{"id":"https://openalex.org/W4210550248","doi":"https://doi.org/10.1109/tim.2022.3147865","title":"A Microwave Time Domain Reflectometry Technique Combining the Wavelet Decomposition Analysis and Artificial Neural Network for Detection of Defects in Dielectric Structures","display_name":"A Microwave Time Domain Reflectometry Technique Combining the Wavelet Decomposition Analysis and Artificial Neural Network for Detection of Defects in Dielectric Structures","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4210550248","doi":"https://doi.org/10.1109/tim.2022.3147865"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2022.3147865","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3147865","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101447332","display_name":"Yi Xie","orcid":"https://orcid.org/0000-0002-9471-9133"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]},{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yi Xie","raw_affiliation_strings":["College of Electronic Engineering, Chengdu University of Information Technology, Chengdu, China","College of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"College of Electronic Engineering, Chengdu University of Information Technology, Chengdu, China","institution_ids":["https://openalex.org/I24201400"]},{"raw_affiliation_string":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24201400","https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110018561","display_name":"Xiaoqing Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoqing Yang","raw_affiliation_strings":["College of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24201400","https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103070260","display_name":"Piqiang Su","orcid":null},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Piqiang Su","raw_affiliation_strings":["College of Electronics and Information Engineering, Sichuan University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24201400","https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102918405","display_name":"Yi He","orcid":"https://orcid.org/0000-0003-1399-4668"},"institutions":[{"id":"https://openalex.org/I24201400","display_name":"Chengdu University of Information Technology","ror":"https://ror.org/01yxwrh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I24201400"]},{"id":"https://openalex.org/I4210089228","display_name":"West China Second University Hospital of Sichuan University","ror":"https://ror.org/00726et14","country_code":"CN","type":"healthcare","lineage":["https://openalex.org/I4210089228"]},{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi He","raw_affiliation_strings":["College of Electronics and Information Engineering, Sichuan University, Chengdu, China","West China Second University Hospital, Sichuan University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"College of Electronics and Information Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24201400","https://openalex.org/I24185976"]},{"raw_affiliation_string":"West China Second University Hospital, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976","https://openalex.org/I4210089228"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101628578","display_name":"Yunfeng Qiu","orcid":"https://orcid.org/0000-0002-4336-8206"},"institutions":[{"id":"https://openalex.org/I4210145500","display_name":"Guizhou Electric Power Design and Research Institute","ror":"https://ror.org/055f13495","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210145500"]},{"id":"https://openalex.org/I4210126911","display_name":"Guizhou Academy of Testing & Analysis","ror":"https://ror.org/032eb5z33","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210126911"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunfeng Qiu","raw_affiliation_strings":["Guizhou Institute of Aerospace Metrology and Testing Technology, Guiyang, China"],"affiliations":[{"raw_affiliation_string":"Guizhou Institute of Aerospace Metrology and Testing Technology, Guiyang, China","institution_ids":["https://openalex.org/I4210126911","https://openalex.org/I4210145500"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5101447332"],"corresponding_institution_ids":["https://openalex.org/I24185976","https://openalex.org/I24201400"],"apc_list":null,"apc_paid":null,"fwci":1.8213,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.8196815,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11609","display_name":"Geophysical Methods and Applications","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2212","display_name":"Ocean Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.7815352082252502},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.741460919380188},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6347044706344604},{"id":"https://openalex.org/keywords/microwave","display_name":"Microwave","score":0.6266792416572571},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5551608800888062},{"id":"https://openalex.org/keywords/microwave-imaging","display_name":"Microwave imaging","score":0.5174522995948792},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.494069367647171},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4712303876876831},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.4637039303779602},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3726806640625},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3705592155456543},{"id":"https://openalex.org/keywords/biological-system","display_name":"Biological system","score":0.3656091094017029},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.17391836643218994},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14183083176612854},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.14120644330978394},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09303528070449829}],"concepts":[{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.7815352082252502},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.741460919380188},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6347044706344604},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.6266792416572571},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5551608800888062},{"id":"https://openalex.org/C2779885931","wikidata":"https://www.wikidata.org/wiki/Q17010029","display_name":"Microwave imaging","level":3,"score":0.5174522995948792},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.494069367647171},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4712303876876831},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.4637039303779602},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3726806640625},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3705592155456543},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.3656091094017029},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.17391836643218994},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14183083176612854},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.14120644330978394},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09303528070449829},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2022.3147865","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2022.3147865","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G610110112","display_name":null,"funder_award_id":"20504153015","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1974266428","https://openalex.org/W1979287180","https://openalex.org/W1988031892","https://openalex.org/W1990761507","https://openalex.org/W2041812800","https://openalex.org/W2059716169","https://openalex.org/W2070900608","https://openalex.org/W2076331149","https://openalex.org/W2089750674","https://openalex.org/W2128355759","https://openalex.org/W2141474838","https://openalex.org/W2292427749","https://openalex.org/W2293014232","https://openalex.org/W2462811418","https://openalex.org/W2496789290","https://openalex.org/W2627067211","https://openalex.org/W2729730500","https://openalex.org/W2786356053","https://openalex.org/W2790906769","https://openalex.org/W2797485259","https://openalex.org/W2808359550","https://openalex.org/W2877942920","https://openalex.org/W2884251957","https://openalex.org/W2897338040","https://openalex.org/W2898117398","https://openalex.org/W2902704683","https://openalex.org/W2903671891","https://openalex.org/W2908595414","https://openalex.org/W2922317293","https://openalex.org/W2950052983","https://openalex.org/W2998318059","https://openalex.org/W3036955937","https://openalex.org/W3041533652","https://openalex.org/W3041990426","https://openalex.org/W3115058063"],"related_works":["https://openalex.org/W2971284929","https://openalex.org/W3046000334","https://openalex.org/W2010800332","https://openalex.org/W3184095098","https://openalex.org/W4247269142","https://openalex.org/W2396133027","https://openalex.org/W2084522216","https://openalex.org/W1493885512","https://openalex.org/W2021460492","https://openalex.org/W2011229564"],"abstract_inverted_index":{"The":[0,111,141,214],"microwave":[1,18],"nondestructive":[2],"testing":[3],"(MNDT)":[4],"technique":[5,38],"is":[6,39,80,181,217],"an":[7,58,88],"attractive":[8],"candidate":[9],"for":[10,41],"defect":[11,42],"detection":[12,43,157],"in":[13],"the":[14,26,29,45,51,84,108,121,133,165,172,186,193,197,209,220],"dielectric":[15,30,73,85,127,146],"structures":[16],"as":[17],"signals":[19],"can":[20,68,158],"penetrate":[21],"inside":[22],"and":[23,57,67,103,117,135,150],"interact":[24],"with":[25,75,87,99,167],"insides":[27],"of":[28,126,137,143,156,164,177,211,219],"material.":[31],"In":[32,120],"this":[33,138,212],"research,":[34],"a":[35,168,178],"novel":[36],"MNDT":[37],"presented":[40],"combining":[44],"time":[46],"domain":[47],"reflectometry":[48],"(TDR)":[49],"technique,":[50,56],"wavelet":[52],"decomposition":[53],"analysis":[54,188],"(WDA)":[55],"artificial":[59],"neural":[60],"network":[61],"(ANN),":[62],"which":[63,180],"has":[64],"good":[65],"generality":[66,134],"be":[69,159],"applied":[70],"to":[71,96,131,207],"various":[72],"materials":[74,128,147],"different":[76],"thicknesses.":[77],"This":[78],"method":[79,112],"based":[81],"on":[82,171],"scanning":[83],"material":[86],"open-ended":[89],"rectangular":[90],"waveguide":[91],"(OERW)":[92],"operating":[93],"from":[94],"18":[95],"26.5":[97],"GHz":[98],"201":[100],"frequency":[101],"points":[102],"analyzing":[104],"its":[105],"reflections":[106],"using":[107,196],"proposed":[109,139],"algorithm.":[110],"was":[113,189],"validated":[114],"by":[115,161,183,191],"simulation":[116],"experiments":[118],"successfully.":[119],"simulations,":[122],"two":[123,145],"typical":[124],"kinds":[125],"were":[129,148,205],"used":[130],"verify":[132],"accuracy":[136,216],"method.":[140,213],"accuracies":[142],"these":[144],"96%":[149],"90%,":[151],"respectively.":[152],"A":[153],"2-D":[154],"image":[155],"constructed":[160],"performing":[162],"repetition":[163],"process":[166],"certain":[169],"step":[170],"<italic":[173],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[174],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">xy</i>":[175],"plane":[176],"material,":[179],"illustrated":[182],"simulations.":[184],"Meanwhile,":[185],"sensitivity":[187],"performed":[190],"studying":[192],"similarity":[194],"quantified":[195],"Pearson\u2019s":[198],"coefficient":[199],"correlation.":[200],"Eventually,":[201],"some":[202],"FR4":[203],"samples":[204],"machined":[206],"demonstrate":[208],"feasibility":[210],"acceptable":[215],"86%":[218],"experimental":[221],"result.":[222]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}