{"id":"https://openalex.org/W3188675891","doi":"https://doi.org/10.1109/tim.2021.3097856","title":"A Novel Optical Localization Method for Partial Discharge Source Using ANFIS Virtual Sensors and Simulation Fingerprint in GIL","display_name":"A Novel Optical Localization Method for Partial Discharge Source Using ANFIS Virtual Sensors and Simulation Fingerprint in GIL","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3188675891","doi":"https://doi.org/10.1109/tim.2021.3097856","mag":"3188675891"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3097856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3097856","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078959988","display_name":"Yiming Zang","orcid":"https://orcid.org/0000-0002-1370-8820"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yiming Zang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-1370-8820","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112355557","display_name":"Yong Qian","orcid":"https://orcid.org/0000-0001-6046-7110"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yong Qian","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-6046-7110","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100460687","display_name":"Hui Wang","orcid":"https://orcid.org/0000-0001-7579-6566"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Wang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-7579-6566","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070117791","display_name":"Antian Xu","orcid":"https://orcid.org/0000-0003-2422-4677"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Antian Xu","raw_affiliation_strings":["Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0003-2422-4677","affiliations":[{"raw_affiliation_string":"Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101854837","display_name":"Xiaoli Zhou","orcid":"https://orcid.org/0000-0001-8659-7482"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaoli Zhou","raw_affiliation_strings":["Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-8659-7482","affiliations":[{"raw_affiliation_string":"Department of Light Sources and Illuminating Engineering, Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111959438","display_name":"Gehao Sheng","orcid":"https://orcid.org/0000-0002-9454-5284"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gehao Sheng","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0002-9454-5284","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038426348","display_name":"Xiuchen Jiang","orcid":null},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiuchen Jiang","raw_affiliation_strings":["Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"],"raw_orcid":"https://orcid.org/0000-0001-5439-6942","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4949,"has_fulltext":false,"cited_by_count":38,"citation_normalized_percentile":{"value":0.89996894,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9843000173568726,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9763000011444092,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fingerprint","display_name":"Fingerprint (computing)","score":0.7120554447174072},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.541012167930603},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.4979557991027832},{"id":"https://openalex.org/keywords/fingerprint-recognition","display_name":"Fingerprint recognition","score":0.49409034848213196},{"id":"https://openalex.org/keywords/support-vector-machine","display_name":"Support vector machine","score":0.4803694188594818},{"id":"https://openalex.org/keywords/adaptive-neuro-fuzzy-inference-system","display_name":"Adaptive neuro fuzzy inference system","score":0.4563267230987549},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4356478154659271},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.42398595809936523},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.38431400060653687},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3742404580116272},{"id":"https://openalex.org/keywords/fuzzy-logic","display_name":"Fuzzy logic","score":0.3527829647064209},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29381752014160156},{"id":"https://openalex.org/keywords/fuzzy-control-system","display_name":"Fuzzy control system","score":0.1967962086200714},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10723096132278442}],"concepts":[{"id":"https://openalex.org/C2777826928","wikidata":"https://www.wikidata.org/wiki/Q3745713","display_name":"Fingerprint (computing)","level":2,"score":0.7120554447174072},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.541012167930603},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.4979557991027832},{"id":"https://openalex.org/C168406668","wikidata":"https://www.wikidata.org/wiki/Q178022","display_name":"Fingerprint recognition","level":3,"score":0.49409034848213196},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.4803694188594818},{"id":"https://openalex.org/C186108316","wikidata":"https://www.wikidata.org/wiki/Q352530","display_name":"Adaptive neuro fuzzy inference system","level":4,"score":0.4563267230987549},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4356478154659271},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.42398595809936523},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.38431400060653687},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3742404580116272},{"id":"https://openalex.org/C58166","wikidata":"https://www.wikidata.org/wiki/Q224821","display_name":"Fuzzy logic","level":2,"score":0.3527829647064209},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29381752014160156},{"id":"https://openalex.org/C195975749","wikidata":"https://www.wikidata.org/wiki/Q1475705","display_name":"Fuzzy control system","level":3,"score":0.1967962086200714},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10723096132278442},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3097856","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3097856","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.44999998807907104}],"awards":[{"id":"https://openalex.org/G8373326903","display_name":null,"funder_award_id":"62075045","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1993398610","https://openalex.org/W1996711358","https://openalex.org/W2019207321","https://openalex.org/W2020272411","https://openalex.org/W2037060561","https://openalex.org/W2081478993","https://openalex.org/W2090917713","https://openalex.org/W2114531068","https://openalex.org/W2115511946","https://openalex.org/W2133321814","https://openalex.org/W2172000360","https://openalex.org/W2560499269","https://openalex.org/W2593067946","https://openalex.org/W2754776082","https://openalex.org/W2789995919","https://openalex.org/W2790251926","https://openalex.org/W2804192463","https://openalex.org/W2852207592","https://openalex.org/W2886178433","https://openalex.org/W2899655519","https://openalex.org/W2905491444","https://openalex.org/W2910597635","https://openalex.org/W2911590951","https://openalex.org/W2954676774","https://openalex.org/W2955107775","https://openalex.org/W3033801354","https://openalex.org/W3109296124"],"related_works":["https://openalex.org/W2345184372","https://openalex.org/W3013515612","https://openalex.org/W2136184105","https://openalex.org/W2187500075","https://openalex.org/W2110182821","https://openalex.org/W2997969508","https://openalex.org/W4293863368","https://openalex.org/W2389470892","https://openalex.org/W2157688210","https://openalex.org/W2347839814"],"abstract_inverted_index":{"Partial":[0],"discharge":[1],"(PD)":[2],"detection":[3,71,145,176,184],"and":[4,28,39,57,79,102,182],"localization":[5,42,46,64,96,203,211,244],"is":[6,22,199,217,221],"one":[7,226],"of":[8,84,110,134,147,162,213,243,250],"the":[9,25,33,44,61,108,111,132,144,148,151,160,163,169,175,180,188,195,202,209,214,225,230,241,248],"most":[10],"effective":[11],"methods":[12],"in":[13,124,137,255],"gas-insulated":[14],"transmission":[15],"lines":[16],"(GIL)":[17],"insulation":[18],"fault":[19],"diagnosis,":[20],"which":[21,86,130,220,252],"important":[23],"to":[24,55,76,157,194],"early":[26],"troubleshooting":[27],"safe":[29],"operation.":[30],"Compared":[31],"with":[32,67,187],"widely":[34],"used":[35],"ultrahigh":[36],"frequency":[37],"(UHF)":[38],"acoustic":[40,58],"PD":[41,45,95,122],"methods,":[43],"method":[47,65,97,115,216,238],"based":[48],"on":[49,107],"optical":[50,63,103,121],"signals":[51],"has":[52],"good":[53],"resistance":[54],"electromagnetic":[56],"interference.":[59],"However,":[60],"current":[62],"comes":[66],"several":[68],"shortcomings:":[69],"narrow":[70],"range,":[72],"requiring":[73],"field":[74],"experiments":[75,206],"accumulate":[77],"data,":[78],"installing":[80],"a":[81,94,117],"large":[82],"number":[83],"sensors,":[85],"renders":[87],"low":[88],"feasibility.":[89],"Therefore,":[90],"this":[91,114,141,237],"article":[92,142],"proposes":[93],"utilizing":[98],"virtual":[99,181],"sensors":[100],"(VSs)":[101],"simulation":[104,123,128],"fingerprint.":[105],"Based":[106],"idea":[109],"digital":[112],"twin,":[113],"constructs":[116],"fingerprint":[118,135,177,189],"database":[119],"through":[120,150,168],"an":[125],"equal-sized":[126],"GIL":[127],"model,":[129],"solves":[131],"difficulty":[133],"collection":[136],"actual":[138,164,183],"equipment.":[139],"Meanwhile,":[140],"predicts":[143],"value":[146,254],"VS":[149],"adaptive":[152],"neuro-fuzzy":[153],"inference":[154],"system":[155],"(ANFIS)":[156],"greatly":[158],"reduce":[159],"installation":[161],"sensor":[165],"(AS).":[166],"Finally,":[167],"support":[170],"vector":[171],"machines":[172],"(SVMs)":[173],"algorithm,":[174],"that":[178,236],"includes":[179],"values":[185],"matches":[186],"database.":[190],"The":[191,233],"location":[192],"corresponding":[193],"optimal":[196],"matching":[197],"result":[198],"recorded":[200],"as":[201],"result.":[204],"As":[205],"have":[207],"shown,":[208],"average":[210],"error":[212],"proposed":[215],"19.69":[218],"mm,":[219],"54.8%":[222],"lower":[223],"than":[224],"without":[227],"VSs":[228],"under":[229],"same":[231],"conditions.":[232],"results":[234],"reveal":[235],"compensates":[239],"for":[240],"loss":[242],"accuracy":[245],"caused":[246],"by":[247],"reduction":[249],"ASs,":[251],"embodies":[253],"practice.":[256]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":10},{"year":2023,"cited_by_count":12},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}