{"id":"https://openalex.org/W4285190764","doi":"https://doi.org/10.1109/tim.2022.3171514","title":"Non-Iterative Method for Extracting Complex Permittivity and Thickness of Materials From Reflection-Only Measurements","display_name":"Non-Iterative Method for Extracting Complex Permittivity and Thickness of Materials From Reflection-Only Measurements","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4285190764","doi":"https://doi.org/10.1109/tim.2022.3171514"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3171514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3171514","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019349902","display_name":"Chuang Yang","orcid":"https://orcid.org/0000-0002-4312-6696"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chuang Yang","raw_affiliation_strings":["State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4312-6696","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075871314","display_name":"Hui Huang","orcid":"https://orcid.org/0000-0001-7588-9156"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hui Huang","raw_affiliation_strings":["Xinchen Technologies Company Ltd., Beijing, China"],"raw_orcid":"https://orcid.org/0000-0001-7588-9156","affiliations":[{"raw_affiliation_string":"Xinchen Technologies Company Ltd., Beijing, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060203564","display_name":"Mugen Peng","orcid":"https://orcid.org/0000-0002-4755-7231"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mugen Peng","raw_affiliation_strings":["State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4755-7231","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing, China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1175,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.75082631,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.7510504126548767},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6126335859298706},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.5641812682151794},{"id":"https://openalex.org/keywords/iterative-method","display_name":"Iterative method","score":0.5564019083976746},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.534175455570221},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.46287018060684204},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4380652904510498},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37621819972991943},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.3385036587715149},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3199734687805176},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2130337357521057}],"concepts":[{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.7510504126548767},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6126335859298706},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.5641812682151794},{"id":"https://openalex.org/C159694833","wikidata":"https://www.wikidata.org/wiki/Q2321565","display_name":"Iterative method","level":2,"score":0.5564019083976746},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.534175455570221},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.46287018060684204},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4380652904510498},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37621819972991943},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3385036587715149},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3199734687805176},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2130337357521057},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3171514","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3171514","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4675087125","display_name":null,"funder_award_id":"62101059","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6371721565","display_name":null,"funder_award_id":"61925101","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7192350588","display_name":null,"funder_award_id":"21310201D","funder_id":"https://openalex.org/F4320328876","funder_display_name":"Hebei Provincial Key Research Projects"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320328876","display_name":"Hebei Provincial Key Research Projects","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1495053183","https://openalex.org/W2075325445","https://openalex.org/W2097840245","https://openalex.org/W2098747589","https://openalex.org/W2102087142","https://openalex.org/W2105158339","https://openalex.org/W2106533268","https://openalex.org/W2151224241","https://openalex.org/W2206637095","https://openalex.org/W2409194201","https://openalex.org/W2461043470","https://openalex.org/W2467873472","https://openalex.org/W2522503927","https://openalex.org/W2774440761","https://openalex.org/W2793551778","https://openalex.org/W2967832678","https://openalex.org/W2969242508","https://openalex.org/W2973810229","https://openalex.org/W2990081323","https://openalex.org/W2990794959","https://openalex.org/W3045134079","https://openalex.org/W3086281953","https://openalex.org/W3114603314","https://openalex.org/W3159872261","https://openalex.org/W4247381894"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2043673973","https://openalex.org/W1994753809","https://openalex.org/W2025475064","https://openalex.org/W2063778609","https://openalex.org/W4310995131","https://openalex.org/W1957504099","https://openalex.org/W2989352708","https://openalex.org/W2011411333","https://openalex.org/W2005933466"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"a":[3,72],"non-iterative":[4],"method":[5,90,110,141],"is":[6,134],"proposed":[7,42,89,109,140,157],"to":[8,86,136,153],"extract":[9],"unique":[10],"and":[11,71],"stable":[12],"complex":[13,92],"permittivity":[14,93],"of":[15,28,34,55,68,79,98,101,107,115,130],"materials":[16],"under":[17],"test":[18],"(MUT)":[19],"from":[20],"reflection-only":[21],"measurements":[22],"without":[23,95],"the":[24,29,32,35,41,48,56,88,99,102,108,116,119,131,139,144,148,156],"prior":[25,96],"thickness":[26,67,78,100,105,129],"knowledge":[27,97],"MUT.":[30],"And":[31],"thicknesses":[33],"MUT":[36],"can":[37,142],"be":[38],"determined":[39],"by":[40],"method.":[43,60,158],"The":[44,104,121],"derived":[45],"formulas":[46],"for":[47],"extraction":[49],"are":[50,82,111,150],"as":[51,53],"simple":[52],"those":[54,114],"well-known":[57],"Nicolson\u2013Ross\u2013Weir":[58],"(NRW)":[59],"A":[61],"silicon":[62],"carbide":[63],"(SiC)":[64],"sample":[65,76],"with":[66,77,113,128],"2.02":[69],"mm":[70,81,133],"black":[73],"Bakelite":[74],"(BBL)":[75],"6.03":[80],"measured":[83],"in":[84,91,118],"the$X$-band":[85],"validate":[87,137,155],"determination":[94],"samples.":[103],"errors":[106],"similar":[112],"methods":[117],"literature.":[120],"low-loss":[122],"material":[123],"acrylonitrile":[124],"butadiene":[125],"styrene":[126],"(ABS)":[127],"8.56":[132],"fabricated":[135],"that":[138],"overcome":[143],"resonance":[145],"problem.":[146],"Additionally,":[147],"simulations":[149],"also":[151],"implemented":[152],"further":[154]},"counts_by_year":[{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}