{"id":"https://openalex.org/W4205610425","doi":"https://doi.org/10.1109/tim.2021.3137558","title":"Real-Time Accurate Deep Learning-Based Edge Detection for 3-D Pantograph Pose Status Inspection","display_name":"Real-Time Accurate Deep Learning-Based Edge Detection for 3-D Pantograph Pose Status Inspection","publication_year":2022,"publication_date":"2022-01-01","ids":{"openalex":"https://openalex.org/W4205610425","doi":"https://doi.org/10.1109/tim.2021.3137558"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3137558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3137558","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077738425","display_name":"D. M. Li","orcid":"https://orcid.org/0000-0001-6680-6451"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Dong Li","raw_affiliation_strings":["Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083026056","display_name":"Xiao Pan","orcid":"https://orcid.org/0000-0001-8786-9347"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao Pan","raw_affiliation_strings":["Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027990086","display_name":"Zhenzhou Fu","orcid":"https://orcid.org/0000-0002-3859-6132"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenzhou Fu","raw_affiliation_strings":["Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057383305","display_name":"Luonan Chang","orcid":"https://orcid.org/0000-0002-1666-4966"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luonan Chang","raw_affiliation_strings":["Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100602615","display_name":"Guangjun Zhang","orcid":"https://orcid.org/0000-0003-1365-716X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangjun Zhang","raw_affiliation_strings":["Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Key Laboratory of Precision Opto-Mechatronics Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5077738425"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.6877,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.81519769,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12371","display_name":"Electrical Contact Performance and Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10842","display_name":"Railway Engineering and Dynamics","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9789999723434448,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6843140721321106},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6735159158706665},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6535981893539429},{"id":"https://openalex.org/keywords/subpixel-rendering","display_name":"Subpixel rendering","score":0.6346640586853027},{"id":"https://openalex.org/keywords/reprojection-error","display_name":"Reprojection error","score":0.5280460119247437},{"id":"https://openalex.org/keywords/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.5259005427360535},{"id":"https://openalex.org/keywords/edge-detection","display_name":"Edge detection","score":0.5167043209075928},{"id":"https://openalex.org/keywords/pantograph","display_name":"Pantograph","score":0.4295576810836792},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22472482919692993},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.21642139554023743},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.19305509328842163}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6843140721321106},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6735159158706665},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6535981893539429},{"id":"https://openalex.org/C68516990","wikidata":"https://www.wikidata.org/wiki/Q452912","display_name":"Subpixel rendering","level":3,"score":0.6346640586853027},{"id":"https://openalex.org/C23903533","wikidata":"https://www.wikidata.org/wiki/Q17122739","display_name":"Reprojection error","level":3,"score":0.5280460119247437},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.5259005427360535},{"id":"https://openalex.org/C193536780","wikidata":"https://www.wikidata.org/wiki/Q1513153","display_name":"Edge detection","level":4,"score":0.5167043209075928},{"id":"https://openalex.org/C20756127","wikidata":"https://www.wikidata.org/wiki/Q722757","display_name":"Pantograph","level":2,"score":0.4295576810836792},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22472482919692993},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.21642139554023743},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.19305509328842163},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3137558","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3137558","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W845365781","https://openalex.org/W1984667320","https://openalex.org/W2008317417","https://openalex.org/W2119823327","https://openalex.org/W2148988705","https://openalex.org/W2159589665","https://openalex.org/W2167667767","https://openalex.org/W2194775991","https://openalex.org/W2307770531","https://openalex.org/W2466026444","https://openalex.org/W2528296119","https://openalex.org/W2555344168","https://openalex.org/W2560622558","https://openalex.org/W2770740228","https://openalex.org/W2772386856","https://openalex.org/W2790914279","https://openalex.org/W2883254424","https://openalex.org/W2884561390","https://openalex.org/W2903669919","https://openalex.org/W2910135575","https://openalex.org/W2953881420","https://openalex.org/W2963323244","https://openalex.org/W2963402313","https://openalex.org/W2964221239","https://openalex.org/W2997846423","https://openalex.org/W3026512409","https://openalex.org/W3092103550","https://openalex.org/W3129715319","https://openalex.org/W3135459745","https://openalex.org/W3137589698","https://openalex.org/W3198067745","https://openalex.org/W6635797942","https://openalex.org/W6637373629","https://openalex.org/W6760424586","https://openalex.org/W6771492595"],"related_works":["https://openalex.org/W2118974006","https://openalex.org/W2121391504","https://openalex.org/W1512144143","https://openalex.org/W1488997961","https://openalex.org/W2361076620","https://openalex.org/W2142711533","https://openalex.org/W2027582987","https://openalex.org/W2371855755","https://openalex.org/W185753090","https://openalex.org/W2763966779"],"abstract_inverted_index":{"As":[0],"an":[1,169],"important":[2],"part":[3],"of":[4,30,72,75,139,153,217],"the":[5,28,31,35,43,70,119,122,136,140,154,158,165,175,178,182,214,218],"online":[6,220],"monitoring":[7,221],"in":[8,19,69,105,202],"electrified":[9],"railway,":[10],"pantograph":[11,20,62,65,241],"operational":[12,50],"pose":[13,51,66,86,150,225,243],"inspection":[14,67],"plays":[15],"a":[16,57,91,146,234],"vital":[17],"role":[18],"and":[21,85,101,116,181,190,237],"catenary":[22],"system":[23],"(PCS)":[24],"security.":[25],"Due":[26],"to":[27,41,111,121,172,186],"impact":[29],"complex":[32,215],"conditions":[33,216],"on":[34],"train":[36],"roof,":[37],"it":[38],"is":[39],"difficult":[40],"replace":[42],"existing":[44],"video":[45],"surveillance":[46],"with":[47,207],"fully":[48],"intelligent":[49],"inspection.":[52,244],"Therefore,":[53],"this":[54],"article":[55],"proposes":[56],"novel":[58],"accurate":[59],"monocular":[60,155,239],"3-D":[61,149,240],"horn":[63],"edge-based":[64],"method":[68,152,196],"power":[71],"superior":[73],"ability":[74],"deep":[76],"learning.":[77],"It":[78],"mainly":[79],"includes":[80],"two":[81],"steps:":[82],"edge":[83,95,107,114,141,184,205],"detection":[84],"optimization.":[87],"First,":[88],"we":[89,144,162],"highlight":[90],"brand-new":[92],"high-precision":[93,238],"subpixel":[94,123],"prediction":[96,103],"network.":[97],"The":[98,223],"downsampling":[99],"heatmap":[100],"offset":[102],"map":[104],"our":[106,127,195,230],"detector":[108],"are":[109],"joined":[110],"predict":[112],"full-size":[113],"points":[115,180,185],"thus":[117],"improve":[118],"accuracy":[120],"level.":[124],"In":[125,157],"addition,":[126],"newly":[128],"proposed":[129],"numerical":[130],"gradient":[131],"smoothing":[132],"loss":[133],"function":[134,171],"overcomes":[135],"&#x201C;jaggy&#x201D;":[137],"phenomenon":[138],"curves.":[142],"Second,":[143],"propose":[145],"nonpoint-to-point":[147],"corresponding":[148],"measurement":[151,226],"camera.":[156],"iterative":[159],"optimized":[160],"process,":[161],"innovatively":[163],"apply":[164],"chamfer":[166],"distance":[167],"as":[168],"optimization":[170],"dynamically":[173],"adjust":[174],"correspondence":[176],"between":[177],"reprojection":[179],"predicted":[183],"optimal":[187],"convergence.":[188],"Ablation":[189],"comparative":[191],"experiments":[192],"demonstrate":[193],"that":[194],"achieves":[197],"excellent":[198],"performance":[199],"(F-score":[200],"93.0&#x0025;":[201],"FEP<sub>2.0</sub>":[203],"(fixed":[204],"probability)":[206],"82":[208],"frames":[209],"per":[210],"second":[211],"(FPS),":[212],"overcoming":[213],"practical":[219],"sequences.":[222],"actual":[224],"results":[227],"further":[228],"confirm":[229],"efficiency,":[231],"thereby":[232],"achieving":[233],"robust":[235],"real-time":[236],"operating":[242]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":2}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}