{"id":"https://openalex.org/W4214861799","doi":"https://doi.org/10.1109/tim.2022.3156996","title":"Application of a Partial Discharge Diagnosis Method Based on the Novel Multispectral Array Sensor and GMM in Different Insulating Gases","display_name":"Application of a Partial Discharge Diagnosis Method Based on the Novel Multispectral Array Sensor and GMM in Different Insulating Gases","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4214861799","doi":"https://doi.org/10.1109/tim.2022.3156996"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3156996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3156996","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078959988","display_name":"Yiming Zang","orcid":"https://orcid.org/0000-0002-1370-8820"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiming Zang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1370-8820","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112355557","display_name":"Yong Qian","orcid":"https://orcid.org/0000-0001-6046-7110"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong Qian","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-6046-7110","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101854837","display_name":"Xiaoli Zhou","orcid":"https://orcid.org/0000-0001-8659-7482"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoli Zhou","raw_affiliation_strings":["Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, Yangpu, China"],"raw_orcid":"https://orcid.org/0000-0001-8659-7482","affiliations":[{"raw_affiliation_string":"Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, Yangpu, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070117791","display_name":"Antian Xu","orcid":"https://orcid.org/0000-0003-2422-4677"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Antian Xu","raw_affiliation_strings":["Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, Yangpu, China"],"raw_orcid":"https://orcid.org/0000-0003-2422-4677","affiliations":[{"raw_affiliation_string":"Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, Yangpu, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111959438","display_name":"Gehao Sheng","orcid":"https://orcid.org/0000-0002-9454-5284"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gehao Sheng","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9454-5284","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038426348","display_name":"Xiuchen Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuchen Jiang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5439-6942","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6559,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.60392513,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.994700014591217,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9926000237464905,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10461","display_name":"Gas Sensing Nanomaterials and Sensors","score":0.9904999732971191,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multispectral-image","display_name":"Multispectral image","score":0.9286193251609802},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4881616234779358},{"id":"https://openalex.org/keywords/multispectral-pattern-recognition","display_name":"Multispectral pattern recognition","score":0.4781273901462555},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3805091679096222}],"concepts":[{"id":"https://openalex.org/C173163844","wikidata":"https://www.wikidata.org/wiki/Q1761440","display_name":"Multispectral image","level":2,"score":0.9286193251609802},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4881616234779358},{"id":"https://openalex.org/C104541649","wikidata":"https://www.wikidata.org/wiki/Q6935090","display_name":"Multispectral pattern recognition","level":3,"score":0.4781273901462555},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3805091679096222}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3156996","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3156996","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4300000071525574}],"awards":[{"id":"https://openalex.org/G8373326903","display_name":null,"funder_award_id":"62075045","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2037774925","https://openalex.org/W2063667989","https://openalex.org/W2085491645","https://openalex.org/W2337438759","https://openalex.org/W2560573388","https://openalex.org/W2578910118","https://openalex.org/W2792332970","https://openalex.org/W2798915202","https://openalex.org/W2886178433","https://openalex.org/W2892490479","https://openalex.org/W2899655519","https://openalex.org/W2949491127","https://openalex.org/W2953771933","https://openalex.org/W2959391500","https://openalex.org/W2963259225","https://openalex.org/W2988311024","https://openalex.org/W2998117097","https://openalex.org/W3006574210","https://openalex.org/W3009538780","https://openalex.org/W3043718863","https://openalex.org/W3047362781","https://openalex.org/W3108598601","https://openalex.org/W3112380368","https://openalex.org/W3137007140","https://openalex.org/W3188675891","https://openalex.org/W6730178261"],"related_works":["https://openalex.org/W2128126485","https://openalex.org/W1995889410","https://openalex.org/W4382563209","https://openalex.org/W2124952510","https://openalex.org/W1752760603","https://openalex.org/W2777937183","https://openalex.org/W2108633818","https://openalex.org/W1517037119","https://openalex.org/W2126922921","https://openalex.org/W1634492240"],"abstract_inverted_index":{"Optical":[0],"detection":[1,21,28,78],"of":[2,15,29,44,64,129,133,142,158,167,175,181,214,322],"partial":[3],"discharge":[4],"(PD)":[5],"is":[6,22,58,268],"an":[7],"important":[8],"means":[9],"to":[10,25,49,125,258],"diagnosis":[11,263],"the":[12,18,42,55,62,82,117,127,153,171,179,215,232,259,262,274,289,294],"insulation":[13],"status":[14],"equipment.":[16,150],"However,":[17],"current":[19,56],"optical":[20,131],"either":[23],"unable":[24],"perform":[26],"simultaneous":[27],"multispectral":[30,51,83,123,160,217,234],"features":[31,161],"or":[32],"it":[33],"can":[34,145,162,276,291],"only":[35,59],"be":[36,146],"applied":[37,147],"under":[38,178],"laboratory":[39],"conditions.":[40],"Moreover,":[41],"PD":[43,77,130,168,176,216,233,295],"different":[45,50,134,159,165,266],"gases":[46,267],"will":[47],"correspond":[48],"characteristic":[52],"distributions,":[53],"but":[54],"research":[57],"aimed":[60],"at":[61],"study":[63],"SF":[65,109,201,252,280,298],"<sub":[66,95,99,103,110,186,190,194,202,238,242,246,253,281,299,304,308,312],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[67,96,100,104,111,187,191,195,203,239,243,247,254,282,300,305,309,313],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">6</sub>":[68,112,204,255,283,301],".":[69,113,256,284],"Therefore,":[70],"this":[71],"article":[72],"proposes":[73],"a":[74,139,319],"gas-insulated":[75],"equipment":[76],"method":[79,115,290],"based":[80],"on":[81],"array":[84,121],"sensor":[85],"and":[86,108,122,144,199,212,224,251,273,302],"Gaussian":[87],"mixture":[88,107,198,250],"model":[89],"(GMM)":[90],"clustering":[91],"algorithm":[92],"in":[93,148,219,236,265,279,296],"C":[94,185,237,303],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">4</sub>":[97,188,240,306],"F":[98,189,241,307],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">7</sub>":[101,192,244,310],"N/CO":[102,193,245,311],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[105,196,248,314],"gas":[106,197,205,249],"This":[114,285],"adopts":[116],"silicon":[118],"photomultiplier":[119],"(SiPM)":[120],"grid":[124],"realize":[126],"collection":[128],"signals":[132],"wavelength":[135],"bands,":[136],"which":[137,230,317],"has":[138,318],"high":[140],"degree":[141],"integration":[143],"actual":[149],"Then":[151],"through":[152],"GMM":[154],"model,":[155],"cluster":[156],"analysis":[157],"effectively":[163],"diagnose":[164,293],"types":[166],"defects.":[169],"In":[170],"experiment,":[172],"four":[173],"kinds":[174],"defects":[177],"conditions":[180],"five":[182],"various":[183],"ratios":[184],"pure":[200],"are":[206,228],"used":[207],"for":[208],"test.":[209],"The":[210],"similarities":[211],"differences":[213],"characteristics":[218,235],"phase":[220],"distribution,":[221,223],"energy":[222],"radar":[225],"chart":[226],"distribution":[227],"studied,":[229],"compares":[231],"According":[257],"experiment":[260],"result,":[261],"accuracy":[264],"generally":[269],"higher":[270],"than":[271],"84%,":[272],"highest":[275],"reach":[277],"95%":[278],"result":[286],"shows":[287],"that":[288],"well":[292],"both":[297],"power":[315],"equipment,":[316],"wide":[320],"range":[321],"application":[323],"prospects.":[324]},"counts_by_year":[{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}