{"id":"https://openalex.org/W4285223418","doi":"https://doi.org/10.1109/tim.2022.3175047","title":"A Modified Quartz Crystal Capacitance Circuit by Using Parallel Inductance and Its Application for Microdisplacement Sensing","display_name":"A Modified Quartz Crystal Capacitance Circuit by Using Parallel Inductance and Its Application for Microdisplacement Sensing","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285223418","doi":"https://doi.org/10.1109/tim.2022.3175047"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3175047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3175047","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5091661058","display_name":"Xing Ding","orcid":"https://orcid.org/0000-0001-5176-907X"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xing Ding","raw_affiliation_strings":["School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China"],"raw_orcid":"https://orcid.org/0000-0001-5176-907X","affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036917237","display_name":"Mingxin Zhu","orcid":"https://orcid.org/0000-0003-4230-3301"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingxin Zhu","raw_affiliation_strings":["School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China"],"raw_orcid":"https://orcid.org/0000-0003-4230-3301","affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100648526","display_name":"Xiangdong Chen","orcid":"https://orcid.org/0000-0002-5518-7226"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiangdong Chen","raw_affiliation_strings":["School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China"],"raw_orcid":"https://orcid.org/0000-0002-5518-7226","affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021226284","display_name":"Jiashu Zhang","orcid":"https://orcid.org/0000-0003-2086-0991"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiashu Zhang","raw_affiliation_strings":["School of Computing and Artificial Intelligence, Southwest Jiaotong University, Sichuan, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-2086-0991","affiliations":[{"raw_affiliation_string":"School of Computing and Artificial Intelligence, Southwest Jiaotong University, Sichuan, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004583241","display_name":"Xiang Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiang Yu","raw_affiliation_strings":["School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China"],"raw_orcid":"https://orcid.org/0000-0002-0564-1216","affiliations":[{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]},{"raw_affiliation_string":"School of Information Science and Technology, Southwest Jiaotong University, Chengdu 610031, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4800084"],"apc_list":null,"apc_paid":null,"fwci":0.0793,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.33696198,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11160","display_name":"Acoustic Wave Resonator Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11449","display_name":"Mechanical and Optical Resonators","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.7756845951080322},{"id":"https://openalex.org/keywords/capacitive-sensing","display_name":"Capacitive sensing","score":0.6786853671073914},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.5454805493354797},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.5452859401702881},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.5426583290100098},{"id":"https://openalex.org/keywords/capacitance-probe","display_name":"Capacitance probe","score":0.5350450277328491},{"id":"https://openalex.org/keywords/lcr-meter","display_name":"LCR meter","score":0.487588107585907},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4848721921443939},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4664475619792938},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.4593650698661804},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4543137550354004},{"id":"https://openalex.org/keywords/equivalent-series-inductance","display_name":"Equivalent series inductance","score":0.44081103801727295},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.4350894093513489},{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.42738062143325806},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3215733766555786},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.18051216006278992},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17143231630325317}],"concepts":[{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.7756845951080322},{"id":"https://openalex.org/C206755178","wikidata":"https://www.wikidata.org/wiki/Q1131271","display_name":"Capacitive sensing","level":2,"score":0.6786853671073914},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.5454805493354797},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.5452859401702881},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.5426583290100098},{"id":"https://openalex.org/C203455917","wikidata":"https://www.wikidata.org/wiki/Q5034478","display_name":"Capacitance probe","level":4,"score":0.5350450277328491},{"id":"https://openalex.org/C55592779","wikidata":"https://www.wikidata.org/wiki/Q4198687","display_name":"LCR meter","level":4,"score":0.487588107585907},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4848721921443939},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4664475619792938},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.4593650698661804},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4543137550354004},{"id":"https://openalex.org/C141490761","wikidata":"https://www.wikidata.org/wiki/Q5384728","display_name":"Equivalent series inductance","level":4,"score":0.44081103801727295},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.4350894093513489},{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.42738062143325806},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3215733766555786},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.18051216006278992},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17143231630325317},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3175047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3175047","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8100000023841858,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G4108638573","display_name":null,"funder_award_id":"2682020CX80","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G7096979352","display_name":"\u6c14\u4f53\u94bb\u4e95\u5b89\u5168\u76d1\u6d4b\u7684\u524d\u5146\u9884\u8b66\u5173\u952e\u4f20\u611f\u5668\u7814\u7a76","funder_award_id":"61731016","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7504406456","display_name":"\u9ad8\u7a33\u5b9a\u3001\u5feb\u54cd\u5e94\u8c10\u632f\u5f0f\u6e7f\u5ea6\u4f20\u611f\u5668\u53ca\u5176\u8c03\u9891\u673a\u5236\u7814\u7a76","funder_award_id":"61901399","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1038327613","https://openalex.org/W1192033379","https://openalex.org/W1450157779","https://openalex.org/W1489089256","https://openalex.org/W1545401878","https://openalex.org/W1971260312","https://openalex.org/W1991009970","https://openalex.org/W2004356430","https://openalex.org/W2008574958","https://openalex.org/W2010697713","https://openalex.org/W2024816846","https://openalex.org/W2056184138","https://openalex.org/W2056407018","https://openalex.org/W2062610748","https://openalex.org/W2083029493","https://openalex.org/W2087044127","https://openalex.org/W2142402760","https://openalex.org/W2142884115","https://openalex.org/W2160361467","https://openalex.org/W2165067072","https://openalex.org/W2265615232","https://openalex.org/W2287336229","https://openalex.org/W2289367473","https://openalex.org/W2294368883","https://openalex.org/W2552852934","https://openalex.org/W2583065694","https://openalex.org/W2593205701","https://openalex.org/W2737325303","https://openalex.org/W2757857946","https://openalex.org/W2766484714","https://openalex.org/W2805615724","https://openalex.org/W2884825664","https://openalex.org/W2904700887","https://openalex.org/W2923737966","https://openalex.org/W2941770779","https://openalex.org/W3009925489","https://openalex.org/W3047387592","https://openalex.org/W3095101926","https://openalex.org/W3180030400","https://openalex.org/W4232815361","https://openalex.org/W4254631392"],"related_works":["https://openalex.org/W2361691239","https://openalex.org/W1993052003","https://openalex.org/W1989252551","https://openalex.org/W2326435873","https://openalex.org/W3157797545","https://openalex.org/W1971243340","https://openalex.org/W2155655007","https://openalex.org/W1998950397","https://openalex.org/W2591177395","https://openalex.org/W2041446086"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"proposed":[4,168],"a":[5,27,81,115,129,150],"modified":[6,34],"quartz":[7,29],"crystal":[8,30],"capacitance":[9,13,31,83],"circuit":[10,35,40,45,64,79,97,110,170],"with":[11,23,118,178],"enhanced":[12],"load":[14,87],"performance":[15],"constructed":[16],"by":[17,49,101,127],"using":[18,128],"an":[19],"inductor":[20],"in":[21,26,138],"parallel":[22,104],"the":[24,62,77,90,95,103,108,136,139,172],"capacitor":[25,137],"traditional":[28],"circuit.":[32,141],"The":[33,43,167],"was":[36,47,111,125,147],"called":[37],"as":[38,159,165],"QCLC":[39,44,63,78,96,109,140,169],"for":[41,58,149,174],"short.":[42],"principle":[46],"studied":[48,164],"theoretical":[50,68],"derivation":[51],"and":[52,70,161],"finite":[53,71],"element":[54,72,133],"simulation.":[55],"Analytical":[56],"expression":[57],"resonant":[59],"frequency":[60,120,180],"of":[61,94,135,144,153],"is":[65],"derived.":[66],"Both":[67],"calculation":[69],"simulation":[73],"results":[74],"demonstrated":[75],"that":[76],"has":[80],"large":[82],"(>":[84],"50":[85],"pF)":[86],"capacity.":[88],"Furthermore,":[89],"capacitance-frequency":[91],"pulling":[92],"sensitivity":[93,143],"can":[98],"be":[99],"adjusted":[100],"setting":[102],"inductance":[105],"value.":[106],"Finally,":[107],"applied":[112],"to":[113],"construct":[114],"micro-displacement":[116],"sensor":[117,123],"quasi-digital":[119,179],"output.":[121,181],"A":[122,142],"prototype":[124],"fabricated":[126],"capacitive":[130,176],"displacement":[131],"detection":[132],"instead":[134],"1.85":[145],"Hz/\u03bcm":[146],"obtained":[148],"detecting":[151],"distance":[152],"0-1":[154],"mm.":[155],"Sensing":[156],"performances":[157],"such":[158],"repeatability":[160],"stability":[162],"were":[163],"well.":[166],"had":[171],"potential":[173],"developing":[175],"sensors":[177]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}