{"id":"https://openalex.org/W3176378302","doi":"https://doi.org/10.1109/tim.2021.3092510","title":"FPCB Surface Defect Detection: A Decoupled Two-Stage Object Detection Framework","display_name":"FPCB Surface Defect Detection: A Decoupled Two-Stage Object Detection Framework","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3176378302","doi":"https://doi.org/10.1109/tim.2021.3092510","mag":"3176378302"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3092510","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3092510","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100645909","display_name":"Jiaxiang Luo","orcid":"https://orcid.org/0000-0001-8603-6132"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jiaxiang Luo","raw_affiliation_strings":["School of Automation Science and Engineering and the Engineering Research Center of Ministry of Education for Precision Manufacturing Equipment, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0001-8603-6132","affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering and the Engineering Research Center of Ministry of Education for Precision Manufacturing Equipment, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101875177","display_name":"Zhiyu Yang","orcid":"https://orcid.org/0000-0002-4432-4547"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyu Yang","raw_affiliation_strings":["School of Automation Science and Engineering and the Engineering Research Center of Ministry of Education for Precision Manufacturing Equipment, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-4432-4547","affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering and the Engineering Research Center of Ministry of Education for Precision Manufacturing Equipment, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100321102","display_name":"Shipeng Li","orcid":"https://orcid.org/0000-0002-6030-073X"},"institutions":[{"id":"https://openalex.org/I90610280","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50","country_code":"CN","type":"education","lineage":["https://openalex.org/I90610280"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shipeng Li","raw_affiliation_strings":["School of Automation Science and Engineering and the Engineering Research Center of Ministry of Education for Precision Manufacturing Equipment, South China University of Technology, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-6030-073X","affiliations":[{"raw_affiliation_string":"School of Automation Science and Engineering and the Engineering Research Center of Ministry of Education for Precision Manufacturing Equipment, South China University of Technology, Guangzhou, China","institution_ids":["https://openalex.org/I90610280"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009962102","display_name":"Yilin Wu","orcid":"https://orcid.org/0000-0003-1721-1931"},"institutions":[{"id":"https://openalex.org/I32246829","display_name":"Guangdong University of Education","ror":"https://ror.org/0574der91","country_code":"CN","type":"education","lineage":["https://openalex.org/I32246829"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yilin Wu","raw_affiliation_strings":["Guangdong University of Education, Guangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-1721-1931","affiliations":[{"raw_affiliation_string":"Guangdong University of Education, Guangzhou, China","institution_ids":["https://openalex.org/I32246829"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100645909"],"corresponding_institution_ids":["https://openalex.org/I90610280"],"apc_list":null,"apc_paid":null,"fwci":16.625,"has_fulltext":false,"cited_by_count":153,"citation_normalized_percentile":{"value":0.99274956,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9879000186920166,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6430421471595764},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6234433650970459},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.5979697108268738},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5914084911346436},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5814776420593262},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5675150752067566},{"id":"https://openalex.org/keywords/object-detection","display_name":"Object detection","score":0.5445960760116577},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5019490718841553},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.4959603250026703},{"id":"https://openalex.org/keywords/salient","display_name":"Salient","score":0.46824443340301514},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.44227373600006104},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4311334192752838},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.43103379011154175},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25837093591690063},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08180302381515503}],"concepts":[{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6430421471595764},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6234433650970459},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.5979697108268738},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5914084911346436},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5814776420593262},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5675150752067566},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.5445960760116577},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5019490718841553},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4959603250026703},{"id":"https://openalex.org/C2780719617","wikidata":"https://www.wikidata.org/wiki/Q1030752","display_name":"Salient","level":2,"score":0.46824443340301514},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.44227373600006104},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4311334192752838},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.43103379011154175},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25837093591690063},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08180302381515503},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3092510","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3092510","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5299999713897705}],"awards":[{"id":"https://openalex.org/G3240372628","display_name":null,"funder_award_id":"2019MS140","funder_id":"https://openalex.org/F4320323059","funder_display_name":"South China University of Technology"},{"id":"https://openalex.org/G3816803853","display_name":null,"funder_award_id":"2020A1515011508","funder_id":"https://openalex.org/F4320324202","funder_display_name":"Guangdong Science and Technology Department"}],"funders":[{"id":"https://openalex.org/F4320323059","display_name":"South China University of Technology","ror":"https://ror.org/0530pts50"},{"id":"https://openalex.org/F4320324202","display_name":"Guangdong Science and Technology Department","ror":"https://ror.org/00tjzgn92"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":65,"referenced_works":["https://openalex.org/W7746136","https://openalex.org/W639708223","https://openalex.org/W1536680647","https://openalex.org/W1849277567","https://openalex.org/W2086943348","https://openalex.org/W2088049833","https://openalex.org/W2102605133","https://openalex.org/W2109255472","https://openalex.org/W2194775991","https://openalex.org/W2398534284","https://openalex.org/W2412782625","https://openalex.org/W2565639579","https://openalex.org/W2736973763","https://openalex.org/W2752782242","https://openalex.org/W2790914279","https://openalex.org/W2796347433","https://openalex.org/W2884561390","https://openalex.org/W2884585870","https://openalex.org/W2911631403","https://openalex.org/W2922509574","https://openalex.org/W2939355860","https://openalex.org/W2944303778","https://openalex.org/W2945408271","https://openalex.org/W2950800384","https://openalex.org/W2951933574","https://openalex.org/W2953989358","https://openalex.org/W2955058313","https://openalex.org/W2962721361","https://openalex.org/W2962992847","https://openalex.org/W2963037989","https://openalex.org/W2963091558","https://openalex.org/W2963150697","https://openalex.org/W2963420686","https://openalex.org/W2963843116","https://openalex.org/W2963857746","https://openalex.org/W2964093967","https://openalex.org/W2964241181","https://openalex.org/W2964444661","https://openalex.org/W2979938149","https://openalex.org/W2981689412","https://openalex.org/W2982220924","https://openalex.org/W2982770724","https://openalex.org/W2985228975","https://openalex.org/W3004104873","https://openalex.org/W3034552520","https://openalex.org/W3034713821","https://openalex.org/W3034971973","https://openalex.org/W3035396860","https://openalex.org/W3035694605","https://openalex.org/W3083919065","https://openalex.org/W3106250896","https://openalex.org/W3114104965","https://openalex.org/W3120943932","https://openalex.org/W4252559437","https://openalex.org/W4293584584","https://openalex.org/W4297810817","https://openalex.org/W6600313631","https://openalex.org/W6639204139","https://openalex.org/W6714138976","https://openalex.org/W6750227808","https://openalex.org/W6753038380","https://openalex.org/W6753412334","https://openalex.org/W6764505897","https://openalex.org/W6770600958","https://openalex.org/W6785652829"],"related_works":["https://openalex.org/W2329500892","https://openalex.org/W28991112","https://openalex.org/W2370726991","https://openalex.org/W2369710579","https://openalex.org/W4327728159","https://openalex.org/W4394266730","https://openalex.org/W1990856605","https://openalex.org/W2053783616","https://openalex.org/W2969228573","https://openalex.org/W2963690996"],"abstract_inverted_index":{"In":[0],"the":[1,6,20,54,80,84,114,137,163,165,180],"integrated":[2],"circuit":[3,13],"(IC)":[4],"packaging,":[5],"surface":[7,38,43,146,182],"defect":[8,39,44,115,138,147,155,158,183],"detection":[9,30,40,45,69,148,184],"of":[10,22],"flexible":[11],"printed":[12],"boards":[14],"(FPCBs)":[15],"is":[16,46,77,104,129,142,151],"important":[17],"to":[18,50,94,119,172],"control":[19],"quality":[21],"IC.":[23],"Although":[24],"various":[25],"computer":[26],"vision":[27],"(CV)-based":[28],"object":[29,68],"frameworks":[31],"have":[32],"been":[33],"widely":[34],"used":[35],"in":[36,113,136],"industrial":[37],"scenarios,":[41],"FPCB":[42,145],"still":[47],"challenging":[48],"due":[49],"non-salient":[51,97],"defects":[52,58],"and":[53,83,157,189],"similarities":[55],"between":[56],"diverse":[57],"on":[59,72,162],"FPCBs.":[60],"To":[61],"solve":[62],"this":[63],"problem,":[64],"a":[65,99,107,124,132],"decoupled":[66,88],"two-stage":[67],"framework":[70,167],"based":[71],"convolutional":[73],"neural":[74],"networks":[75],"(CNNs)":[76],"proposed,":[78],"wherein":[79],"localization":[81,116],"task":[82,86],"classification":[85,139],"are":[87],"through":[89],"two":[90],"specific":[91],"modules.":[92],"Specifically,":[93],"effectively":[95],"locate":[96],"defects,":[98,123],"multi-hierarchical":[100],"aggregation":[101],"(MHA)":[102],"block":[103,128],"proposed":[105,166],"as":[106,131],"location":[108,159],"feature":[109],"(LF)":[110],"enhancement":[111,134],"module":[112,135],"task.":[117,140],"Meanwhile,":[118],"accurately":[120],"classify":[121],"similar":[122],"locally":[125],"non-local":[126],"(LNL)":[127],"presented":[130],"SEF":[133],"What":[141],"more,":[143],"an":[144],"dataset":[149,190],"(FPCB-DET)":[150],"built":[152],"with":[153,179],"corresponding":[154],"category":[156],"annotations.":[160],"Evaluated":[161],"FPCB-DET,":[164],"achieves":[168],"state-of-the-art":[169],"(SOTA)":[170],"accuracy":[171],"94.15%":[173],"mean":[174],"average":[175],"precision":[176],"(mAP)":[177],"compared":[178],"existing":[181],"networks.":[185],"Soon,":[186],"source":[187],"code":[188],"will":[191],"be":[192],"available":[193],"at":[194],"https://github.com/SCUTyzy/decoupled-two-stage-framework.":[195]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":36},{"year":2024,"cited_by_count":36},{"year":2023,"cited_by_count":48},{"year":2022,"cited_by_count":24},{"year":2021,"cited_by_count":2}],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-10-10T00:00:00"}