/I108688024","display_name":"Qingdao University","ror":"https://ror.org/021cj6z65","country_code":"CN","type":"education","lineage":["https://openalex.org/I108688024"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiahui Jiang","raw_affiliation_strings":["College of Electrical Engineering, Qingdao University, Qingdao, China","College of Electrical Engineering, Qingdao University, Qingdao, Shandong 266071, China"],"raw_orcid":"https://orcid.org/0000-0003-0306-3448","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Qingdao University, Qingdao, China","institution_ids":["https://openalex.org/I108688024"]},{"raw_affiliation_string":"College of Electrical Engineering, Qingdao University, Qingdao, Shandong 266071, China","institution_ids":["https://openalex.org/I108688024"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5037477264"],"corresponding_institution_ids":["https://openalex.org/I80947539"],"apc_list":null,"apc_paid":null,"fwci":2.4016,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.88929943,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7594409584999084},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.6235620379447937},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5231227278709412},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5010533332824707},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.46637728810310364},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4463469386100769},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32676321268081665},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2736012935638428},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2693970799446106},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11504319310188293}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7594409584999084},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.6235620379447937},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5231227278709412},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5010533332824707},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.46637728810310364},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4463469386100769},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32676321268081665},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2736012935638428},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2693970799446106},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11504319310188293},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3180409","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3180409","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6000000238418579,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3848233900","display_name":null,"funder_award_id":"2021J01636","funder_id":"https://openalex.org/F4320321878","funder_display_name":"Natural Science Foundation of Fujian Province"},{"id":"https://openalex.org/G7811012242","display_name":null,"funder_award_id":"ZR2019QEE004","funder_id":"https://openalex.org/F4320324174","funder_display_name":"Natural Science Foundation of Shandong Province"}],"funders":[{"id":"https://openalex.org/F4320321878","display_name":"Natural Science Foundation of Fujian Province","ror":null},{"id":"https://openalex.org/F4320324174","display_name":"Natural Science Foundation of Shandong Province","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W2003099669","https://openalex.org/W2064437587","https://openalex.org/W2194775991","https://openalex.org/W2298299401","https://openalex.org/W2302255633","https://openalex.org/W2343497567","https://openalex.org/W2473360366","https://openalex.org/W2519348275","https://openalex.org/W2602898798","https://openalex.org/W2740435195","https://openalex.org/W2750456043","https://openalex.org/W2785766291","https://openalex.org/W2800911105","https://openalex.org/W2808344129","https://openalex.org/W2810383702","https://openalex.org/W2898375427","https://openalex.org/W2921598903","https://openalex.org/W2929968583","https://openalex.org/W2945834994","https://openalex.org/W2967766887","https://openalex.org/W2994195954","https://openalex.org/W3009015390","https://openalex.org/W3036775043","https://openalex.org/W3086064036","https://openalex.org/W3133658534","https://openalex.org/W3165481132","https://openalex.org/W4205437750","https://openalex.org/W4213031592","https://openalex.org/W4244393449","https://openalex.org/W4297665946","https://openalex.org/W6638667902","https://openalex.org/W6775845032"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2070883797","https://openalex.org/W4386859288","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2154984715","https://openalex.org/W2074272557"],"abstract_inverted_index":{"Dual":[0],"active":[1],"bridge":[2],"(DAB)":[3],"converter":[4],"can":[5,127,169],"connect":[6],"several":[7],"AC":[8],"distribution":[9,24],"networks":[10,64],"with":[11],"different":[12,105,158,193],"voltage":[13],"levels":[14],"by":[15,99,143],"a":[16,31,53,122,137,145],"common":[17],"DC":[18],"bus":[19],"to":[20,96,103],"form":[21],"AC/DC":[22],"hybrid":[23],"networks.":[25],"Its":[26],"reliability":[27],"issue":[28],"has":[29],"become":[30],"hot":[32],"research":[33],"topic":[34],"in":[35,50,131],"academia":[36],"and":[37,52,84,176,200],"industry.":[38],"In":[39],"this":[40,68],"paper,":[41],"the":[42,74,93,108,118,132,150,166,172,181,198,203],"fault":[43,54,109,175],"operation":[44],"mode":[45],"of":[46,73,78,107,154,202],"DAB":[47],"is":[48,65,115,185],"analyzed":[49],"detail,":[51],"diagnosis":[55,75],"strategy":[56],"based":[57],"on":[58,67],"adaptive":[59,139],"threshold":[60,85,113],"denoising":[61,140,152],"for":[62],"residual":[63],"proposed":[66,167],"basis.":[69],"The":[70,87,112,125,161],"main":[71],"module":[72,83,91],"algorithm":[76,114],"consists":[77],"an":[79],"improved":[80,88],"channel":[81,89],"attention":[82,90],"algorithm.":[86],"improves":[92],"network’s":[94],"ability":[95,153],"learn":[97],"features":[98,106],"using":[100],"two":[101],"ways":[102],"extract":[104],"signal":[110,151],"separately.":[111],"embedded":[116],"into":[117],"deep":[119],"network":[120],"as":[121],"nonlinear":[123],"layer.":[124],"thresholds":[126],"be":[128],"learned":[129],"adaptively":[130],"established":[133],"cells,":[134],"which":[135,196],"plays":[136],"good":[138],"capability.":[141],"Finally,":[142],"building":[144],"Hardware-in-the-Loop":[146],"system,":[147],"we":[148],"compare":[149],"various":[155],"methods":[156,191],"at":[157],"signal-to-noise":[159,194],"ratios.":[160],"experimental":[162],"results":[163],"demonstrate":[164],"that":[165],"method":[168],"accurately":[170],"locate":[171],"open":[173],"circuit":[174],"achieve":[177],"99.82%":[178],"accuracy":[179],"under":[180,192],"original":[182],"data.":[183],"It":[184],"also":[186],"more":[187],"accurate":[188],"than":[189],"other":[190],"ratios,":[195],"verifies":[197],"correctness":[199],"effectiveness":[201],"method.":[204]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":8}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}