{"id":"https://openalex.org/W3139018523","doi":"https://doi.org/10.1109/tim.2021.3068142","title":"3-D Inspection Method for Industrial Product Assembly Based on Single X-Ray Projections","display_name":"3-D Inspection Method for Industrial Product Assembly Based on Single X-Ray Projections","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3139018523","doi":"https://doi.org/10.1109/tim.2021.3068142","mag":"3139018523"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3068142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3068142","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100362287","display_name":"Xuan Li","orcid":"https://orcid.org/0000-0002-0180-6896"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xuan Li","raw_affiliation_strings":["State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102781106","display_name":"Sukai Wang","orcid":"https://orcid.org/0000-0001-5722-4257"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sukai Wang","raw_affiliation_strings":["State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021641125","display_name":"Ping Chen","orcid":"https://orcid.org/0000-0003-0684-9665"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ping Chen","raw_affiliation_strings":["State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100665083","display_name":"Liming Wang","orcid":"https://orcid.org/0000-0002-3128-2747"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liming Wang","raw_affiliation_strings":["State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory for Electronic Testing Technology, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100362287"],"corresponding_institution_ids":["https://openalex.org/I135714990"],"apc_list":null,"apc_paid":null,"fwci":1.5041,"has_fulltext":false,"cited_by_count":27,"citation_normalized_percentile":{"value":0.80322852,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10522","display_name":"Medical Imaging Techniques and Applications","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2741","display_name":"Radiology, Nuclear Medicine and Imaging"},"field":{"id":"https://openalex.org/fields/27","display_name":"Medicine"},"domain":{"id":"https://openalex.org/domains/4","display_name":"Health Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/projection","display_name":"Projection (relational algebra)","score":0.6606501936912537},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.6234688758850098},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6134341955184937},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5837380290031433},{"id":"https://openalex.org/keywords/fuse","display_name":"Fuse (electrical)","score":0.5565318465232849},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.5293871760368347},{"id":"https://openalex.org/keywords/automated-optical-inspection","display_name":"Automated optical inspection","score":0.5164461135864258},{"id":"https://openalex.org/keywords/digital-radiography","display_name":"Digital radiography","score":0.5036272406578064},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.50234055519104},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.49596723914146423},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.46340107917785645},{"id":"https://openalex.org/keywords/automated-x-ray-inspection","display_name":"Automated X-ray inspection","score":0.45291611552238464},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.4320594072341919},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23526811599731445},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.2251569628715515},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.2014351487159729},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12698063254356384},{"id":"https://openalex.org/keywords/radiography","display_name":"Radiography","score":0.11712020635604858},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.10386180877685547},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1030835509300232}],"concepts":[{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.6606501936912537},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.6234688758850098},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6134341955184937},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5837380290031433},{"id":"https://openalex.org/C141353440","wikidata":"https://www.wikidata.org/wiki/Q182221","display_name":"Fuse (electrical)","level":2,"score":0.5565318465232849},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.5293871760368347},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.5164461135864258},{"id":"https://openalex.org/C2781305912","wikidata":"https://www.wikidata.org/wiki/Q1225030","display_name":"Digital radiography","level":3,"score":0.5036272406578064},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.50234055519104},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.49596723914146423},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.46340107917785645},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.45291611552238464},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.4320594072341919},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23526811599731445},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2251569628715515},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2014351487159729},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12698063254356384},{"id":"https://openalex.org/C36454342","wikidata":"https://www.wikidata.org/wiki/Q245341","display_name":"Radiography","level":2,"score":0.11712020635604858},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.10386180877685547},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1030835509300232},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C126838900","wikidata":"https://www.wikidata.org/wiki/Q77604","display_name":"Radiology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3068142","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3068142","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5,"id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G5315030052","display_name":null,"funder_award_id":"61871351","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":45,"referenced_works":["https://openalex.org/W1676212501","https://openalex.org/W1920022804","https://openalex.org/W1963579838","https://openalex.org/W1972150100","https://openalex.org/W2034974381","https://openalex.org/W2042653706","https://openalex.org/W2071284784","https://openalex.org/W2073498690","https://openalex.org/W2100495367","https://openalex.org/W2108315410","https://openalex.org/W2121570028","https://openalex.org/W2122470914","https://openalex.org/W2129308920","https://openalex.org/W2133665775","https://openalex.org/W2138582281","https://openalex.org/W2140776656","https://openalex.org/W2143900452","https://openalex.org/W2149400409","https://openalex.org/W2165565866","https://openalex.org/W2171740948","https://openalex.org/W2189527060","https://openalex.org/W2194775991","https://openalex.org/W2302255633","https://openalex.org/W2541674938","https://openalex.org/W2560431153","https://openalex.org/W2560722161","https://openalex.org/W2603429625","https://openalex.org/W2744088534","https://openalex.org/W2793419304","https://openalex.org/W2805658037","https://openalex.org/W2902719825","https://openalex.org/W2904417169","https://openalex.org/W2911459672","https://openalex.org/W2951234442","https://openalex.org/W2963410064","https://openalex.org/W2963730200","https://openalex.org/W2969885416","https://openalex.org/W2982067315","https://openalex.org/W4297692481","https://openalex.org/W6637147058","https://openalex.org/W6640300118","https://openalex.org/W6685261749","https://openalex.org/W6698183232","https://openalex.org/W6719936175","https://openalex.org/W6729059855"],"related_works":["https://openalex.org/W1560398276","https://openalex.org/W2912737833","https://openalex.org/W2037785894","https://openalex.org/W2044042350","https://openalex.org/W1979172994","https://openalex.org/W3149631139","https://openalex.org/W571879","https://openalex.org/W2394038673","https://openalex.org/W1908220541","https://openalex.org/W3139018523"],"abstract_inverted_index":{"Industrial":[0],"product":[1,13,87,121,181,186],"assembly":[2,208],"inspection":[3,28,45,97,111,221,225],"is":[4,127,197],"an":[5,110],"indispensable":[6],"part":[7],"of":[8,21,25,60,71,85,99,144,176,193,202],"industrial":[9,120],"production,":[10],"directly":[11],"affecting":[12],"performance":[14],"and":[15,40,64,88,174,227],"reliability.":[16],"Due":[17],"to":[18,129,170,182],"the":[19,26,55,61,69,82,100,105,131,142,145,166,172,177,180,185,194,200,215,220,224,229],"capsulation":[20],"many":[22],"products,":[23],"most":[24],"current":[27],"methods":[29,46,76],"are":[30,50,65,168],"based":[31,47,77,113],"on":[32,48,78,114],"X-ray":[33],"technologies,":[34],"such":[35],"as":[36],"digital":[37],"radiography":[38],"(DR)":[39],"computed":[41],"tomography":[42],"(CT).":[43],"The":[44,74,161,191,210],"DR":[49],"fast":[51],"but":[52,93],"cannot":[53,94],"obtain":[54],"spatial":[56],"distributions":[57],"or":[58],"interrelationships":[59],"assembled":[62,189],"components":[63,178],"easily":[66],"affected":[67],"by":[68,165],"occlusion":[70],"internal":[72],"components.":[73],"detection":[75,91],"CT":[79],"can":[80,218],"reconstruct":[81],"3-D":[83,136,146,162],"volume":[84,147],"a":[86,115,149,154,203],"have":[89],"high":[90],"accuracy":[92],"achieve":[95],"real-time":[96],"because":[98],"reconstruction":[101,117,143],"speed.":[102],"To":[103],"address":[104],"above":[106],"problems,":[107],"we":[108],"propose":[109],"method":[112,196,217],"single-projection":[116],"network":[118,126,167],"for":[119],"assembly.":[122],"An":[123],"improved":[124],"autoencoder":[125],"trained":[128],"learn":[130],"shared":[132],"structural":[133],"features":[134],"in":[135,179],"volumes":[137,163],"from":[138,153,157],"2-D":[139],"projections,":[140],"realizing":[141],"at":[148],"specific":[150],"viewing":[151,159],"angle":[152],"single":[155],"projection":[156],"any":[158],"angle.":[160],"output":[164],"used":[169],"detect":[171],"position":[173],"posture":[175],"judge":[183],"whether":[184],"has":[187],"been":[188],"correctly.":[190],"feasibility":[192],"proposed":[195,216],"verified":[198],"with":[199],"data":[201],"certain":[204],"fuse":[205],"under":[206],"different":[207],"conditions.":[209],"experimental":[211],"results":[212],"show":[213],"that":[214],"improve":[219],"efficiency,":[222],"reduce":[223],"costs,":[226],"simplify":[228],"imaging":[230],"system.":[231]},"counts_by_year":[{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}