{"id":"https://openalex.org/W3131250167","doi":"https://doi.org/10.1109/tim.2021.3060577","title":"Photoacoustic Substitution Method for Calibrating Subterahertz Attenuation in Free Space","display_name":"Photoacoustic Substitution Method for Calibrating Subterahertz Attenuation in Free Space","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3131250167","doi":"https://doi.org/10.1109/tim.2021.3060577","mag":"3131250167"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3060577","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060577","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082512165","display_name":"Hitoshi Iida","orcid":"https://orcid.org/0000-0003-0055-9253"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Hitoshi Iida","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087379283","display_name":"Moto Kinoshita","orcid":"https://orcid.org/0000-0002-8878-1942"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Moto Kinoshita","raw_affiliation_strings":["National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5082512165"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":0.2005,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.48079011,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11111","display_name":"Spectroscopy and Laser Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1607","display_name":"Spectroscopy"},"field":{"id":"https://openalex.org/fields/16","display_name":"Chemistry"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.8646953105926514},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.8125203847885132},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7167226672172546},{"id":"https://openalex.org/keywords/collimated-light","display_name":"Collimated light","score":0.6579799652099609},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6539168357849121},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.5973941087722778},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.5249305367469788},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.4775872230529785},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3821876049041748},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.37831151485443115},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.131009042263031},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1116107702255249},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0837816596031189}],"concepts":[{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.8646953105926514},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8125203847885132},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7167226672172546},{"id":"https://openalex.org/C34445779","wikidata":"https://www.wikidata.org/wiki/Q1571347","display_name":"Collimated light","level":3,"score":0.6579799652099609},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6539168357849121},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.5973941087722778},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.5249305367469788},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.4775872230529785},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3821876049041748},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.37831151485443115},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.131009042263031},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1116107702255249},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0837816596031189},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3060577","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060577","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6899999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2052929174","display_name":null,"funder_award_id":"JP19K04418","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"},{"id":"https://openalex.org/G913887299","display_name":null,"funder_award_id":"JP18H01457","funder_id":"https://openalex.org/F4320334764","funder_display_name":"Japan Society for the Promotion of Science"}],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W435853682","https://openalex.org/W1967611263","https://openalex.org/W1996902417","https://openalex.org/W2004302911","https://openalex.org/W2013259765","https://openalex.org/W2014009998","https://openalex.org/W2116682875","https://openalex.org/W2118587243","https://openalex.org/W2137368830","https://openalex.org/W2145856761","https://openalex.org/W2339096932","https://openalex.org/W2417962597","https://openalex.org/W2514697488","https://openalex.org/W2562826844","https://openalex.org/W2789705286","https://openalex.org/W2970715077","https://openalex.org/W3086644316","https://openalex.org/W4242004734","https://openalex.org/W4253675283"],"related_works":["https://openalex.org/W2762687161","https://openalex.org/W2353254830","https://openalex.org/W2033952283","https://openalex.org/W2351210568","https://openalex.org/W2028421553","https://openalex.org/W2890072373","https://openalex.org/W2105973023","https://openalex.org/W3000002614","https://openalex.org/W2800192479","https://openalex.org/W3040184894"],"abstract_inverted_index":{"A":[0,75],"terahertz":[1],"(THz)":[2],"attenuation":[3,29,35,43],"calibration":[4,61],"system":[5,25],"is":[6,47,62,83,92,111],"developed":[7],"using":[8,50,94],"a":[9,79],"photoacoustic":[10],"(PA)":[11],"detector":[12],"for":[13,64],"free-space":[14],"beams.":[15],"Based":[16],"on":[17],"the":[18,21,24,27,57,86,108],"principle":[19],"of":[20,100],"PA":[22],"detector,":[23],"measures":[26],"THz":[28],"by":[30],"substituting":[31],"radio":[32],"frequency":[33,38],"(RF)":[34],"with":[36,78],"audio":[37],"(AF)":[39],"attenuation.":[40],"The":[41,60],"AF":[42],"at":[44,72],"1":[45],"kHz":[46],"directly":[48],"calibrated":[49],"an":[51,95],"inductive":[52],"voltage":[53],"divider":[54],"(IVD)":[55],"as":[56,85],"reference":[58],"standard.":[59],"demonstrated":[63],"metalized":[65],"film":[66],"attenuators":[67],"up":[68],"to":[69,113],"20":[70],"dB":[71,116],"0.11":[73],"THz.":[74],"Gunn":[76],"oscillator":[77],"corrugated":[80],"horn":[81],"antenna":[82],"used":[84],"source,":[87],"and":[88,107],"its":[89],"radiated":[90],"beam":[91],"collimated":[93],"off-axis":[96],"parabolic":[97],"mirror.":[98],"Sources":[99],"uncertainties":[101],"are":[102],"also":[103],"discussed":[104],"in":[105],"detail,":[106],"expanded":[109],"uncertainty":[110],"found":[112],"be":[114],"0.40-0.46":[115],"(k":[117],"=":[118],"2).":[119]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}