{"id":"https://openalex.org/W3189830618","doi":"https://doi.org/10.1109/tim.2021.3101315","title":"On-Machine Calibration Method for <i>In Situ</i> Stereo Deflectometry System","display_name":"On-Machine Calibration Method for <i>In Situ</i> Stereo Deflectometry System","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3189830618","doi":"https://doi.org/10.1109/tim.2021.3101315","mag":"3189830618"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3101315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3101315","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://pure.hud.ac.uk/ws/files/38995229/TIM_liu_review_submit.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100783718","display_name":"Jiayu Liu","orcid":"https://orcid.org/0000-0003-2250-849X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayu Liu","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-2250-849X","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073798631","display_name":"Mingjun Ren","orcid":"https://orcid.org/0000-0001-8796-5355"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingjun Ren","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8796-5355","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101697250","display_name":"Feng Gao","orcid":"https://orcid.org/0000-0003-3835-6929"},"institutions":[{"id":"https://openalex.org/I133837150","display_name":"University of Huddersfield","ror":"https://ror.org/05t1h8f27","country_code":"GB","type":"education","lineage":["https://openalex.org/I133837150"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Feng Gao","raw_affiliation_strings":["Engineering and Physical Sciences Research Council (EPSRC) Future Metrology Hub, School of Computing and Engineering, University of Huddersfield, Huddersfield, U.K"],"raw_orcid":"https://orcid.org/0000-0003-3835-6929","affiliations":[{"raw_affiliation_string":"Engineering and Physical Sciences Research Council (EPSRC) Future Metrology Hub, School of Computing and Engineering, University of Huddersfield, Huddersfield, U.K","institution_ids":["https://openalex.org/I133837150"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103205239","display_name":"Limin Zhu","orcid":"https://orcid.org/0000-0003-3194-6731"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Limin Zhu","raw_affiliation_strings":["School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-3194-6731","affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2724,"has_fulltext":true,"cited_by_count":6,"citation_normalized_percentile":{"value":0.51580937,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7989972829818726},{"id":"https://openalex.org/keywords/coordinate-measuring-machine","display_name":"Coordinate-measuring machine","score":0.6430874466896057},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5001320838928223},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4855768084526062},{"id":"https://openalex.org/keywords/machine-tool","display_name":"Machine tool","score":0.48323091864585876},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48067936301231384},{"id":"https://openalex.org/keywords/rotation","display_name":"Rotation (mathematics)","score":0.4686816334724426},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.46763065457344055},{"id":"https://openalex.org/keywords/maxima-and-minima","display_name":"Maxima and minima","score":0.45203956961631775},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4433215260505676},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4142153561115265},{"id":"https://openalex.org/keywords/convergence","display_name":"Convergence (economics)","score":0.4137493968009949},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23953953385353088},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23776322603225708},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.15333670377731323},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.14511939883232117}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7989972829818726},{"id":"https://openalex.org/C2777511293","wikidata":"https://www.wikidata.org/wiki/Q1426871","display_name":"Coordinate-measuring machine","level":2,"score":0.6430874466896057},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5001320838928223},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4855768084526062},{"id":"https://openalex.org/C5941749","wikidata":"https://www.wikidata.org/wiki/Q19768","display_name":"Machine tool","level":2,"score":0.48323091864585876},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48067936301231384},{"id":"https://openalex.org/C74050887","wikidata":"https://www.wikidata.org/wiki/Q848368","display_name":"Rotation (mathematics)","level":2,"score":0.4686816334724426},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.46763065457344055},{"id":"https://openalex.org/C186633575","wikidata":"https://www.wikidata.org/wiki/Q845060","display_name":"Maxima and minima","level":2,"score":0.45203956961631775},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4433215260505676},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4142153561115265},{"id":"https://openalex.org/C2777303404","wikidata":"https://www.wikidata.org/wiki/Q759757","display_name":"Convergence (economics)","level":2,"score":0.4137493968009949},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23953953385353088},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23776322603225708},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.15333670377731323},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.14511939883232117},{"id":"https://openalex.org/C50522688","wikidata":"https://www.wikidata.org/wiki/Q189833","display_name":"Economic growth","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2021.3101315","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3101315","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:publications/4d039481-35cd-4761-ba20-69d2a45e603b","is_oa":true,"landing_page_url":"https://pure.hud.ac.uk/en/publications/4d039481-35cd-4761-ba20-69d2a45e603b","pdf_url":"https://pure.hud.ac.uk/ws/files/38995229/TIM_liu_review_submit.pdf","source":{"id":"https://openalex.org/S4306402508","display_name":"Huddersfield Research Portal (University of Huddersfield)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I133837150","host_organization_name":"University of Huddersfield","host_organization_lineage":["https://openalex.org/I133837150"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Liu, J, Ren, M, Gao, F & Zhu, L 2021, 'On-machine Calibration Method for In-situ Stereo Deflectometry System', IEEE Transactions on Instrumentation and Measurement, vol. 70, 9507653. https://doi.org/10.1109/TIM.2021.3101315","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:pure.atira.dk:publications/4d039481-35cd-4761-ba20-69d2a45e603b","is_oa":true,"landing_page_url":"https://pure.hud.ac.uk/en/publications/4d039481-35cd-4761-ba20-69d2a45e603b","pdf_url":"https://pure.hud.ac.uk/ws/files/38995229/TIM_liu_review_submit.pdf","source":{"id":"https://openalex.org/S4306402508","display_name":"Huddersfield Research Portal (University of Huddersfield)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I133837150","host_organization_name":"University of Huddersfield","host_organization_lineage":["https://openalex.org/I133837150"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Liu, J, Ren, M, Gao, F & Zhu, L 2021, 'On-machine Calibration Method for In-situ Stereo Deflectometry System', IEEE Transactions on Instrumentation and Measurement, vol. 70, 9507653. https://doi.org/10.1109/TIM.2021.3101315","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1389858441","display_name":null,"funder_award_id":"EP/P006930/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G227534278","display_name":"A Multiscale Digital Twin-Driven Smart Manufacturing System for High Value-Added Products","funder_award_id":"EP/T024844/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G2575702045","display_name":null,"funder_award_id":"SAST2019-131","funder_id":"https://openalex.org/F4320330207","funder_display_name":"Shanghai Aerospace Science and Technology Innovation Foundation"},{"id":"https://openalex.org/G2669885741","display_name":null,"funder_award_id":"2019YFA0706701","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G4734595127","display_name":null,"funder_award_id":"EP/T024844/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G6137072339","display_name":"Future Advanced Metrology Hub","funder_award_id":"EP/P006930/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G6697783626","display_name":null,"funder_award_id":"91948301","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7819547646","display_name":null,"funder_award_id":"19511106000","funder_id":"https://openalex.org/F4320321885","funder_display_name":"Science and Technology Commission of Shanghai Municipality"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321885","display_name":"Science and Technology Commission of Shanghai Municipality","ror":"https://ror.org/03kt66j61"},{"id":"https://openalex.org/F4320330207","display_name":"Shanghai Aerospace Science and Technology Innovation Foundation","ror":null},{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"},{"id":"https://openalex.org/F4320335577","display_name":"Major Research Plan","ror":null},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W3189830618.pdf"},"referenced_works_count":23,"referenced_works":["https://openalex.org/W1968458984","https://openalex.org/W2009518030","https://openalex.org/W2039489393","https://openalex.org/W2049550935","https://openalex.org/W2050825455","https://openalex.org/W2084061976","https://openalex.org/W2090232542","https://openalex.org/W2092850223","https://openalex.org/W2097426281","https://openalex.org/W2117309207","https://openalex.org/W2118998747","https://openalex.org/W2126646183","https://openalex.org/W2167667767","https://openalex.org/W2181737706","https://openalex.org/W2214370559","https://openalex.org/W2607487046","https://openalex.org/W2625424597","https://openalex.org/W2746793176","https://openalex.org/W2795953499","https://openalex.org/W2884454252","https://openalex.org/W2982278795","https://openalex.org/W3010898044","https://openalex.org/W3033155815"],"related_works":["https://openalex.org/W12050590","https://openalex.org/W7791364","https://openalex.org/W5672329","https://openalex.org/W9820523","https://openalex.org/W4282313","https://openalex.org/W6463351","https://openalex.org/W12473706","https://openalex.org/W8965268","https://openalex.org/W1507576","https://openalex.org/W6326715"],"abstract_inverted_index":{"Deflectometry":[0],"is":[1],"a":[2,26,40,68,90,106,159],"promising":[3],"method":[4,16,72,185,196],"for":[5,81],"thein":[6,82],"situmeasurement":[7],"of":[8,14,50,56,98,135,141,145,155,169,181],"specular":[9],"surfaces.":[10],"However,":[11],"the":[12,20,34,47,51,62,79,96,110,114,122,136,142,146,156,167,174,178,182,207],"accuracy":[13,161],"this":[15,194],"largely":[17,60,165],"depends":[18],"on":[19,95,113],"geometrical":[21],"calibration,":[22],"which":[23,59],"suffers":[24],"from":[25],"low":[27],"convergence":[28,179],"rate":[29],"and":[30,54,103,133,152,186,203],"local":[31],"minima":[32],"during":[33],"optimization.":[35],"Off-machine":[36],"calibration":[37,71,187,195,199,210],"results":[38,191],"in":[39,42,173],"change":[41,55],"geometry":[43],"parameters":[44,76],"due":[45],"to":[46,77,164,206],"repeated":[48],"disassembly":[49],"measurement":[52,63,201],"system":[53],"ambient":[57],"temperature,":[58],"affects":[61],"accuracy.":[64],"This":[65],"article":[66],"presents":[67],"flexible":[69],"on-machine":[70],"with":[73,89,158],"fewer":[74],"intermediate":[75,170],"accelerate":[78],"optimization":[80,184],"situstereo":[83],"deflectometry":[84],"system.":[85],"An":[86],"inclined":[87,128],"mirror":[88,129],"fixed":[91],"angle":[92,154],"was":[93,124,162],"mounted":[94],"spindle":[97,157],"an":[99,127],"ultraprecision":[100,147],"machine":[101,137,148],"tool":[102,149],"used":[104,163],"as":[105],"reference":[107],"plane":[108],"reflecting":[109],"fringe":[111,119],"displayed":[112],"display":[115],"screen.":[116],"The":[117,139,189],"reflected":[118],"captured":[120],"by":[121,126],"cameras":[123],"encoded":[125],"moving":[130],"along":[131,150],"the$C$-axis":[132],"the$Z$-axis":[134,151],"tool.":[138],"preknowledge":[140],"movement":[143],"distance":[144],"rotation":[153],"nanoscale":[160],"reduce":[166],"number":[168],"variables":[171],"involved":[172],"optimization,":[175],"thus":[176],"improving":[177],"speed":[180],"global":[183],"reliability.":[188],"experiment":[190],"show":[192],"that":[193],"has":[197],"higher":[198],"accuracy,":[200,202],"reliability":[204],"compared":[205],"conventional":[208],"off-machine":[209],"method.":[211]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-29T09:40:50.615796","created_date":"2025-10-10T00:00:00"}