{"id":"https://openalex.org/W3217356380","doi":"https://doi.org/10.1109/tim.2021.3129204","title":"An Improved Cross-Yoke SST for Accurate 1-D and 2-D Magnetic Testing of Fe-Si Sheets","display_name":"An Improved Cross-Yoke SST for Accurate 1-D and 2-D Magnetic Testing of Fe-Si Sheets","publication_year":2021,"publication_date":"2021-11-18","ids":{"openalex":"https://openalex.org/W3217356380","doi":"https://doi.org/10.1109/tim.2021.3129204","mag":"3217356380"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3129204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3129204","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038890502","display_name":"Yu Dou","orcid":"https://orcid.org/0000-0002-5086-0338"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Dou","raw_affiliation_strings":["State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-5086-0338","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100779228","display_name":"Yongjian Li","orcid":"https://orcid.org/0000-0003-1776-005X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongjian Li","raw_affiliation_strings":["State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-1776-005X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040923386","display_name":"Zhiwei Lin","orcid":"https://orcid.org/0000-0002-9772-486X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiwei Lin","raw_affiliation_strings":["State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-9772-486X","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077321005","display_name":"Shuaichao Yue","orcid":"https://orcid.org/0000-0002-5609-0346"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuaichao Yue","raw_affiliation_strings":["State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-5609-0346","affiliations":[{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100370161","display_name":"Jianguo Zhu","orcid":"https://orcid.org/0000-0002-9763-4047"},"institutions":[{"id":"https://openalex.org/I129604602","display_name":"The University of Sydney","ror":"https://ror.org/0384j8v12","country_code":"AU","type":"education","lineage":["https://openalex.org/I129604602"]}],"countries":["AU"],"is_corresponding":false,"raw_author_name":"Jianguo Zhu","raw_affiliation_strings":["School of Electrical and Information Engineering, The University of Sydney, Sydney, NSW, Australia"],"raw_orcid":"https://orcid.org/0000-0002-9763-4047","affiliations":[{"raw_affiliation_string":"School of Electrical and Information Engineering, The University of Sydney, Sydney, NSW, Australia","institution_ids":["https://openalex.org/I129604602"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4533,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.54346733,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9939000010490417,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/yoke","display_name":"Yoke (aeronautics)","score":0.9527844190597534},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.7806265950202942},{"id":"https://openalex.org/keywords/planar","display_name":"Planar","score":0.7564566731452942},{"id":"https://openalex.org/keywords/magnetic-flux","display_name":"Magnetic flux","score":0.5783423781394958},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.4788060784339905},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43091756105422974},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.397722065448761},{"id":"https://openalex.org/keywords/nuclear-magnetic-resonance","display_name":"Nuclear magnetic resonance","score":0.3571792244911194},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3438790440559387},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.3206804394721985},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17186665534973145},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.1674482822418213},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.09282982349395752}],"concepts":[{"id":"https://openalex.org/C14536661","wikidata":"https://www.wikidata.org/wiki/Q1759012","display_name":"Yoke (aeronautics)","level":4,"score":0.9527844190597534},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.7806265950202942},{"id":"https://openalex.org/C134786449","wikidata":"https://www.wikidata.org/wiki/Q3391255","display_name":"Planar","level":2,"score":0.7564566731452942},{"id":"https://openalex.org/C157479481","wikidata":"https://www.wikidata.org/wiki/Q177831","display_name":"Magnetic flux","level":3,"score":0.5783423781394958},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.4788060784339905},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43091756105422974},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.397722065448761},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.3571792244911194},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3438790440559387},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.3206804394721985},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17186665534973145},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.1674482822418213},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.09282982349395752},{"id":"https://openalex.org/C13393347","wikidata":"https://www.wikidata.org/wiki/Q8424","display_name":"Aerodynamics","level":2,"score":0.0},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.0},{"id":"https://openalex.org/C197231348","wikidata":"https://www.wikidata.org/wiki/Q1705284","display_name":"Flight control surfaces","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3129204","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3129204","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3973943095","display_name":null,"funder_award_id":"52130710","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4456690955","display_name":null,"funder_award_id":"51977122","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G935158429","display_name":null,"funder_award_id":"51777055","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W310282747","https://openalex.org/W1970395323","https://openalex.org/W1981361316","https://openalex.org/W2005611963","https://openalex.org/W2005835640","https://openalex.org/W2012440712","https://openalex.org/W2015681344","https://openalex.org/W2021139146","https://openalex.org/W2042988469","https://openalex.org/W2043085031","https://openalex.org/W2043653195","https://openalex.org/W2053040372","https://openalex.org/W2059811648","https://openalex.org/W2083489504","https://openalex.org/W2089764814","https://openalex.org/W2114639712","https://openalex.org/W2119486733","https://openalex.org/W2128011127","https://openalex.org/W2150810727","https://openalex.org/W2169028543","https://openalex.org/W2292675030","https://openalex.org/W2334528010","https://openalex.org/W2336944899","https://openalex.org/W2343173416","https://openalex.org/W2479883823","https://openalex.org/W2884755595","https://openalex.org/W2887764723","https://openalex.org/W2890935121","https://openalex.org/W2911561205","https://openalex.org/W3000020522","https://openalex.org/W3040319489","https://openalex.org/W4235706911"],"related_works":["https://openalex.org/W3217356380","https://openalex.org/W2077882476","https://openalex.org/W2146830657","https://openalex.org/W2324732596","https://openalex.org/W2257386847","https://openalex.org/W2137482304","https://openalex.org/W2011474076","https://openalex.org/W3191949626","https://openalex.org/W2077004654","https://openalex.org/W2989678236"],"abstract_inverted_index":{"Single-sheet":[0],"testers":[1],"(SSTs)":[2],"with":[3,107,164],"asymmetrical":[4],"yokes":[5,79],"were":[6],"developed":[7],"for":[8],"convenient":[9],"measurement":[10],"of":[11,17,23,35,54,84,122,131,137,142],"1-D":[12,145],"and":[13,112,127,146,151],"2-D":[14,115,147],"magnetic":[15,29,59,90,135],"properties":[16,30,136],"Fe-Si":[18,140],"sheets.":[19],"An":[20],"inherent":[21],"drawback":[22],"such":[24,93],"SSTs":[25],"is":[26],"that":[27],"the":[28,32,36,41,47,51,55,58,62,65,73,82,89,97,108,113,120,123,129,132,157,162,169],"in":[31,46,64,72],"central":[33],"region":[34],"specimen":[37,48,63,111],"are":[38,149],"affected":[39],"by":[40,167],"planar":[42,85,124],"eddy":[43,86,125],"currents":[44,87,126],"induced":[45],"plane":[49],"facing":[50],"pole":[52],"faces":[53],"yokes,":[56],"where":[57],"flux":[60],"enters":[61],"normal":[66],"direction.":[67],"Most":[68],"relevant":[69],"studies":[70],"reported":[71],"literature":[74],"use":[75],"large":[76],"symmetrical":[77],"double":[78],"to":[80,118],"mitigate":[81],"influence":[83,121],"on":[88],"properties.":[91],"However,":[92],"configuration":[94],"significantly":[95],"increases":[96],"system":[98],"complexity.":[99],"This":[100],"article":[101],"proposes":[102],"a":[103],"compact":[104],"cross-yoke":[105,159],"SST":[106,160],"novel":[109],"arm-slotted":[110],"integrated":[114],"B-H":[116],"sensor":[117],"minimize":[119],"simplify":[128],"structure":[130],"SST.":[133,172],"The":[134,153],"non-oriented":[138],"(NO)":[139],"sheets":[141],"50JN470":[143],"under":[144],"magnetizations":[148],"measured":[150,166],"analyzed.":[152],"experimental":[154],"results":[155],"from":[156],"proposed":[158],"show":[161],"agreement":[163],"those":[165],"using":[168],"international":[170],"standard":[171]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}