{"id":"https://openalex.org/W3128673219","doi":"https://doi.org/10.1109/tim.2021.3060575","title":"Design of an Electrostatic Balance Mechanism to Measure Optical Power of 100 kW","display_name":"Design of an Electrostatic Balance Mechanism to Measure Optical Power of 100 kW","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3128673219","doi":"https://doi.org/10.1109/tim.2021.3060575","mag":"3128673219","pmid":"https://pubmed.ncbi.nlm.nih.gov/34815584"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3060575","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060575","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09358228.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref","datacite","pubmed"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09358228.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078625429","display_name":"Lorenz Keck","orcid":"https://orcid.org/0000-0002-2052-1546"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Lorenz Keck","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Gaithersburg, 20899 MD, United States","National Institute of Standards and Technology (NIST); Gaithersburg; MD USA"],"raw_orcid":"https://orcid.org/0000-0002-2052-1546","affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Gaithersburg, 20899 MD, United States","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology (NIST); Gaithersburg; MD USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034530647","display_name":"Gordon A. Shaw","orcid":"https://orcid.org/0000-0002-5881-5443"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Gordon Shaw","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Gaithersburg, 20899 MD, United States","National Institute of Standards and Technology (NIST); Gaithersburg; MD USA"],"raw_orcid":"https://orcid.org/0000-0002-5881-5443","affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Gaithersburg, 20899 MD, United States","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology (NIST); Gaithersburg; MD USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055536978","display_name":"Ren\u00e9 Theska","orcid":"https://orcid.org/0000-0003-0589-8270"},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Rene Theska","raw_affiliation_strings":["Precision Engineering Group, Technische Universit\u00e4t Ilmenau, 98693 Ilmenau, Germany","[Precision Engineering Group, Technische Universit\u00e4t Ilmenau, Ilmenau, Germany]"],"raw_orcid":"https://orcid.org/0000-0003-0589-8270","affiliations":[{"raw_affiliation_string":"Precision Engineering Group, Technische Universit\u00e4t Ilmenau, 98693 Ilmenau, Germany","institution_ids":["https://openalex.org/I119449181"]},{"raw_affiliation_string":"[Precision Engineering Group, Technische Universit\u00e4t Ilmenau, Ilmenau, Germany]","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5073846453","display_name":"Stephan Schlamminger","orcid":"https://orcid.org/0000-0002-9270-4018"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Stephan Schlamminger","raw_affiliation_strings":["National Institute of Standards and Technology (NIST), Gaithersburg, 20899 MD, United States","National Institute of Standards and Technology"],"raw_orcid":"https://orcid.org/0000-0002-9270-4018","affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology (NIST), Gaithersburg, 20899 MD, United States","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.01734838,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hinge","display_name":"Hinge","score":0.6143749952316284},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5468035936355591},{"id":"https://openalex.org/keywords/stiffness","display_name":"Stiffness","score":0.5118876695632935},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.5094702839851379},{"id":"https://openalex.org/keywords/torsion-spring","display_name":"Torsion spring","score":0.4567789137363434},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.44602903723716736},{"id":"https://openalex.org/keywords/parallelogram","display_name":"Parallelogram","score":0.4363248348236084},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.4320816397666931},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.38626188039779663},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36565130949020386},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.3612498939037323},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.3423057198524475},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.33692416548728943},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24628454446792603},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15234971046447754}],"concepts":[{"id":"https://openalex.org/C44000306","wikidata":"https://www.wikidata.org/wiki/Q244330","display_name":"Hinge","level":2,"score":0.6143749952316284},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5468035936355591},{"id":"https://openalex.org/C2779372316","wikidata":"https://www.wikidata.org/wiki/Q569057","display_name":"Stiffness","level":2,"score":0.5118876695632935},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.5094702839851379},{"id":"https://openalex.org/C57614664","wikidata":"https://www.wikidata.org/wiki/Q27037480","display_name":"Torsion spring","level":2,"score":0.4567789137363434},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.44602903723716736},{"id":"https://openalex.org/C53118041","wikidata":"https://www.wikidata.org/wiki/Q45867","display_name":"Parallelogram","level":3,"score":0.4363248348236084},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.4320816397666931},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.38626188039779663},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36565130949020386},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.3612498939037323},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3423057198524475},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33692416548728943},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24628454446792603},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15234971046447754},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0}],"mesh":[],"locations_count":7,"locations":[{"id":"doi:10.1109/tim.2021.3060575","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060575","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09358228.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmid:34815584","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/34815584","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on instrumentation and measurement","raw_type":null},{"id":"pmh:oai:arXiv.org:2102.04556","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2102.04556","pdf_url":"https://arxiv.org/pdf/2102.04556","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:pubmedcentral.nih.gov:8607349","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/8607349","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"},{"id":"pmh:oai:www.db-thueringen.de:dbt_mods_00050962","is_oa":true,"landing_page_url":"https://www.db-thueringen.de/receive/dbt_mods_00050962","pdf_url":null,"source":{"id":"https://openalex.org/S4306400120","display_name":"Common Library Network (Der Gemeinsame Bibliotheksverbund)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210149878","host_organization_name":"Verbundzentrale des GBV","host_organization_lineage":["https://openalex.org/I4210149878"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"doi:10.48550/arxiv.2102.04556","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2102.04556","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":"Preprint"},{"id":"mag:3128673219","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":null,"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"doi:10.1109/tim.2021.3060575","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2021.3060575","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09358228.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.7400000095367432,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320324722","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73"},{"id":"https://openalex.org/F4320332178","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416"},{"id":"https://openalex.org/F4320337576","display_name":"Physical Measurement Laboratory","ror":"https://ror.org/016s8vs02"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3128673219.pdf","grobid_xml":"https://content.openalex.org/works/W3128673219.grobid-xml"},"referenced_works_count":16,"referenced_works":["https://openalex.org/W629783067","https://openalex.org/W644092893","https://openalex.org/W2075991512","https://openalex.org/W2158470202","https://openalex.org/W2491939967","https://openalex.org/W2525912394","https://openalex.org/W2552230542","https://openalex.org/W2584401840","https://openalex.org/W2901902693","https://openalex.org/W2903750548","https://openalex.org/W2910316021","https://openalex.org/W2911628910","https://openalex.org/W2968595518","https://openalex.org/W2973967495","https://openalex.org/W3095410082","https://openalex.org/W4242781634"],"related_works":["https://openalex.org/W3132048457","https://openalex.org/W2492343172","https://openalex.org/W2531761268","https://openalex.org/W2060247642","https://openalex.org/W2133555729","https://openalex.org/W1993701200","https://openalex.org/W2527847028","https://openalex.org/W2550305759","https://openalex.org/W2302053757","https://openalex.org/W2892323791","https://openalex.org/W3025747650","https://openalex.org/W2798173752","https://openalex.org/W2351859665","https://openalex.org/W2966851079","https://openalex.org/W2352551332","https://openalex.org/W3027039716","https://openalex.org/W2061485414","https://openalex.org/W2406454062","https://openalex.org/W2025330782","https://openalex.org/W2143704087"],"abstract_inverted_index":{"A":[0],"new":[1],"instrument":[2],"is":[3,36,86,171,182,207,218],"required":[4],"to":[5,39,51,88,113,117,173,185,196,220],"accommodate":[6],"the":[7,52,90,98,106,109,123,127,144,155,158,169,175,215,229],"need":[8],"for":[9,56],"increased":[10],"portability":[11],"and":[12,22,115],"accuracy":[13],"in":[14,108,122,228],"laser":[15,25,40,231],"power":[16,232],"measurement":[17,95,146],"above":[18],"100":[19],"W.":[20],"Reflection":[21],"absorption":[23],"of":[24,60,126,157,168,204],"light":[26],"provide":[27],"a":[28,57,73,201],"measurable":[29],"force":[30,94,145],"from":[31,97],"photon":[32],"momentum":[33],"exchange":[34],"that":[35,178,214],"directly":[37],"proportional":[38],"power,":[41],"which":[42,181],"can":[43],"be":[44],"measured":[45],"with":[46],"an":[47,151,193],"electrostatic":[48],"balance":[49,99,104],"traceable":[50],"SI.":[53],"We":[54],"aim":[55],"relative":[58],"uncertainty":[59,96,227],"10-3with":[61],"coverage":[62],"factor":[63],"k":[64],"=":[65],"2.":[66],"For":[67],"this":[68,142,205],"purpose,":[69],"we":[70],"have":[71],"designed":[72],"monolithic":[74],"parallelogram":[75],"4-bar":[76,128],"linkage":[77,129],"incorporating":[78],"elastic":[79],"circular":[80],"notch":[81],"flexure":[82,110],"hinges.":[83],"The":[84],"design":[85],"optimized":[87,216],"address":[89],"main":[91],"factors":[92],"driving":[93],"mechanism:":[100],"corner":[101],"loading":[102],"errors,":[103],"stiffness,":[105],"stress":[107],"hinges,":[111],"sensitivity":[112,116],"vibration,":[114],"thermal":[118],"gradients.":[119],"Parasitic":[120],"rotations":[121],"free":[124],"end":[125],"during":[130],"arcuate":[131],"motion":[132],"are":[133,190],"constrained":[134],"by":[135],"machining":[136],"tolerances.":[137],"An":[138],"analytical":[139],"model":[140],"shows":[141],"affects":[143],"less":[147,222],"than":[148,223],"0.01%.":[149],"Incorporating":[150],"inverted":[152],"pendulum":[153],"reduces":[154],"stiffness":[156],"system":[159],"without":[160],"unduly":[161],"increasing":[162],"tilt":[163],"sensitivity.":[164],"Finite":[165],"element":[166],"modeling":[167],"flexures":[170],"used":[172],"determine":[174],"hinge":[176],"orientation":[177],"minimizes":[179],"stress,":[180],"therefore":[183],"expected":[184,219],"minimize":[186,197],"hysteresis.":[187],"Thermal":[188],"effects":[189],"mitigated":[191],"using":[192],"external":[194],"enclosure":[195],"temperature":[198],"gradients":[199],"although":[200],"quantitative":[202],"analysis":[203],"effect":[206],"not":[208],"carried":[209],"out.":[210],"These":[211],"analyses":[212],"show":[213],"mechanism":[217],"contribute":[221],"1":[224],"\u00d7":[225],"10-3relative":[226],"final":[230],"measurement.":[233]},"counts_by_year":[],"updated_date":"2026-08-06T08:24:18.245995","created_date":"2025-10-10T00:00:00"}