{"id":"https://openalex.org/W3214649496","doi":"https://doi.org/10.1109/tim.2021.3125969","title":"Industrial Process Modeling and Monitoring Based on Jointly Specific and Shared Dictionary Learning","display_name":"Industrial Process Modeling and Monitoring Based on Jointly Specific and Shared Dictionary Learning","publication_year":2021,"publication_date":"2021-11-08","ids":{"openalex":"https://openalex.org/W3214649496","doi":"https://doi.org/10.1109/tim.2021.3125969","mag":"3214649496"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3125969","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3125969","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049939311","display_name":"Keke Huang","orcid":"https://orcid.org/0000-0003-3553-3424"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Keke Huang","raw_affiliation_strings":["School of Automation, Central South University, Changsha 410083, China"],"raw_orcid":"https://orcid.org/0000-0003-3553-3424","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha 410083, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001991412","display_name":"Zui Tao","orcid":"https://orcid.org/0000-0002-0701-825X"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zui Tao","raw_affiliation_strings":["School of Automation, Central South University, Changsha 410083, China"],"raw_orcid":"https://orcid.org/0000-0002-0701-825X","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha 410083, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038338600","display_name":"Bei Sun","orcid":"https://orcid.org/0000-0003-3503-801X"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bei Sun","raw_affiliation_strings":["School of Automation, Central South University, Changsha 410083, China. (e-mail: sunbei@csu.edu.cn)","[School of Automation, Central South University, Changsha 410083, China. (e-mail: sunbei@csu.edu.cn)]"],"raw_orcid":"https://orcid.org/0000-0003-3503-801X","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha 410083, China. (e-mail: sunbei@csu.edu.cn)","institution_ids":["https://openalex.org/I139660479"]},{"raw_affiliation_string":"[School of Automation, Central South University, Changsha 410083, China. (e-mail: sunbei@csu.edu.cn)]","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108047088","display_name":"Chunhua Yang","orcid":"https://orcid.org/0000-0003-2550-1509"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunhua Yang","raw_affiliation_strings":["School of Automation, Central South University, Changsha 410083, China"],"raw_orcid":"https://orcid.org/0000-0003-2550-1509","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha 410083, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100711520","display_name":"Weihua Gui","orcid":"https://orcid.org/0000-0002-5337-6445"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weihua Gui","raw_affiliation_strings":["School of Automation, Central South University, Changsha 410083, China"],"raw_orcid":"https://orcid.org/0000-0002-5337-6445","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha 410083, China","institution_ids":["https://openalex.org/I139660479"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139660479"],"apc_list":null,"apc_paid":null,"fwci":2.5714,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.89754485,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"71","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9829999804496765,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9801999926567078,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.722252368927002},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7170503735542297},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.6946543455123901},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.576960563659668},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4955836534500122},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4955064058303833},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.47891414165496826},{"id":"https://openalex.org/keywords/rank","display_name":"Rank (graph theory)","score":0.46472054719924927},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.34559470415115356},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11024510860443115},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09532710909843445}],"concepts":[{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.722252368927002},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7170503735542297},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.6946543455123901},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.576960563659668},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4955836534500122},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4955064058303833},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.47891414165496826},{"id":"https://openalex.org/C164226766","wikidata":"https://www.wikidata.org/wiki/Q7293202","display_name":"Rank (graph theory)","level":2,"score":0.46472054719924927},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.34559470415115356},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11024510860443115},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09532710909843445},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3125969","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3125969","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4","score":0.5199999809265137}],"awards":[{"id":"https://openalex.org/G1162581703","display_name":null,"funder_award_id":"2019CX020","funder_id":"https://openalex.org/F4320321514","funder_display_name":"Central South University"},{"id":"https://openalex.org/G1416761122","display_name":null,"funder_award_id":"62073340","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2193537665","display_name":null,"funder_award_id":"2019YFB1705300","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G721055481","display_name":null,"funder_award_id":"61860206014","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321514","display_name":"Central South University","ror":"https://ror.org/00f1zfq44"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1489950266","https://openalex.org/W1963932623","https://openalex.org/W1970537494","https://openalex.org/W1987535801","https://openalex.org/W1989261702","https://openalex.org/W1999174140","https://openalex.org/W1999419973","https://openalex.org/W2005876975","https://openalex.org/W2008686164","https://openalex.org/W2026786372","https://openalex.org/W2027805700","https://openalex.org/W2028365992","https://openalex.org/W2053514113","https://openalex.org/W2070135905","https://openalex.org/W2143288231","https://openalex.org/W2145962650","https://openalex.org/W2160547390","https://openalex.org/W2201427885","https://openalex.org/W2344941367","https://openalex.org/W2626923521","https://openalex.org/W2883667036","https://openalex.org/W2903801375","https://openalex.org/W2908271493","https://openalex.org/W3005815918","https://openalex.org/W3016930809","https://openalex.org/W3018109943","https://openalex.org/W3019898994","https://openalex.org/W3023056142","https://openalex.org/W3023883218","https://openalex.org/W3033163677","https://openalex.org/W3033620910","https://openalex.org/W3037313017","https://openalex.org/W3094206359","https://openalex.org/W3132836935","https://openalex.org/W3160417254","https://openalex.org/W3167312240","https://openalex.org/W4249625715","https://openalex.org/W6678757208"],"related_works":["https://openalex.org/W2961085424","https://openalex.org/W4306674287","https://openalex.org/W4224009465","https://openalex.org/W4286629047","https://openalex.org/W4306321456","https://openalex.org/W4285260836","https://openalex.org/W2546942002","https://openalex.org/W2970216048","https://openalex.org/W2382607599","https://openalex.org/W2356017157"],"abstract_inverted_index":{"With":[0],"the":[1,23,28,56,105,110,138,148,153,157,165,170,173,189],"development":[2],"of":[3,8,25,53,59,107,113,172],"Industrial":[4],"Cyber-Physical":[5],"Systems,":[6],"data":[7,29,143,154,158],"industrial":[9,40,60],"processes":[10],"is":[11,134,159],"collected":[12],"and":[13,36,46,79,92,99,109,122,155],"be":[14],"used":[15],"for":[16],"data-driven":[17],"process":[18,41,67,178],"monitoring.":[19,68],"But":[20],"due":[21],"to":[22,66,96,119,125,136,151,164],"variation":[24],"working":[26],"conditions,":[27],"samples":[30,144],"are":[31,44,48],"always":[32],"featured":[33],"by":[34],"characteristics":[35,43,54,98,108],"commonalities.":[37],"Generally,":[38],"in":[39,177],"data,":[42,61],"sparse":[45],"commonalities":[47,100],"strongly":[49],"correlated.":[50],"The":[51,184],"presence":[52],"hampers":[55],"feature":[57,101],"extract":[58],"thus":[62],"further":[63],"bringing":[64],"difficulties":[65],"To":[69,168],"solve":[70],"this":[71,73],"problem,":[72],"paper":[74],"proposes":[75],"a":[76,89,93],"Jointly":[77],"Specific":[78],"Shared":[80],"Dictionary":[81],"Learning":[82],"(JSSDL)":[83],"method.":[84],"Specifically,":[85],"we":[86,115,146,180],"first":[87],"build":[88],"specific":[90,120],"dictionary":[91,95,121],"shared":[94,126],"reconstruct":[97,152],"respectively.":[102],"Then,":[103],"considering":[104],"sparsity":[106,117],"strong":[111],"correlation":[112],"commonalities,":[114],"add":[116],"constraint":[118,124],"low-rank":[123],"dictionary.":[127],"After":[128],"that,":[129],"an":[130],"iterative":[131],"optimization":[132],"algorithm":[133],"proposed":[135,174,190],"optimize":[137],"two":[139,149],"dictionaries.":[140],"When":[141],"online":[142],"arrive,":[145],"use":[147],"dictionaries":[150],"determine":[156],"normal":[160],"or":[161],"faulty":[162],"according":[163],"reconstruction":[166],"error.":[167],"verify":[169],"superiority":[171],"JSSDL":[175],"method":[176,191],"monitoring,":[179],"do":[181],"extensive":[182],"experiments.":[183],"experimental":[185],"results":[186,196],"demonstrate":[187],"that":[188],"can":[192],"achieve":[193],"satisfactory":[194],"monitoring":[195],"when":[197],"compared":[198],"with":[199],"several":[200],"state-of-the-art":[201],"methods.":[202]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":5}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}