{"id":"https://openalex.org/W4226371249","doi":"https://doi.org/10.1109/tim.2022.3158986","title":"Parameter Measurement of LFM Signal With FRI Sampling and Nuclear Norm Denoising","display_name":"Parameter Measurement of LFM Signal With FRI Sampling and Nuclear Norm Denoising","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4226371249","doi":"https://doi.org/10.1109/tim.2022.3158986"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3158986","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3158986","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035426333","display_name":"Zhiliang Wei","orcid":"https://orcid.org/0000-0003-2549-4783"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Wei","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0003-2549-4783","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025061441","display_name":"Ning Fu","orcid":"https://orcid.org/0000-0002-0317-9697"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Fu","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-0317-9697","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047082102","display_name":"Siyi Jiang","orcid":"https://orcid.org/0000-0003-1641-9378"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyi Jiang","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0003-1641-9378","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100369696","display_name":"Xiaodong Li","orcid":"https://orcid.org/0000-0002-0749-8150"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Li","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-0749-8150","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006333473","display_name":"Liyan Qiao","orcid":"https://orcid.org/0000-0002-7397-3458"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liyan Qiao","raw_affiliation_strings":["School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"],"raw_orcid":"https://orcid.org/0000-0002-7397-3458","affiliations":[{"raw_affiliation_string":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":3.535,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.93605778,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"17"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11447","display_name":"Blind Source Separation Techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1711","display_name":"Signal Processing"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12131","display_name":"Wireless Signal Modulation Classification","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nyquist-rate","display_name":"Nyquist rate","score":0.7545959949493408},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5548648238182068},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.51468425989151},{"id":"https://openalex.org/keywords/chirp","display_name":"Chirp","score":0.4910926818847656},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.45613887906074524},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.4539177715778351},{"id":"https://openalex.org/keywords/autocorrelation","display_name":"Autocorrelation","score":0.44929471611976624},{"id":"https://openalex.org/keywords/nyquist\u2013shannon-sampling-theorem","display_name":"Nyquist\u2013Shannon sampling theorem","score":0.4410306215286255},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.4377444088459015},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.4253944754600525},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4236980974674225},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.41639265418052673},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40664544701576233},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.30238044261932373},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2612816095352173},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21878427267074585},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18252238631248474},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.13771536946296692},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13646560907363892},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08998540043830872}],"concepts":[{"id":"https://openalex.org/C65914096","wikidata":"https://www.wikidata.org/wiki/Q6273772","display_name":"Nyquist rate","level":4,"score":0.7545959949493408},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5548648238182068},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.51468425989151},{"id":"https://openalex.org/C132794960","wikidata":"https://www.wikidata.org/wiki/Q27304","display_name":"Chirp","level":3,"score":0.4910926818847656},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.45613887906074524},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.4539177715778351},{"id":"https://openalex.org/C5297727","wikidata":"https://www.wikidata.org/wiki/Q786970","display_name":"Autocorrelation","level":2,"score":0.44929471611976624},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.4410306215286255},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.4377444088459015},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.4253944754600525},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4236980974674225},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.41639265418052673},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40664544701576233},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.30238044261932373},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2612816095352173},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21878427267074585},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18252238631248474},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.13771536946296692},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13646560907363892},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08998540043830872},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3158986","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3158986","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6399999856948853}],"awards":[{"id":"https://openalex.org/G4740343229","display_name":"\u8d85\u5bbd\u5e26\u590d\u6742\u8c03\u5236\u96f7\u8fbe\u8f90\u5c04\u6e90\u4fe1\u53f7\u5206\u5e03\u5f0f\u6709\u9650\u65b0\u606f\u7387\u91c7\u6837\u7406\u8bba\u53ca\u65b9\u6cd5\u7814\u7a76","funder_award_id":"61671177","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8584913395","display_name":null,"funder_award_id":"62071149","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1553525389","https://openalex.org/W1673319420","https://openalex.org/W1946227219","https://openalex.org/W2007241134","https://openalex.org/W2028191993","https://openalex.org/W2033082431","https://openalex.org/W2033332370","https://openalex.org/W2038207995","https://openalex.org/W2060204507","https://openalex.org/W2064771273","https://openalex.org/W2072338551","https://openalex.org/W2089957712","https://openalex.org/W2096973057","https://openalex.org/W2098662489","https://openalex.org/W2103300762","https://openalex.org/W2108710836","https://openalex.org/W2113885710","https://openalex.org/W2132315948","https://openalex.org/W2149213383","https://openalex.org/W2152185946","https://openalex.org/W2158537680","https://openalex.org/W2162267159","https://openalex.org/W2172171145","https://openalex.org/W2289390812","https://openalex.org/W2547849178","https://openalex.org/W2626687354","https://openalex.org/W2725685891","https://openalex.org/W2741812979","https://openalex.org/W2766884021","https://openalex.org/W2796115028","https://openalex.org/W2883672087","https://openalex.org/W2901927226","https://openalex.org/W2921301456","https://openalex.org/W2963500592","https://openalex.org/W3010156941","https://openalex.org/W3011506235","https://openalex.org/W3014614805","https://openalex.org/W3035383480","https://openalex.org/W3038872917","https://openalex.org/W3043848107","https://openalex.org/W3045807195","https://openalex.org/W3106271742","https://openalex.org/W3120230914","https://openalex.org/W3133274213","https://openalex.org/W3134506088","https://openalex.org/W3174326721"],"related_works":["https://openalex.org/W2368043784","https://openalex.org/W2576230203","https://openalex.org/W3015557210","https://openalex.org/W2009568739","https://openalex.org/W1570358496","https://openalex.org/W2210983845","https://openalex.org/W2119667497","https://openalex.org/W2103898286","https://openalex.org/W2112578300","https://openalex.org/W2393783098"],"abstract_inverted_index":{"Measurement":[0],"of":[1,44,64,74,85,134,148,157,159,163,170,195,204,222],"linear":[2],"frequency":[3,24,122],"modulation":[4],"(LFM)":[5],"signal":[6,18,22,164,197],"is":[7,19,152,176,188],"significant":[8],"for":[9,173],"radar,":[10],"communication,":[11],"and":[12,29,38,70,96,114,130,213,220],"electronic":[13],"reconnaissance":[14],"fields.":[15],"An":[16],"LFM":[17,46,77],"a":[20,53,183],"wideband":[21],"whose":[23],"varies":[25],"linearly":[26],"with":[27,110,140],"time,":[28],"traditional":[30],"measurement":[31,206],"methods":[32],"require":[33],"very":[34],"high":[35],"sampling":[36,56,90,100,112,146],"rates":[37],"heavy":[39],"processing":[40],"to":[41,68],"estimate":[42,71],"parameters":[43,73],"the":[45,61,72,75,88,93,97,108,116,124,135,141,149,155,160,192,196,202,205,209,218,223],"signal.":[47],"In":[48,181],"this":[49],"article,":[50],"we":[51],"propose":[52],"multichannel":[54],"cooperative":[55],"(MCS)":[57],"system":[58,83,151,207],"based":[59,190],"on":[60,191],"finite":[62],"rate":[63,147,156],"innovation":[65,158],"(FRI)":[66],"theory":[67],"sample":[69,107],"real-valued":[76],"pulse":[78],"sequence":[79],"(LFMPS).":[80],"The":[81,145,167],"MCS":[82,150],"consists":[84],"three":[86,104],"parts:":[87],"autocorrelation":[89],"structure":[91,101],"(ACSS),":[92],"time-delayed":[94],"ACSS,":[95],"quadrature":[98],"time-staggered":[99],"(QTSS).":[102],"These":[103],"parts":[105],"can":[106,137],"LFMPS":[109,136],"sub-Nyquist":[111,142],"rate,":[113],"using":[115],"subspace":[117],"method":[118],"in":[119,208],"time":[120],"or":[121],"domain,":[123],"discontinuity":[125],"locations":[126],"(DLs),":[127],"chirp":[128],"rates,":[129],"initial":[131],"frequencies":[132],"(IFs)":[133],"be":[138],"estimated":[139],"samples,":[143],"respectively.":[144],"determined":[153],"by":[154,178],"LFMPS,":[161],"instead":[162],"bandwidth":[165],"(BW).":[166],"minimum":[168],"number":[169],"samples":[171],"required":[172],"parameter":[174],"estimation":[175],"proven":[177],"theoretical":[179],"analysis.":[180],"addition,":[182],"nuclear":[184],"norm":[185],"denoising":[186],"algorithm":[187],"proposed":[189,224],"low-rank":[193],"property":[194],"subspace,":[198],"which":[199],"significantly":[200],"improved":[201],"performance":[203],"noise":[210],"environment.":[211],"Simulation":[212],"hardware":[214],"experimental":[215],"results":[216],"demonstrate":[217],"effectiveness":[219],"robustness":[221],"method.":[225]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":12}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}