{"id":"https://openalex.org/W4226247764","doi":"https://doi.org/10.1109/tim.2022.3159978","title":"Fusion-UDCGAN: Multifocus Image Fusion via a U-Type Densely Connected Generation Adversarial Network","display_name":"Fusion-UDCGAN: Multifocus Image Fusion via a U-Type Densely Connected Generation Adversarial Network","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4226247764","doi":"https://doi.org/10.1109/tim.2022.3159978"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3159978","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3159978","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102993531","display_name":"Yuan Gao","orcid":"https://orcid.org/0000-0002-3267-3555"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuan Gao","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-3267-3555","affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100760805","display_name":"Shiwei Ma","orcid":"https://orcid.org/0000-0001-6039-5030"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiwei Ma","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-6039-5030","affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100442556","display_name":"Jingjing Liu","orcid":"https://orcid.org/0000-0001-8948-5865"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]},{"id":"https://openalex.org/I4210132426","display_name":"Shanghai Fudan Microelectronics (China)","ror":"https://ror.org/02vfj3j86","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210132426"]},{"id":"https://openalex.org/I4391767673","display_name":"State Key Laboratory of ASIC and System","ror":"https://ror.org/01mamgv83","country_code":null,"type":"facility","lineage":["https://openalex.org/I24943067","https://openalex.org/I4391767673"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingjing Liu","raw_affiliation_strings":["State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8948-5865","affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I4210132426","https://openalex.org/I24943067","https://openalex.org/I4391767673"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076724562","display_name":"Xianchao Xiu","orcid":"https://orcid.org/0000-0002-3374-7413"},"institutions":[{"id":"https://openalex.org/I113940042","display_name":"Shanghai University","ror":"https://ror.org/006teas31","country_code":"CN","type":"education","lineage":["https://openalex.org/I113940042"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianchao Xiu","raw_affiliation_strings":["School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-3374-7413","affiliations":[{"raw_affiliation_string":"School of Mechatronic Engineering and Automation, Shanghai University, Shanghai, China","institution_ids":["https://openalex.org/I113940042"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.2071,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.80735931,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.6849141120910645},{"id":"https://openalex.org/keywords/image-fusion","display_name":"Image fusion","score":0.6624658107757568},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6090626120567322},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5909876227378845},{"id":"https://openalex.org/keywords/fusion","display_name":"Fusion","score":0.5242547988891602},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.5200040936470032},{"id":"https://openalex.org/keywords/adversarial-system","display_name":"Adversarial system","score":0.5193356275558472},{"id":"https://openalex.org/keywords/fusion-rules","display_name":"Fusion rules","score":0.48677515983581543},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4839673340320587},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.47077295184135437},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4443248212337494},{"id":"https://openalex.org/keywords/norm","display_name":"Norm (philosophy)","score":0.42430320382118225},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4238501787185669},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.15882888436317444},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.135589599609375}],"concepts":[{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.6849141120910645},{"id":"https://openalex.org/C69744172","wikidata":"https://www.wikidata.org/wiki/Q860822","display_name":"Image fusion","level":3,"score":0.6624658107757568},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6090626120567322},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5909876227378845},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.5242547988891602},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.5200040936470032},{"id":"https://openalex.org/C37736160","wikidata":"https://www.wikidata.org/wiki/Q1801315","display_name":"Adversarial system","level":2,"score":0.5193356275558472},{"id":"https://openalex.org/C2778971668","wikidata":"https://www.wikidata.org/wiki/Q5510284","display_name":"Fusion rules","level":4,"score":0.48677515983581543},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4839673340320587},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.47077295184135437},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4443248212337494},{"id":"https://openalex.org/C191795146","wikidata":"https://www.wikidata.org/wiki/Q3878446","display_name":"Norm (philosophy)","level":2,"score":0.42430320382118225},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4238501787185669},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.15882888436317444},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.135589599609375},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3159978","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3159978","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G759724440","display_name":null,"funder_award_id":"19ZR1420800","funder_id":"https://openalex.org/F4320309612","funder_display_name":"Natural Science Foundation of Shanghai"}],"funders":[{"id":"https://openalex.org/F4320309612","display_name":"Natural Science Foundation of Shanghai","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":51,"referenced_works":["https://openalex.org/W125693051","https://openalex.org/W1901129140","https://openalex.org/W1903029394","https://openalex.org/W1982877839","https://openalex.org/W1999034606","https://openalex.org/W2046119925","https://openalex.org/W2082506960","https://openalex.org/W2125188192","https://openalex.org/W2125389028","https://openalex.org/W2183341477","https://openalex.org/W2194775991","https://openalex.org/W2512742053","https://openalex.org/W2520768522","https://openalex.org/W2536011999","https://openalex.org/W2554918064","https://openalex.org/W2559870345","https://openalex.org/W2593414223","https://openalex.org/W2796321537","https://openalex.org/W2798987894","https://openalex.org/W2887842669","https://openalex.org/W2901100349","https://openalex.org/W2912126472","https://openalex.org/W2912147220","https://openalex.org/W2916097812","https://openalex.org/W2940957108","https://openalex.org/W2951991161","https://openalex.org/W2963073614","https://openalex.org/W2963446712","https://openalex.org/W2963684088","https://openalex.org/W2963787388","https://openalex.org/W2981509475","https://openalex.org/W2991617172","https://openalex.org/W2997591000","https://openalex.org/W3011768656","https://openalex.org/W3014961572","https://openalex.org/W3035441328","https://openalex.org/W3039415429","https://openalex.org/W3045460727","https://openalex.org/W3083574456","https://openalex.org/W3085575313","https://openalex.org/W3094336018","https://openalex.org/W3102411220","https://openalex.org/W3105604256","https://openalex.org/W3105639468","https://openalex.org/W3119514771","https://openalex.org/W3139295695","https://openalex.org/W3153050314","https://openalex.org/W4320013936","https://openalex.org/W6639824700","https://openalex.org/W6678815747","https://openalex.org/W6685352114"],"related_works":["https://openalex.org/W4312613727","https://openalex.org/W2419576664","https://openalex.org/W1971268144","https://openalex.org/W4312837757","https://openalex.org/W2379054866","https://openalex.org/W3217342493","https://openalex.org/W2095903272","https://openalex.org/W2356748119","https://openalex.org/W2380797991","https://openalex.org/W3153050314"],"abstract_inverted_index":{"Multifocus":[0],"image":[1],"fusion":[2,37],"has":[3],"attracted":[4],"considerable":[5],"attention":[6],"because":[7],"it":[8],"can":[9,157],"overcome":[10],"the":[11,26,41,48,51,54,58,78,81,95,106,113,122,131,137,140,144,147,175,180],"physical":[12],"limitations":[13],"of":[14,25,43,50,86],"optical":[15],"imaging":[16],"equipment":[17],"and":[18,80,101,112,143,156,169,183],"fuse":[19,73],"multiple":[20],"images":[21,124],"with":[22,68,89],"different":[23],"depths":[24],"field":[27],"into":[28],"one":[29],"full-clear":[30],"image.":[31],"However,":[32],"most":[33],"existing":[34],"deep":[35],"learning-based":[36],"methods":[38],"concentrate":[39],"on":[40,105],"segmentation":[42],"focus&#x2013;defocus":[44],"regions,":[45],"resulting":[46],"in":[47],"loss":[49,103],"details":[52],"near":[53,146],"boundaries.":[55],"To":[56],"address":[57],"issue,":[59],"this":[60],"article":[61],"proposes":[62],"a":[63,149],"novel":[64,114],"generation":[65],"adversarial":[66],"network":[67],"dense":[69,87,90],"connections":[70,92],"(Fusion-UDCGAN)":[71],"to":[72,93,120,187],"multifocus":[74],"images.":[75],"More":[76],"specifically,":[77],"encoder":[79],"decoder":[82],"are":[83],"first":[84],"composed":[85],"modules":[88],"long":[91],"ensure":[94],"generated":[96],"image&#x2019;s":[97],"quality.":[98],"The":[99],"content":[100],"clarity":[102],"based":[104],"<inline-formula>":[107],"<tex-math":[108],"notation=\"LaTeX\">$L1$":[109],"</tex-math></inline-formula>":[110],"norm":[111],"sum-modified-Laplacian":[115],"(NSML)":[116],"is":[117,153,163],"further":[118],"embedded":[119],"provide":[121],"fused":[123],"retaining":[125],"more":[126],"texture":[127],"features.":[128],"Considering":[129],"that":[130,174],"previous":[132],"dataset-making":[133],"approaches":[134],"may":[135],"lose":[136],"relation":[138],"between":[139],"overall":[141],"structure":[142],"information":[145],"boundaries,":[148],"new":[150],"dataset,":[151],"which":[152],"uniformly":[154],"distributed":[155],"simulate":[158],"natural":[159],"focusing":[160],"boundary":[161],"conditions,":[162],"constructed":[164],"for":[165],"model":[166],"training.":[167],"Subjective":[168],"objective":[170],"experimental":[171],"results":[172],"indicate":[173],"proposed":[176],"method":[177],"significantly":[178],"improves":[179],"sharpness,":[181],"contrast,":[182],"detail":[184],"richness":[185],"compared":[186],"several":[188],"state-of-the-art":[189],"methods.":[190]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}
