{"id":"https://openalex.org/W4285230289","doi":"https://doi.org/10.1109/tim.2022.3175972","title":"A Miniaturized Ultrawideband Active Electric Probe with High Sensitivity for Near-Field Measurement","display_name":"A Miniaturized Ultrawideband Active Electric Probe with High Sensitivity for Near-Field Measurement","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285230289","doi":"https://doi.org/10.1109/tim.2022.3175972"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3175972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3175972","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101933746","display_name":"Yang Zhou","orcid":"https://orcid.org/0000-0001-5172-3290"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yang Zhou","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027985916","display_name":"Zhaowen Yan","orcid":"https://orcid.org/0000-0003-0994-7578"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaowen Yan","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100606290","display_name":"Jianwei Wang","orcid":"https://orcid.org/0000-0002-4028-8198"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianwei Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019764489","display_name":"Kunkun Hu","orcid":"https://orcid.org/0000-0002-7168-5823"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kunkun Hu","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing 100191, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing 100191, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119011782","display_name":"Dongyan Zhao","orcid":"https://orcid.org/0000-0002-2543-1814"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dongyan Zhao","raw_affiliation_strings":["Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd"],"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078633528","display_name":"Yanning Chen","orcid":"https://orcid.org/0000-0002-1337-9668"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanning Chen","raw_affiliation_strings":["Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd"],"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100362744","display_name":"Yang Zhao","orcid":"https://orcid.org/0000-0002-8452-8579"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yang Zhao","raw_affiliation_strings":["Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd"],"affiliations":[{"raw_affiliation_string":"Beijing Engineering Research Center of High-reliability IC with Power Industrial Grade, Beijing Smart-Chip Microelectronics Technology Co., Ltd","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101933746"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.8418,"has_fulltext":false,"cited_by_count":22,"citation_normalized_percentile":{"value":0.85018684,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.6152605414390564},{"id":"https://openalex.org/keywords/flatness","display_name":"Flatness (cosmology)","score":0.5965492725372314},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.574926495552063},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5586472749710083},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5285179615020752},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.522517204284668},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5033859610557556},{"id":"https://openalex.org/keywords/near-and-far-field","display_name":"Near and far field","score":0.45105141401290894},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.44987574219703674},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.44586363434791565},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4112025499343872},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3402252793312073},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2957552671432495},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.23500481247901917},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1557127833366394},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.12776407599449158},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.11771109700202942}],"concepts":[{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.6152605414390564},{"id":"https://openalex.org/C2778530986","wikidata":"https://www.wikidata.org/wiki/Q5457948","display_name":"Flatness (cosmology)","level":3,"score":0.5965492725372314},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.574926495552063},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5586472749710083},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5285179615020752},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.522517204284668},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5033859610557556},{"id":"https://openalex.org/C25227671","wikidata":"https://www.wikidata.org/wiki/Q13405516","display_name":"Near and far field","level":2,"score":0.45105141401290894},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.44987574219703674},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.44586363434791565},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4112025499343872},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3402252793312073},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2957552671432495},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.23500481247901917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1557127833366394},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.12776407599449158},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.11771109700202942},{"id":"https://openalex.org/C26405456","wikidata":"https://www.wikidata.org/wiki/Q338","display_name":"Cosmology","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3175972","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3175972","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8500000238418579,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G7088002935","display_name":null,"funder_award_id":"U1866212","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2031329971","https://openalex.org/W2078831586","https://openalex.org/W2165141993","https://openalex.org/W2605245762","https://openalex.org/W2617451795","https://openalex.org/W2765097732","https://openalex.org/W2766466681","https://openalex.org/W2912766525","https://openalex.org/W2944536458","https://openalex.org/W2975452352","https://openalex.org/W3006018790","https://openalex.org/W3161603162"],"related_works":["https://openalex.org/W2789295429","https://openalex.org/W2540573954","https://openalex.org/W2782313579","https://openalex.org/W2743501974","https://openalex.org/W2066314436","https://openalex.org/W2588834286","https://openalex.org/W2510927817","https://openalex.org/W2325727422","https://openalex.org/W4390944877","https://openalex.org/W2593137240"],"abstract_inverted_index":{"A":[0],"miniaturized":[1],"ultrawideband":[2],"active":[3],"electric":[4],"probe":[5,18,48,91,114,124],"with":[6,21,25,57,97],"high":[7],"sensitivity":[8],"for":[9,128],"near-field":[10,129],"measurement":[11,130],"is":[12,19,70,92,108,125],"proposed":[13],"in":[14,74,135],"this":[15],"paper.":[16],"The":[17,47,86],"designed":[20],"a":[22,42,136],"four-layer":[23],"PCB":[24],"mainly":[26],"two":[27],"chips,":[28],"an":[29],"amplification":[30],"chip":[31,45],"(HMC797APM5E)":[32],"which":[33],"can":[34,49,115],"work":[35,50],"from":[36,51,80],"dc":[37],"to":[38,54,63,83,131],"22":[39],"GHz":[40,56,82],"and":[41,102],"power":[43],"management":[44],"(HMC980LP4E).":[46],"9":[52],"kHz":[53],"18":[55,84],"15":[58],"dB":[59,73],"average":[60],"gain":[61],"compared":[62],"the":[64,68,90,103,106,113,121,123],"passive":[65],"probe.":[66],"And":[67],"flatness":[69],"about":[71],"±4":[72],"terms":[75],"of":[76,89,105],"|S21|":[77],"(transfer":[78],"factor)":[79],"2.5":[81],"GHz.":[85],"maximum":[87],"size":[88],"64":[93],"mm":[94,96,99],"41.5":[95],"1":[98],"spatial":[100],"resolution,":[101],"width":[104],"tip":[107],"only":[109],"4.1":[110],"mm,":[111],"so":[112],"handle":[116],"most":[117],"test":[118],"environments.":[119],"On":[120],"whole,":[122],"very":[126],"efficient":[127],"detect":[132],"weak":[133],"signals":[134],"wide":[137],"bandwidth.":[138]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":5}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}