{"id":"https://openalex.org/W4205441678","doi":"https://doi.org/10.1109/tim.2021.3135328","title":"LSTM-GAN-AE: A Promising Approach for Fault Diagnosis in Machine Health Monitoring","display_name":"LSTM-GAN-AE: A Promising Approach for Fault Diagnosis in Machine Health Monitoring","publication_year":2021,"publication_date":"2021-12-20","ids":{"openalex":"https://openalex.org/W4205441678","doi":"https://doi.org/10.1109/tim.2021.3135328"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3135328","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3135328","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077914763","display_name":"Haoqiang Liu","orcid":"https://orcid.org/0000-0002-9725-4730"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Haoqiang Liu","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9725-4730","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011270130","display_name":"Hongbo Zhao","orcid":"https://orcid.org/0000-0002-1196-4089"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hongbo Zhao","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1196-4089","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101539395","display_name":"Jiayue Wang","orcid":"https://orcid.org/0000-0002-0606-8132"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayue Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-0606-8132","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076471244","display_name":"S. W. K. Yuan","orcid":"https://orcid.org/0000-0002-9818-1609"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Yuan","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9818-1609","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037415977","display_name":"Wenquan Feng","orcid":"https://orcid.org/0000-0002-5180-7889"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenquan Feng","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-5180-7889","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5077914763"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":5.6892,"has_fulltext":false,"cited_by_count":59,"citation_normalized_percentile":{"value":0.96570172,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":96,"max":100},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13690","display_name":"Quality and Safety in Healthcare","score":0.954200029373169,"subfield":{"id":"https://openalex.org/subfields/3607","display_name":"Medical Laboratory Technology"},"field":{"id":"https://openalex.org/fields/36","display_name":"Health Professions"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.949999988079071,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/discriminative-model","display_name":"Discriminative model","score":0.7430307865142822},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7386714816093445},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.6771671772003174},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.6128032803535461},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6083166599273682},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5304063558578491},{"id":"https://openalex.org/keywords/feature-learning","display_name":"Feature learning","score":0.5184102058410645},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.48904332518577576},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.48324403166770935},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4508870542049408},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4447788596153259},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4333207309246063},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3672064542770386},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.17562156915664673},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1354389786720276}],"concepts":[{"id":"https://openalex.org/C97931131","wikidata":"https://www.wikidata.org/wiki/Q5282087","display_name":"Discriminative model","level":2,"score":0.7430307865142822},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7386714816093445},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.6771671772003174},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.6128032803535461},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6083166599273682},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5304063558578491},{"id":"https://openalex.org/C59404180","wikidata":"https://www.wikidata.org/wiki/Q17013334","display_name":"Feature learning","level":2,"score":0.5184102058410645},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.48904332518577576},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.48324403166770935},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4508870542049408},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4447788596153259},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4333207309246063},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3672064542770386},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.17562156915664673},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1354389786720276},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3135328","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3135328","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6499999761581421,"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities"}],"awards":[{"id":"https://openalex.org/G2127118556","display_name":null,"funder_award_id":"61901015","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W119403003","https://openalex.org/W1584412742","https://openalex.org/W2007200746","https://openalex.org/W2134490011","https://openalex.org/W2144182447","https://openalex.org/W2219903032","https://openalex.org/W2580344951","https://openalex.org/W2736225434","https://openalex.org/W2740570963","https://openalex.org/W2767507316","https://openalex.org/W2770344288","https://openalex.org/W2773549135","https://openalex.org/W2889285628","https://openalex.org/W2912412749","https://openalex.org/W2922660557","https://openalex.org/W2929444508","https://openalex.org/W2942497026","https://openalex.org/W2955338161","https://openalex.org/W2957277585","https://openalex.org/W2973942754","https://openalex.org/W2988491129","https://openalex.org/W2989424303","https://openalex.org/W3003509724","https://openalex.org/W3008361768","https://openalex.org/W3032084226","https://openalex.org/W3040477528","https://openalex.org/W3045546070","https://openalex.org/W3090241307","https://openalex.org/W3095206894","https://openalex.org/W3102904972","https://openalex.org/W3107314600","https://openalex.org/W3110652625","https://openalex.org/W3130785848","https://openalex.org/W3132191748","https://openalex.org/W3134751001","https://openalex.org/W3140660742","https://openalex.org/W3163950538","https://openalex.org/W3176041833","https://openalex.org/W3194185277"],"related_works":["https://openalex.org/W2983142544","https://openalex.org/W2891059443","https://openalex.org/W4281663961","https://openalex.org/W3208888551","https://openalex.org/W4313561566","https://openalex.org/W3208386644","https://openalex.org/W4389832810","https://openalex.org/W4220682630","https://openalex.org/W3181622257","https://openalex.org/W3163146846"],"abstract_inverted_index":{"Recent":[0],"years":[1],"have":[2],"witnessed":[3],"that":[4,125,206],"real-time":[5],"health":[6,86],"monitoring":[7,87],"for":[8,37,98,118],"machine":[9,85],"gains":[10],"more":[11,13],"and":[12,23,40,58,131,151,167,181],"importance":[14],"with":[15,115],"the":[16,34,104,136,148,153,162,171,187,190,207,215],"goal":[17],"of":[18,64,189],"achieving":[19],"fault":[20],"diagnosis":[21,27,44,99,183],"(FD)":[22],"predictive":[24],"maintenance.":[25],"Conventional":[26],"methods":[28,94],"face":[29],"formidable":[30],"challenges":[31],"imposed":[32],"by":[33],"high":[35],"requirement":[36],"expert":[38],"knowledge":[39],"extensive":[41],"labor.":[42],"The":[43],"scheme":[45],"based":[46,134],"on":[47,135],"deep":[48],"learning":[49,173],"(DL)":[50],"models":[51,67],"has":[52],"served":[53],"as":[54,92,199],"a":[55,110,122],"promising":[56],"solution":[57],"achieved":[59],"great":[60],"success.":[61],"However,":[62],"many":[63],"these":[65],"DL-based":[66],"are":[68,197],"fail":[69],"to":[70,81,84,146,160,177,214],"extract":[71],"critical":[72,163],"temporal":[73,164],"information":[74,180],"thoroughly.":[75],"In":[76],"addition,":[77],"it":[78],"is":[79,121,144,158,175],"difficult":[80],"apply":[82],"them":[83],"(MHM)":[88],"in":[89,100],"real":[90],"time":[91,97],"those":[93],"take":[95],"long":[96,138],"practice.":[101],"To":[102,185],"address":[103],"aforementioned":[105],"issues,":[106],"this":[107],"article":[108],"introduces":[109],"novel":[111],"intelligent":[112],"FD":[113],"algorithm":[114,209],"three":[116],"stages":[117],"MHM.":[119],"It":[120],"hybrid":[123],"framework":[124],"combines":[126],"generative":[127],"adversarial":[128],"networks":[129],"(GANs)":[130],"autoencoder":[132],"(AE)":[133],"bidirectional":[137],"short-term":[139],"memory":[140],"(bi-LSTM).":[141],"First,":[142],"GAN":[143],"employed":[145],"obtain":[147],"reconstruction":[149],"residual":[150],"learn":[152],"discriminative":[154],"representation.":[155],"Then,":[156],"AE":[157],"used":[159],"perform":[161],"features":[165],"extraction":[166],"dimension":[168],"reduction.":[169],"Finally,":[170],"supervised":[172],"model":[174],"constructed":[176],"integrate":[178],"feature":[179],"predict":[182],"results.":[184],"verify":[186],"effectiveness":[188],"proposed":[191,208],"algorithm,":[192],"typical":[193],"rolling":[194],"bearing":[195],"datasets":[196],"taken":[198],"trial":[200],"data.":[201],"Preliminary":[202],"simulation":[203],"results":[204],"demonstrate":[205],"achieves":[210],"superior":[211],"performance":[212],"compared":[213],"competing":[216],"methods.":[217]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":17},{"year":2024,"cited_by_count":22},{"year":2023,"cited_by_count":15},{"year":2022,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}