{"id":"https://openalex.org/W3186378822","doi":"https://doi.org/10.1109/tim.2021.3097416","title":"Multimode Process Monitoring and Mode Identification Based on Multiple Dictionary Learning","display_name":"Multimode Process Monitoring and Mode Identification Based on Multiple Dictionary Learning","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3186378822","doi":"https://doi.org/10.1109/tim.2021.3097416","mag":"3186378822"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3097416","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3097416","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049939311","display_name":"Keke Huang","orcid":"https://orcid.org/0000-0003-3553-3424"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Keke Huang","raw_affiliation_strings":["School of Automation, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-3553-3424","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ke Wei","orcid":"https://orcid.org/0000-0003-0952-0961"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ke Wei","raw_affiliation_strings":["School of Automation, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-0952-0961","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101471241","display_name":"Longfei Zhou","orcid":"https://orcid.org/0000-0002-0203-3653"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longfei Zhou","raw_affiliation_strings":["School of Automation, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-0203-3653","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100364649","display_name":"Yonggang Li","orcid":"https://orcid.org/0000-0002-6811-3429"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yonggang Li","raw_affiliation_strings":["School of Automation, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0002-6811-3429","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108047088","display_name":"Chunhua Yang","orcid":"https://orcid.org/0000-0003-2550-1509"},"institutions":[{"id":"https://openalex.org/I139660479","display_name":"Central South University","ror":"https://ror.org/00f1zfq44","country_code":"CN","type":"education","lineage":["https://openalex.org/I139660479"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunhua Yang","raw_affiliation_strings":["School of Automation, Central South University, Changsha, China"],"raw_orcid":"https://orcid.org/0000-0003-2550-1509","affiliations":[{"raw_affiliation_string":"School of Automation, Central South University, Changsha, China","institution_ids":["https://openalex.org/I139660479"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139660479"],"apc_list":null,"apc_paid":null,"fwci":2.3008,"has_fulltext":false,"cited_by_count":24,"citation_normalized_percentile":{"value":0.88328681,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10640","display_name":"Spectroscopy and Chemometric Analyses","score":0.9789999723434448,"subfield":{"id":"https://openalex.org/subfields/1602","display_name":"Analytical Chemistry"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9682000279426575,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6705838441848755},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5872451663017273},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5711567997932434},{"id":"https://openalex.org/keywords/k-svd","display_name":"K-SVD","score":0.561987042427063},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5566476583480835},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5245554447174072},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4575272500514984},{"id":"https://openalex.org/keywords/gaussian-process","display_name":"Gaussian process","score":0.44514697790145874},{"id":"https://openalex.org/keywords/gaussian-noise","display_name":"Gaussian noise","score":0.44444185495376587},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42896467447280884},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.4256896376609802},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.41959571838378906},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.4080933928489685},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.39611130952835083},{"id":"https://openalex.org/keywords/gaussian","display_name":"Gaussian","score":0.3685992360115051},{"id":"https://openalex.org/keywords/sparse-approximation","display_name":"Sparse approximation","score":0.29362401366233826},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.0850878357887268}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6705838441848755},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5872451663017273},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5711567997932434},{"id":"https://openalex.org/C154771677","wikidata":"https://www.wikidata.org/wiki/Q17098361","display_name":"K-SVD","level":3,"score":0.561987042427063},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5566476583480835},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5245554447174072},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4575272500514984},{"id":"https://openalex.org/C61326573","wikidata":"https://www.wikidata.org/wiki/Q1496376","display_name":"Gaussian process","level":3,"score":0.44514697790145874},{"id":"https://openalex.org/C4199805","wikidata":"https://www.wikidata.org/wiki/Q2725903","display_name":"Gaussian noise","level":2,"score":0.44444185495376587},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42896467447280884},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.4256896376609802},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.41959571838378906},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.4080933928489685},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.39611130952835083},{"id":"https://openalex.org/C163716315","wikidata":"https://www.wikidata.org/wiki/Q901177","display_name":"Gaussian","level":2,"score":0.3685992360115051},{"id":"https://openalex.org/C124066611","wikidata":"https://www.wikidata.org/wiki/Q28684319","display_name":"Sparse approximation","level":2,"score":0.29362401366233826},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0850878357887268},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3097416","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3097416","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6100000143051147}],"awards":[{"id":"https://openalex.org/G1162581703","display_name":null,"funder_award_id":"2019CX020","funder_id":"https://openalex.org/F4320321514","funder_display_name":"Central South University"},{"id":"https://openalex.org/G1416761122","display_name":null,"funder_award_id":"62073340","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G2193537665","display_name":null,"funder_award_id":"2019YFB1705300","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"},{"id":"https://openalex.org/G721055481","display_name":null,"funder_award_id":"61860206014","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321514","display_name":"Central South University","ror":"https://ror.org/00f1zfq44"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1890834058","https://openalex.org/W1963932623","https://openalex.org/W1966863755","https://openalex.org/W1969158915","https://openalex.org/W1970537494","https://openalex.org/W1994281301","https://openalex.org/W2008686164","https://openalex.org/W2027805700","https://openalex.org/W2029747079","https://openalex.org/W2032768707","https://openalex.org/W2043347135","https://openalex.org/W2049389686","https://openalex.org/W2063823978","https://openalex.org/W2070135905","https://openalex.org/W2084597456","https://openalex.org/W2086962710","https://openalex.org/W2095518865","https://openalex.org/W2112447569","https://openalex.org/W2127271355","https://openalex.org/W2128638419","https://openalex.org/W2134474909","https://openalex.org/W2160547390","https://openalex.org/W2163398148","https://openalex.org/W2172038662","https://openalex.org/W2253401090","https://openalex.org/W2289917018","https://openalex.org/W2296399167","https://openalex.org/W2322097696","https://openalex.org/W2325456755","https://openalex.org/W2415447328","https://openalex.org/W2460778413","https://openalex.org/W2531231238","https://openalex.org/W2588306484","https://openalex.org/W2741385306","https://openalex.org/W2793962535","https://openalex.org/W2902026399","https://openalex.org/W2953139536","https://openalex.org/W3016930809","https://openalex.org/W3033163677","https://openalex.org/W3033620910","https://openalex.org/W3045938091","https://openalex.org/W3094206359","https://openalex.org/W3184724287","https://openalex.org/W6676727762","https://openalex.org/W6678757208"],"related_works":["https://openalex.org/W2601918878","https://openalex.org/W2982240858","https://openalex.org/W2388952560","https://openalex.org/W1971373099","https://openalex.org/W2161305109","https://openalex.org/W4248884112","https://openalex.org/W1970319972","https://openalex.org/W2953254336","https://openalex.org/W2169866437","https://openalex.org/W1964286703"],"abstract_inverted_index":{"In":[0],"modern":[1],"industrial":[2,49,75],"systems,":[3],"the":[4,22,46,53,70,92,109,122,127,133,144,159,188,197,202],"processes":[5],"often":[6],"operate":[7],"under":[8,158],"different":[9,178],"modes.":[10],"Potential":[11],"fault":[12],"diagnosis":[13],"and":[14,25,104,137,167,170,183,190],"mode":[15,128,166],"identification":[16],"are":[17],"extremely":[18],"vital":[19],"to":[20,33,86,115,142],"maintain":[21],"system":[23],"safe":[24],"reliable.":[26],"Recently,":[27],"many":[28,39],"methods":[29],"have":[30],"been":[31],"proposed":[32,114,203],"address":[34],"these":[35,88],"problems":[36,89],"separately.":[37,119],"Moreover,":[38],"of":[40,74,124,180,192,201],"them":[41,157],"make":[42],"an":[43,81],"assumption":[44,58],"that":[45,163],"data":[47,94,169],"from":[48],"site":[50],"only":[51],"contain":[52],"Gaussian":[54,106],"noise.":[55,107],"However,":[56],"this":[57],"is":[59],"not":[60],"held":[61],"in":[62],"practice,":[63],"which":[64,195],"further":[65],"reduces":[66],"their":[67],"performances.":[68],"Considering":[69],"complicated":[71],"noise":[72],"feature":[73],"data,":[76,101],"we":[77,138,155],"came":[78],"up":[79],"with":[80],"improved":[82],"dictionary":[83,110,134,146,161],"learning":[84,111,135,147],"method":[85,112],"settle":[87,143],"simultaneously.":[90],"First,":[91],"measurement":[93],"were":[95],"decomposed":[96],"into":[97,132],"three":[98],"parts:":[99],"clean":[100],"mode-based":[102],"noise,":[103],"dense":[105],"Then,":[108],"was":[113,130],"characterize":[116],"each":[117,164],"part":[118],"Inspired":[120],"by":[121],"framework":[123],"label-consistent":[125],"K-SVD,":[126],"information":[129],"incorporated":[131],"method,":[136,194],"developed":[139],"a":[140],"solution":[141],"multiple":[145],"optimization":[148],"problem.":[149],"Finally,":[150],"when":[151],"new":[152],"samples":[153],"arrive,":[154],"reconstruct":[156],"learned":[160],"so":[162],"sample's":[165],"abnormal":[168],"can":[171],"be":[172],"determined.":[173],"The":[174],"experiments":[175],"on":[176],"two":[177],"types":[179],"simulated":[181],"process":[182,186],"aluminum":[184],"electrolysis":[185],"show":[187],"strength":[189],"reliability":[191],"our":[193],"indicates":[196],"engineering":[198],"application":[199],"value":[200],"method.":[204]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}