{"id":"https://openalex.org/W3214331069","doi":"https://doi.org/10.1109/tim.2021.3127655","title":"Estimation Method for Voltage Sag Occurrence Frequency Based on Calculation of Protection Operating Time Characteristics","display_name":"Estimation Method for Voltage Sag Occurrence Frequency Based on Calculation of Protection Operating Time Characteristics","publication_year":2021,"publication_date":"2021-11-11","ids":{"openalex":"https://openalex.org/W3214331069","doi":"https://doi.org/10.1109/tim.2021.3127655","mag":"3214331069"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3127655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3127655","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101826729","display_name":"Shunyi Li","orcid":"https://orcid.org/0000-0003-2687-7524"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Shunyi Li","raw_affiliation_strings":["College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-2687-7524","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100628923","display_name":"Ying Wang","orcid":"https://orcid.org/0000-0002-7682-8299"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ying Wang","raw_affiliation_strings":["College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0002-7682-8299","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101500381","display_name":"Wenxi Hu","orcid":"https://orcid.org/0000-0003-1609-784X"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenxi Hu","raw_affiliation_strings":["College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0003-1609-784X","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041666549","display_name":"Xianyong Xiao","orcid":"https://orcid.org/0000-0001-5926-4068"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xianyong Xiao","raw_affiliation_strings":["College of Electrical Engineering, Sichuan University, Chengdu, China"],"raw_orcid":"https://orcid.org/0000-0001-5926-4068","affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5101826729"],"corresponding_institution_ids":["https://openalex.org/I24185976"],"apc_list":null,"apc_paid":null,"fwci":1.193,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.77867625,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6266965866088867},{"id":"https://openalex.org/keywords/mahalanobis-distance","display_name":"Mahalanobis distance","score":0.5838578343391418},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.5795995593070984},{"id":"https://openalex.org/keywords/voltage-sag","display_name":"Voltage sag","score":0.5646417140960693},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5315321087837219},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.467292845249176},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.43236014246940613},{"id":"https://openalex.org/keywords/dbscan","display_name":"DBSCAN","score":0.4191742241382599},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35569947957992554},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22655513882637024},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18625792860984802},{"id":"https://openalex.org/keywords/fuzzy-clustering","display_name":"Fuzzy clustering","score":0.17207306623458862}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6266965866088867},{"id":"https://openalex.org/C1921717","wikidata":"https://www.wikidata.org/wiki/Q1334846","display_name":"Mahalanobis distance","level":2,"score":0.5838578343391418},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.5795995593070984},{"id":"https://openalex.org/C2781134633","wikidata":"https://www.wikidata.org/wiki/Q14945479","display_name":"Voltage sag","level":4,"score":0.5646417140960693},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5315321087837219},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.467292845249176},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.43236014246940613},{"id":"https://openalex.org/C46576248","wikidata":"https://www.wikidata.org/wiki/Q1114630","display_name":"DBSCAN","level":5,"score":0.4191742241382599},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35569947957992554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22655513882637024},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18625792860984802},{"id":"https://openalex.org/C17212007","wikidata":"https://www.wikidata.org/wiki/Q5511111","display_name":"Fuzzy clustering","level":3,"score":0.17207306623458862},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C104047586","wikidata":"https://www.wikidata.org/wiki/Q5033439","display_name":"Canopy clustering algorithm","level":4,"score":0.0},{"id":"https://openalex.org/C2779665505","wikidata":"https://www.wikidata.org/wiki/Q1780079","display_name":"Power quality","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3127655","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3127655","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8956686161","display_name":null,"funder_award_id":"52077145","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W2008664905","https://openalex.org/W2032151676","https://openalex.org/W2041787566","https://openalex.org/W2062916986","https://openalex.org/W2103532528","https://openalex.org/W2130964246","https://openalex.org/W2136213984","https://openalex.org/W2156398656","https://openalex.org/W2163313763","https://openalex.org/W2167829702","https://openalex.org/W2170748639","https://openalex.org/W2335920254","https://openalex.org/W2345362456","https://openalex.org/W2418823788","https://openalex.org/W2513861930","https://openalex.org/W2548181492","https://openalex.org/W2568512524","https://openalex.org/W2786205735","https://openalex.org/W2807261398","https://openalex.org/W2808259676","https://openalex.org/W2907550710","https://openalex.org/W2914681189","https://openalex.org/W2966506848","https://openalex.org/W3000266521","https://openalex.org/W3079163541","https://openalex.org/W3094458710","https://openalex.org/W3108940539","https://openalex.org/W3125503819","https://openalex.org/W4243551619","https://openalex.org/W4250610288"],"related_works":["https://openalex.org/W4382795578","https://openalex.org/W3176449234","https://openalex.org/W2807508722","https://openalex.org/W2353158678","https://openalex.org/W2767235736","https://openalex.org/W4225278791","https://openalex.org/W2045002201","https://openalex.org/W2971352445","https://openalex.org/W4322502698","https://openalex.org/W2604015980"],"abstract_inverted_index":{"Voltage":[0],"sag":[1],"occurrence":[2],"frequency":[3],"(VSOF)":[4],"estimation":[5],"includes":[6],"the":[7,21,28,38,42,45,74,96,111,127,141,150,174],"prediction":[8],"of":[9,31,44,118,140],"residual":[10],"voltage":[11],"and":[12,26,82,103,130,137,170],"duration.":[13],"The":[14,67,101,114,134],"former":[15],"has":[16],"been":[17],"well":[18],"studied,":[19],"whereas":[20,173],"latter":[22],"presents":[23],"many":[24],"challenges,":[25],"is":[27,50,70,124,145,178],"main":[29],"focus":[30],"this":[32,53,89,154,182],"study.":[33],"A":[34],"method":[35,58,94,158],"for":[36,59,95],"estimating":[37],"VSOF":[39,161],"based":[40,62,109],"on":[41,63,110],"calculation":[43,93,139],"protection":[46,60,68,97],"operating":[47,98,104,142,164],"time":[48,99,105,143,165],"characteristics":[49],"proposed.":[51],"First,":[52],"article":[54,90],"adopts":[55],"a":[56,92,157],"recognition":[57],"types":[61],"monitored":[64],"historical":[65],"data.":[66],"type":[69],"recognized":[71],"by":[72,126,162],"dividing":[73],"fault":[75,168],"electrical":[76],"quantity":[77],"(FEQ)":[78],"into":[79],"several":[80],"intervals":[81],"calculating":[83],"their":[84],"mean":[85],"standard":[86],"deviation.":[87],"Second,":[88],"proposes":[91,156],"characteristics.":[100],"FEQ":[102],"samples":[106],"are":[107],"clustered":[108],"proposed":[112],"algorithm.":[113],"density-based":[115],"spatial":[116],"clustering":[117,151],"applications":[119],"with":[120,149],"noise":[121],"(DBSCAN)":[122],"algorithm":[123],"enhanced":[125],"Mahalanobis":[128],"distance":[129],"K-nearest-neighbor":[131],"(KNN)":[132],"method.":[133,183],"least-square":[135],"fitting":[136],"segmentation":[138],"curve":[144],"performed":[146],"in":[147],"accordance":[148],"results.":[152],"Finally,":[153],"study":[155],"to":[159,180],"predict":[160],"considering":[163],"curves,":[166],"different":[167],"resistances,":[169],"generator":[171],"scheduling,":[172],"IEEE-30":[175],"test":[176],"system":[177],"used":[179],"verify":[181]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":4},{"year":2022,"cited_by_count":3}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}