{"id":"https://openalex.org/W3213010783","doi":"https://doi.org/10.1109/tim.2021.3123492","title":"Correction to \u201cAnalog Electronic Method for Solving Nonlinear Errors of Sinusoidal Waves in Interferometry\u201d [2021 Art. no. 6504710]","display_name":"Correction to \u201cAnalog Electronic Method for Solving Nonlinear Errors of Sinusoidal Waves in Interferometry\u201d [2021 Art. no. 6504710]","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3213010783","doi":"https://doi.org/10.1109/tim.2021.3123492","mag":"3213010783"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3123492","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3123492","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5071162160","display_name":"Wenkai Zhao","orcid":"https://orcid.org/0000-0002-7570-9482"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenkai Zhao","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-7570-9482","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100750027","display_name":"Ruijun Li","orcid":"https://orcid.org/0000-0002-3743-6567"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ruijun Li","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3743-6567","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101449729","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-8542-5328"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-8542-5328","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075432003","display_name":"Ya-Xiong He","orcid":"https://orcid.org/0000-0003-1763-2744"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaxiong He","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-1763-2744","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082857475","display_name":"Zhenying Cheng","orcid":"https://orcid.org/0000-0002-0043-5528"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhenying Cheng","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-0043-5528","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086502740","display_name":"Liansheng Zhang","orcid":"https://orcid.org/0000-0002-6536-0571"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liansheng Zhang","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-6536-0571","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060100661","display_name":"Qiaosheng Pan","orcid":"https://orcid.org/0000-0002-3072-7265"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiaosheng Pan","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0002-3072-7265","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047493121","display_name":"Qiangxian Huang","orcid":"https://orcid.org/0000-0003-0965-5110"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiangxian Huang","raw_affiliation_strings":["School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":"https://orcid.org/0000-0003-0965-5110","affiliations":[{"raw_affiliation_string":"School of Instrument Science and Opto-Electronic Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015424182","display_name":"Kuang\u2013Chao Fan","orcid":"https://orcid.org/0000-0003-1320-9412"},"institutions":[{"id":"https://openalex.org/I27357992","display_name":"Dalian University of Technology","ror":"https://ror.org/023hj5876","country_code":"CN","type":"education","lineage":["https://openalex.org/I27357992"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kuang-Chao Fan","raw_affiliation_strings":["School of Mechanical Engineering, Dalian University of Technology, Dalian, China"],"raw_orcid":"https://orcid.org/0000-0003-1320-9412","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Dalian University of Technology, Dalian, China","institution_ids":["https://openalex.org/I27357992"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2255,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.50555145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":95},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interferometry","display_name":"Interferometry","score":0.7738585472106934},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.5489530563354492},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.456326961517334},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.40568646788597107},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.38029271364212036},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3589380979537964},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16455712914466858},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.07502305507659912}],"concepts":[{"id":"https://openalex.org/C166689943","wikidata":"https://www.wikidata.org/wiki/Q850283","display_name":"Interferometry","level":2,"score":0.7738585472106934},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5489530563354492},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.456326961517334},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.40568646788597107},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.38029271364212036},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3589380979537964},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16455712914466858},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07502305507659912}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3123492","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3123492","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1739824541","display_name":null,"funder_award_id":"51805136","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5261886271","display_name":null,"funder_award_id":"JZ2020HGTB0061","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"},{"id":"https://openalex.org/G6112034629","display_name":null,"funder_award_id":"PA2021KCPY0049","funder_id":"https://openalex.org/F4320335787","funder_display_name":"Fundamental Research Funds for the Central Universities"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335787","display_name":"Fundamental Research Funds for the Central Universities","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W3203327014","https://openalex.org/W6802238707"],"related_works":["https://openalex.org/W2039951365","https://openalex.org/W1990165374","https://openalex.org/W2038419911","https://openalex.org/W2034985391","https://openalex.org/W2046527338","https://openalex.org/W2021069169","https://openalex.org/W2070762245","https://openalex.org/W2260530752","https://openalex.org/W1997390503","https://openalex.org/W1976586760"],"abstract_inverted_index":{"In":[0],"the":[1,13,48],"above":[2],"article":[3],"<xref":[4],"ref-type=\"bibr\"":[5],"rid=\"ref1\"":[6],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7,25],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">[1]</xref>":[8],",":[9],"in":[10,50],"Table":[11,51],"VI,":[12],"unit":[14,49],"of":[15],"\u201cdisplacement\u201d":[16],"should":[17],"be":[18],"corrected":[19],"from":[20],"\u201cmm\u201d":[21],"to":[22,46],"\u201c":[23],"<inline-formula":[24],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[26],"<tex-math":[27],"notation=\"LaTeX\">$\\mu$":[28],"</tex-math></inline-formula>":[29],"m.\u201d":[30],"The":[31],"displacement":[32],"measurement":[33],"experiments":[34],"were":[35],"carried":[36],"out":[37],"on":[38],"a":[39],"600-mm-long":[40],"guide":[41],"rail;":[42],"however,":[43],"we":[44],"forgot":[45],"convert":[47],"VI.":[52]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}