{"id":"https://openalex.org/W4221096010","doi":"https://doi.org/10.1109/tim.2022.3161718","title":"A Novel Information Fusion Method of RFID Strain Sensor Based on Microstrip Notch Circuit","display_name":"A Novel Information Fusion Method of RFID Strain Sensor Based on Microstrip Notch Circuit","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4221096010","doi":"https://doi.org/10.1109/tim.2022.3161718"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3161718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3161718","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5058225278","display_name":"Guochun Wan","orcid":"https://orcid.org/0000-0003-0521-1176"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guochun Wan","raw_affiliation_strings":["Department of Electronic Science and Technology, Tongji University, Shanghai, China","Microelectronics Science and Engineering, Tongji University, shanghai, 200092 China"],"raw_orcid":"https://orcid.org/0000-0003-0521-1176","affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Technology, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Microelectronics Science and Engineering, Tongji University, shanghai, 200092 China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103069801","display_name":"Meng Meng Li","orcid":"https://orcid.org/0000-0002-0620-8852"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengmeng Li","raw_affiliation_strings":["Department of Electronic Science and Technology, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-0620-8852","affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Technology, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101810713","display_name":"Mingxu Zhang","orcid":"https://orcid.org/0000-0002-2509-8812"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingxu Zhang","raw_affiliation_strings":["Department of Electronic Science and Technology, Tongji University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-2509-8812","affiliations":[{"raw_affiliation_string":"Department of Electronic Science and Technology, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081178670","display_name":"Lei Kang","orcid":"https://orcid.org/0000-0003-2207-5137"},"institutions":[{"id":"https://openalex.org/I4210151021","display_name":"Shanghai Institute of Computing Technology","ror":"https://ror.org/05ek0ze18","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210151021"]},{"id":"https://openalex.org/I67001856","display_name":"Shanghai Institute of Technology","ror":"https://ror.org/00fjzqj15","country_code":"CN","type":"education","lineage":["https://openalex.org/I67001856"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Kang","raw_affiliation_strings":["Shanghai Institute of Technology, Shanghai, China","Shanghai Institute of Technology, Shanghai, 200092 China"],"raw_orcid":"https://orcid.org/0000-0003-2207-5137","affiliations":[{"raw_affiliation_string":"Shanghai Institute of Technology, Shanghai, China","institution_ids":["https://openalex.org/I67001856"]},{"raw_affiliation_string":"Shanghai Institute of Technology, Shanghai, 200092 China","institution_ids":["https://openalex.org/I67001856","https://openalex.org/I4210151021"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100458703","display_name":"Liyu Xie","orcid":"https://orcid.org/0000-0001-5777-0645"},"institutions":[{"id":"https://openalex.org/I116953780","display_name":"Tongji University","ror":"https://ror.org/03rc6as71","country_code":"CN","type":"education","lineage":["https://openalex.org/I116953780"]},{"id":"https://openalex.org/I4210136070","display_name":"Shanghai Institute of Disaster Prevention and Relief","ror":"https://ror.org/04jfg7g12","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210136070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyu Xie","raw_affiliation_strings":["Department of Disaster Mitigation for Structures, Tongji University, Shanghai, China","Department of Disaster Mitigation for Structures, Tongji University shanghai, 200092 China"],"raw_orcid":"https://orcid.org/0000-0001-5777-0645","affiliations":[{"raw_affiliation_string":"Department of Disaster Mitigation for Structures, Tongji University, Shanghai, China","institution_ids":["https://openalex.org/I116953780"]},{"raw_affiliation_string":"Department of Disaster Mitigation for Structures, Tongji University shanghai, 200092 China","institution_ids":["https://openalex.org/I116953780","https://openalex.org/I4210136070"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4142,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.8967323,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10986","display_name":"RFID technology advancements","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10326","display_name":"Indoor and Outdoor Localization Technologies","score":0.9605000019073486,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9447000026702881,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6501256823539734},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.6209402084350586},{"id":"https://openalex.org/keywords/sensor-fusion","display_name":"Sensor fusion","score":0.6107378005981445},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.5838078260421753},{"id":"https://openalex.org/keywords/chipless-rfid","display_name":"Chipless RFID","score":0.5257640480995178},{"id":"https://openalex.org/keywords/strain-gauge","display_name":"Strain gauge","score":0.4929022789001465},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4884461462497711},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48335474729537964},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.4295721650123596},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.36133041977882385},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3053838610649109},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27080872654914856},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.165187269449234},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.12737038731575012},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.10015806555747986},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09513282775878906}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6501256823539734},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.6209402084350586},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.6107378005981445},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5838078260421753},{"id":"https://openalex.org/C2775974325","wikidata":"https://www.wikidata.org/wiki/Q16154688","display_name":"Chipless RFID","level":3,"score":0.5257640480995178},{"id":"https://openalex.org/C60584519","wikidata":"https://www.wikidata.org/wiki/Q610723","display_name":"Strain gauge","level":2,"score":0.4929022789001465},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4884461462497711},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48335474729537964},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.4295721650123596},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.36133041977882385},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3053838610649109},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27080872654914856},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.165187269449234},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.12737038731575012},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.10015806555747986},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09513282775878906},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3161718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3161718","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W1538298030","https://openalex.org/W1966968078","https://openalex.org/W1971313956","https://openalex.org/W1972919030","https://openalex.org/W1977808060","https://openalex.org/W1981031086","https://openalex.org/W2022230754","https://openalex.org/W2038194220","https://openalex.org/W2043920469","https://openalex.org/W2050248078","https://openalex.org/W2053481876","https://openalex.org/W2067711757","https://openalex.org/W2092946214","https://openalex.org/W2094487383","https://openalex.org/W2128548021","https://openalex.org/W2134534066","https://openalex.org/W2162379030","https://openalex.org/W2164639692","https://openalex.org/W2166233193","https://openalex.org/W2290029904","https://openalex.org/W2346915204","https://openalex.org/W2367393565","https://openalex.org/W2409254028","https://openalex.org/W2789531064","https://openalex.org/W2900038309","https://openalex.org/W2901172404","https://openalex.org/W2911121965","https://openalex.org/W2952302942","https://openalex.org/W3003495331","https://openalex.org/W3093877473","https://openalex.org/W3100090196","https://openalex.org/W3126380805","https://openalex.org/W6632320662"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2333262850","https://openalex.org/W2067120597","https://openalex.org/W2129896303","https://openalex.org/W2074044821","https://openalex.org/W2907151139","https://openalex.org/W2100992154","https://openalex.org/W3157587086","https://openalex.org/W2052124969","https://openalex.org/W1513451571"],"abstract_inverted_index":{"According":[0],"to":[1,96,118],"the":[2,6,17,29,45,88,98,103,113,130,136,153,157,161,167,178,182],"current":[3],"development":[4,31],"situation,":[5],"application":[7],"of":[8,19,32,39,51,141,177,184],"chipless":[9,53],"RFID":[10,40,54],"sensors":[11],"in":[12],"structural":[13],"health":[14],"monitoring":[15,175],"has":[16],"disadvantages":[18],"difficult":[20],"detection,":[21],"poor":[22],"effect,":[23],"and":[24,48,87,112,125,129,160,166,187,190],"single":[25],"design":[26],"function,":[27],"limiting":[28],"further":[30],"this":[33],"technology.":[34],"Therefore,":[35],"a":[36],"new":[37],"type":[38],"strain":[41,70,163,179],"sensor":[42,159,180],"that":[43,146],"realizes":[44],"compact":[46],"structure":[47],"separated":[49],"function":[50],"miniaturized":[52],"coded":[55],"tags":[56],"is":[57,107,127,133,164,170],"proposed.":[58],"The":[59,81,139,172],"integrated":[60],"disc":[61],"monopole":[62],"antennas":[63],"make":[64],"wireless":[65,126,131,142],"measurement":[66,143],"possible.":[67],"Through":[68],"single-parameter":[69,185],"simulation":[71],"analysis,":[72],"six":[73],"characteristic":[74],"parameters":[75],"with":[76,148],"good":[77],"linearity":[78],"are":[79,94,192],"determined.":[80],"time":[82],"sequences":[83],"data":[84,91,100,110],"enhancement":[85,92],"algorithm":[86,93],"background":[89],"noise":[90],"used":[95],"expand":[97],"training":[99,114],"set.":[101],"Then":[102],"BP":[104],"neural":[105],"network":[106],"utilized":[108],"for":[109],"fusion,":[111],"error":[115,155,169,183],"finally":[116],"converges":[117],"0.0005.":[119],"A":[120],"comparison":[121],"experiment":[122,132],"between":[123,156],"wired":[124,137],"designed,":[128],"optimized":[134],"through":[135],"experimentation.":[138],"results":[140],"experiments":[144],"show":[145],"combined":[147],"multi-parameter":[149,173],"information":[150],"fusion":[151,174],"technology,":[152],"average":[154],"proposed":[158],"actual":[162],"6.04%,":[165],"minimum":[168],"0.25%.":[171],"method":[176],"corrects":[181],"measurement,":[186],"its":[188],"accuracy":[189],"robustness":[191],"improved.":[193]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}