{"id":"https://openalex.org/W3186168929","doi":"https://doi.org/10.1109/tim.2021.3100355","title":"Tradeoffs in Time-to-Digital Converter Architectures for Harsh Radiation Environments","display_name":"Tradeoffs in Time-to-Digital Converter Architectures for Harsh Radiation Environments","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3186168929","doi":"https://doi.org/10.1109/tim.2021.3100355","mag":"3186168929"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3100355","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3100355","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://lirias.kuleuven.be/handle/123456789/678271","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010869546","display_name":"Bjorn Van Bockel","orcid":"https://orcid.org/0000-0002-7127-379X"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Bjorn Van Bockel","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit (KU) Leuven, Geel, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit (KU) Leuven, Geel, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016595959","display_name":"Paul Leroux","orcid":"https://orcid.org/0000-0002-1790-2428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Paul Leroux","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit (KU) Leuven, Geel, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit (KU) Leuven, Geel, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102776495","display_name":"Jeffrey Prinzie","orcid":"https://orcid.org/0000-0002-7303-985X"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jeffrey Prinzie","raw_affiliation_strings":["Department of Electrical Engineering, Katholieke Universiteit (KU) Leuven, Geel, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Katholieke Universiteit (KU) Leuven, Geel, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5010869546"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":0.7084,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.69629518,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7544336915016174},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.6537846922874451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5928042531013489},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5595459938049316},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5348860621452332},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5069701671600342},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4850737154483795},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4428616762161255},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35656654834747314},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27681002020835876},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1706758737564087},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11104193329811096}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7544336915016174},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.6537846922874451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5928042531013489},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5595459938049316},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5348860621452332},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5069701671600342},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4850737154483795},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4428616762161255},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35656654834747314},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27681002020835876},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1706758737564087},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11104193329811096},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2021.3100355","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3100355","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/678271","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/123456789/678271","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, vol. 70, Art.No. 2005710","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/678271","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/123456789/678271","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement, vol. 70, Art.No. 2005710","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321730","display_name":"Fonds Wetenschappelijk Onderzoek","ror":"https://ror.org/03qtxy027"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W1108646989","https://openalex.org/W1459014663","https://openalex.org/W1518233821","https://openalex.org/W1527855434","https://openalex.org/W1633453202","https://openalex.org/W1966897032","https://openalex.org/W1974332486","https://openalex.org/W1978745798","https://openalex.org/W2018918975","https://openalex.org/W2027452915","https://openalex.org/W2034135634","https://openalex.org/W2034379167","https://openalex.org/W2084208879","https://openalex.org/W2089557579","https://openalex.org/W2096434843","https://openalex.org/W2099669792","https://openalex.org/W2109935697","https://openalex.org/W2110815580","https://openalex.org/W2125854650","https://openalex.org/W2126265853","https://openalex.org/W2131208029","https://openalex.org/W2134165724","https://openalex.org/W2135441328","https://openalex.org/W2146005144","https://openalex.org/W2149610364","https://openalex.org/W2154691889","https://openalex.org/W2158180061","https://openalex.org/W2158443609","https://openalex.org/W2158998289","https://openalex.org/W2172236250","https://openalex.org/W2260861174","https://openalex.org/W2295467516","https://openalex.org/W2328899558","https://openalex.org/W2525440932","https://openalex.org/W2587070063","https://openalex.org/W2735070893","https://openalex.org/W2750785010","https://openalex.org/W2883065255","https://openalex.org/W2920803560","https://openalex.org/W2921602684","https://openalex.org/W2946577045","https://openalex.org/W2948041281","https://openalex.org/W2969290707","https://openalex.org/W2998623572","https://openalex.org/W3006576388","https://openalex.org/W3009135582","https://openalex.org/W3025458026","https://openalex.org/W3095726480","https://openalex.org/W3098024992","https://openalex.org/W3098779779","https://openalex.org/W4253293802","https://openalex.org/W6631675838","https://openalex.org/W6678422683","https://openalex.org/W6679479922","https://openalex.org/W6733246431"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2796521923","https://openalex.org/W95651076","https://openalex.org/W2471648397","https://openalex.org/W2770163697"],"abstract_inverted_index":{"Performance":[0],"degradation":[1],"of":[2,13,21,33,70,84],"standard":[3],"time-to-digital":[4],"converters":[5],"(TDCs)":[6],"is":[7,35],"inevitable":[8],"due":[9],"to":[10,58,96],"the":[11,19,31,42,68,78,89],"effects":[12,51],"ionizing":[14],"radiation.":[15],"In":[16],"this":[17],"article,":[18],"tradeoffs":[20],"different":[22,71,85],"mitigation":[23],"techniques":[24],"for":[25,37,49,56],"TDC":[26,86],"architectures":[27,45,72],"are":[28,92,100],"presented.":[29,101],"As":[30],"effect":[32],"radiation":[34,50,63,76],"challenging":[36],"such":[38],"high-performance":[39],"circuits":[40],"in":[41,60],"state-of-the-art":[43],"technologies,":[44],"that":[46],"can":[47],"compensate":[48],"have":[52],"become":[53],"a":[54],"necessity":[55],"TDCs":[57],"operate":[59],"these":[61],"harsh":[62],"environments.":[64],"By":[65],"looking":[66],"into":[67],"functionality":[69],"focusing":[73],"on":[74],"improving":[75],"tolerance,":[77],"main":[79],"weak":[80,98],"and":[81],"strong":[82],"points":[83,99],"architectures,":[87],"including":[88],"compensation":[90],"circuitry,":[91],"described.":[93],"Possible":[94],"solutions":[95],"those":[97]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}