{"id":"https://openalex.org/W3132882269","doi":"https://doi.org/10.1109/tim.2021.3060586","title":"A High-Performance, Reconfigurable, Fully Integrated Time-Domain Reflectometry Architecture Using Digital I/Os","display_name":"A High-Performance, Reconfigurable, Fully Integrated Time-Domain Reflectometry Architecture Using Digital I/Os","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3132882269","doi":"https://doi.org/10.1109/tim.2021.3060586","mag":"3132882269"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3060586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060586","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2105.02822","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026897196","display_name":"Zhenyu Xu","orcid":"https://orcid.org/0000-0002-3635-2409"},"institutions":[{"id":"https://openalex.org/I17626003","display_name":"University of Rhode Island","ror":"https://ror.org/013ckk937","country_code":"US","type":"education","lineage":["https://openalex.org/I17626003"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Zhenyu Xu","raw_affiliation_strings":["The University of Rhode Island, Kingston, RI, USA"],"affiliations":[{"raw_affiliation_string":"The University of Rhode Island, Kingston, RI, USA","institution_ids":["https://openalex.org/I17626003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041274252","display_name":"Thomas Mauldin","orcid":"https://orcid.org/0000-0001-7754-2164"},"institutions":[{"id":"https://openalex.org/I17626003","display_name":"University of Rhode Island","ror":"https://ror.org/013ckk937","country_code":"US","type":"education","lineage":["https://openalex.org/I17626003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas Mauldin","raw_affiliation_strings":["The University of Rhode Island, Kingston, RI, USA"],"affiliations":[{"raw_affiliation_string":"The University of Rhode Island, Kingston, RI, USA","institution_ids":["https://openalex.org/I17626003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085071078","display_name":"Zheyi Yao","orcid":"https://orcid.org/0000-0002-5063-9115"},"institutions":[{"id":"https://openalex.org/I17626003","display_name":"University of Rhode Island","ror":"https://ror.org/013ckk937","country_code":"US","type":"education","lineage":["https://openalex.org/I17626003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zheyi Yao","raw_affiliation_strings":["The University of Rhode Island, Kingston, RI, USA"],"affiliations":[{"raw_affiliation_string":"The University of Rhode Island, Kingston, RI, USA","institution_ids":["https://openalex.org/I17626003"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021797382","display_name":"Gerald Hefferman","orcid":"https://orcid.org/0000-0002-5135-3282"},"institutions":[{"id":"https://openalex.org/I1283280774","display_name":"Brigham and Women's Hospital","ror":"https://ror.org/04b6nzv94","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I1283280774","https://openalex.org/I48633490"]},{"id":"https://openalex.org/I17626003","display_name":"University of Rhode Island","ror":"https://ror.org/013ckk937","country_code":"US","type":"education","lineage":["https://openalex.org/I17626003"]},{"id":"https://openalex.org/I136199984","display_name":"Harvard University","ror":"https://ror.org/03vek6s52","country_code":"US","type":"education","lineage":["https://openalex.org/I136199984"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gerald Hefferman","raw_affiliation_strings":["Brigham and Women\u2019s Hospital, Boston, MA, USA","Harvard Medical School, Boston, MA, USA","The University of Rhode Island, Kingston, RI, USA"],"affiliations":[{"raw_affiliation_string":"Brigham and Women\u2019s Hospital, Boston, MA, USA","institution_ids":["https://openalex.org/I1283280774"]},{"raw_affiliation_string":"Harvard Medical School, Boston, MA, USA","institution_ids":["https://openalex.org/I136199984"]},{"raw_affiliation_string":"The University of Rhode Island, Kingston, RI, USA","institution_ids":["https://openalex.org/I17626003"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062578450","display_name":"Tao Wei","orcid":"https://orcid.org/0000-0002-4765-1826"},"institutions":[{"id":"https://openalex.org/I17626003","display_name":"University of Rhode Island","ror":"https://ror.org/013ckk937","country_code":"US","type":"education","lineage":["https://openalex.org/I17626003"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tao Wei","raw_affiliation_strings":["The University of Rhode Island, Kingston, RI, USA"],"affiliations":[{"raw_affiliation_string":"The University of Rhode Island, Kingston, RI, USA","institution_ids":["https://openalex.org/I17626003"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5026897196"],"corresponding_institution_ids":["https://openalex.org/I17626003"],"apc_list":null,"apc_paid":null,"fwci":0.4048,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.59114158,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflectometry","display_name":"Reflectometry","score":0.7161518931388855},{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.6213356256484985},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6115591526031494},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5588459372520447},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5493903756141663},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5047861337661743},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.4894644021987915},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.47832298278808594},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.4667520821094513},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4425089955329895},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4265737533569336},{"id":"https://openalex.org/keywords/time-domain","display_name":"Time domain","score":0.4065975546836853},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39997392892837524},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36718297004699707},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.27502647042274475},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.13539931178092957},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13409164547920227}],"concepts":[{"id":"https://openalex.org/C2778925768","wikidata":"https://www.wikidata.org/wiki/Q3454718","display_name":"Reflectometry","level":3,"score":0.7161518931388855},{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.6213356256484985},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6115591526031494},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5588459372520447},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5493903756141663},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5047861337661743},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.4894644021987915},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.47832298278808594},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.4667520821094513},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4425089955329895},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4265737533569336},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.4065975546836853},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39997392892837524},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36718297004699707},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.27502647042274475},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.13539931178092957},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13409164547920227},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2021.3060586","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060586","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2105.02822","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2105.02822","pdf_url":"https://arxiv.org/pdf/2105.02822","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:digitalcommons.uri.edu:ele_facpubs-2213","is_oa":true,"landing_page_url":"https://digitalcommons.uri.edu/ele_facpubs/1214","pdf_url":null,"source":{"id":"https://openalex.org/S2764761010","display_name":"Journal of Media Literacy Education","issn_l":"2167-8715","issn":["2167-8715"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310316378","host_organization_name":"National Association for Media Literacy Education","host_organization_lineage":["https://openalex.org/P4310316378"],"host_organization_lineage_names":["National Association for Media Literacy Education"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Electrical, Computer, and Biomedical Engineering Faculty Publications","raw_type":"text"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2105.02822","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2105.02822","pdf_url":"https://arxiv.org/pdf/2105.02822","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6065156984","display_name":null,"funder_award_id":"NSF-2027069","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"},{"id":"https://openalex.org/G8095870725","display_name":null,"funder_award_id":"NSF-1439011","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1566916904","https://openalex.org/W1849345470","https://openalex.org/W1876324199","https://openalex.org/W1968226729","https://openalex.org/W2037744170","https://openalex.org/W2069294570","https://openalex.org/W2070666991","https://openalex.org/W2104073917","https://openalex.org/W2105436682","https://openalex.org/W2116772184","https://openalex.org/W2139618226","https://openalex.org/W2162511334","https://openalex.org/W2784222958","https://openalex.org/W2990188114","https://openalex.org/W3027790040","https://openalex.org/W3043791176","https://openalex.org/W4205762935"],"related_works":["https://openalex.org/W3184095098","https://openalex.org/W4247269142","https://openalex.org/W2396133027","https://openalex.org/W2084522216","https://openalex.org/W2169212713","https://openalex.org/W1965835773","https://openalex.org/W1493885512","https://openalex.org/W2021460492","https://openalex.org/W3046000334","https://openalex.org/W2117233788"],"abstract_inverted_index":{"Time-domain":[0],"reflectometry":[1],"(TDR)":[2],"is":[3],"an":[4,83,152,198],"established":[5],"means":[6],"of":[7,11,14,26,93,192,214,224,236],"measuring":[8],"impedance":[9,210],"inhomogeneity":[10,211],"a":[12,78,94,98,107,135,166,178],"variety":[13],"waveguides,":[15],"providing":[16],"critical":[17],"data":[18],"necessary":[19],"to":[20,47,125],"characterize":[21],"and":[22,29,42,54,64,71,87,117,169,207,221,227],"optimize":[23],"the":[24,37,145,193,202,208,215,234,238],"performance":[25],"high-bandwidth":[27],"computational":[28],"communication":[30],"systems.":[31],"However,":[32,120],"TDR":[33,89,95,137,172],"systems":[34],"with":[35,219],"both":[36],"high":[38,111,114],"spatial":[39,220],"resolution":[40,44],"(sub-cm)":[41],"voltage":[43,222],"(sub-\u03bcV)":[45],"required":[46],"evaluate":[48],"high-performance":[49],"waveguides":[50],"are":[51,123],"physically":[52],"large":[53],"often":[55],"cost-prohibitive,":[56],"severely":[57],"limiting":[58,66],"their":[59,67],"utility":[60],"as":[61,201],"testing":[62],"platforms":[63],"greatly":[65],"use":[68],"in":[69,101],"characterizing":[70],"trouble-shooting":[72],"fielded":[73],"hardware.":[74],"Consequently,":[75],"there":[76],"exists":[77],"growing":[79],"technical":[80],"need":[81,146],"for":[82,147,242],"electronically":[84],"simple,":[85],"portable,":[86],"low-cost":[88,128],"technology.":[90],"The":[91],"receiver":[92,108],"system":[96,194],"plays":[97],"key":[99],"role":[100],"recording":[102],"reflection":[103],"waveforms;":[104],"thus,":[105],"such":[106],"must":[109],"have":[110],"analog":[112],"bandwidth,":[113],"sampling":[115],"rate,":[116],"high-voltage":[118],"resolution.":[119],"these":[121],"requirements":[122],"difficult":[124],"meet":[126],"using":[127,185,197,237],"analog-to-digital":[129],"converters":[130],"(ADCs).":[131],"This":[132],"article":[133],"describes":[134],"new":[136],"architecture,":[138],"namely,":[139],"jitter-based":[140],"APC":[141],"(JAPC),":[142],"which":[143],"obviates":[144],"external":[148,187],"components":[149],"based":[150],"on":[151,177],"alternative":[153],"concept,":[154],"analog-to-probability":[155],"conversion":[156],"(APC)":[157],"that":[158,165],"was":[159,195,217],"recently":[160],"proposed.":[161],"These":[162,231],"results":[163,232],"demonstrate":[164,233],"fully":[167],"reconfigurable":[168],"highly":[170],"integrated":[171],"(iTDR)":[173],"can":[174],"be":[175],"implemented":[176],"field-programmable":[179],"gate":[180],"array":[181],"(FPGA)":[182],"chip":[183],"without":[184],"any":[186],"circuit":[188],"components.":[189],"Empirical":[190],"evaluation":[191],"conducted":[196],"HDMI":[199],"cable":[200],"device":[203],"under":[204],"test":[205],"(DUT),":[206],"resulting":[209],"pattern":[212],"(IIP)":[213],"DUT":[216],"extracted":[218],"resolutions":[223],"5":[225],"cm":[226],"80":[228],"\u03bcV,":[229],"respectively.":[230],"feasibility":[235],"prototypical":[239],"JAPC-based":[240],"iTDR":[241],"real-world":[243],"waveguide":[244],"characterization":[245],"applications.":[246]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}