{"id":"https://openalex.org/W3131179039","doi":"https://doi.org/10.1109/tim.2021.3058396","title":"Sensitivity to Frequency Uncertainty of the Estimators Provided by the Two-Parameter Sine-Fit Algorithm","display_name":"Sensitivity to Frequency Uncertainty of the Estimators Provided by the Two-Parameter Sine-Fit Algorithm","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3131179039","doi":"https://doi.org/10.1109/tim.2021.3058396","mag":"3131179039"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3058396","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3058396","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006531391","display_name":"Daniel Belega","orcid":"https://orcid.org/0000-0002-4520-9292"},"institutions":[{"id":"https://openalex.org/I3122695212","display_name":"Polytechnic University of Timi\u015foara","ror":"https://ror.org/02v91gy68","country_code":"RO","type":"education","lineage":["https://openalex.org/I3122695212"]}],"countries":["RO"],"is_corresponding":true,"raw_author_name":"Daniel Belega","raw_affiliation_strings":["Department of Measurements and Optical Electronics, Politehnica University Timi\u015foara, Timi\u015foara, Romania"],"affiliations":[{"raw_affiliation_string":"Department of Measurements and Optical Electronics, Politehnica University Timi\u015foara, Timi\u015foara, Romania","institution_ids":["https://openalex.org/I3122695212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064526108","display_name":"Dario Petri","orcid":"https://orcid.org/0000-0002-9739-4469"},"institutions":[{"id":"https://openalex.org/I193223587","display_name":"University of Trento","ror":"https://ror.org/05trd4x28","country_code":"IT","type":"education","lineage":["https://openalex.org/I193223587"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Dario Petri","raw_affiliation_strings":["Department of Industrial Engineering, University of Trento, Trento, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Trento, Trento, Italy","institution_ids":["https://openalex.org/I193223587"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5006531391"],"corresponding_institution_ids":["https://openalex.org/I3122695212"],"apc_list":null,"apc_paid":null,"fwci":0.4011,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.5868901,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10573","display_name":"Power Quality and Harmonics","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9872999787330627,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7923330664634705},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.6378377079963684},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5958614349365234},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.587099552154541},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44351452589035034},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.38028261065483093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2814364433288574},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.24687984585762024},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16032761335372925}],"concepts":[{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7923330664634705},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.6378377079963684},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5958614349365234},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.587099552154541},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44351452589035034},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.38028261065483093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2814364433288574},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.24687984585762024},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16032761335372925},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2021.3058396","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3058396","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:iris.unitn.it:11572/343492","is_oa":false,"landing_page_url":"http://hdl.handle.net/11572/343492","pdf_url":null,"source":{"id":"https://openalex.org/S4306401913","display_name":"Institutional Research Information System (Universit\u00e0 degli Studi di Trento)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I193223587","host_organization_name":"University of Trento","host_organization_lineage":["https://openalex.org/I193223587"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W250076511","https://openalex.org/W625061641","https://openalex.org/W1180448471","https://openalex.org/W1534850694","https://openalex.org/W1940983783","https://openalex.org/W1965392255","https://openalex.org/W1978316722","https://openalex.org/W2032233115","https://openalex.org/W2043007293","https://openalex.org/W2052641708","https://openalex.org/W2058415695","https://openalex.org/W2071534172","https://openalex.org/W2100387516","https://openalex.org/W2111460811","https://openalex.org/W2115300308","https://openalex.org/W2121495791","https://openalex.org/W2147863598","https://openalex.org/W2160502247","https://openalex.org/W2172205044","https://openalex.org/W2228108634","https://openalex.org/W2509760602","https://openalex.org/W2578010358","https://openalex.org/W2618533063","https://openalex.org/W3039989954"],"related_works":["https://openalex.org/W1973573083","https://openalex.org/W2152704622","https://openalex.org/W2060961100","https://openalex.org/W1988224349","https://openalex.org/W2036654869","https://openalex.org/W1984419983","https://openalex.org/W1964781732","https://openalex.org/W2045590034","https://openalex.org/W1999189895","https://openalex.org/W2461219664"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"the":[3,9,17,27,38,48,54,64,67,73,98,106],"contribution":[4],"of":[5,32,40,66,100],"frequency":[6,49,60,94],"error":[7,50],"on":[8,59],"sine-wave":[10,102],"amplitude":[11,68,113],"and":[12,42,69,114],"phase":[13,70,115],"estimators":[14,34,71,95],"returned":[15],"by":[16],"linear":[18,107],"two-parameter":[19],"sine-fit":[20],"(2PSF)":[21],"algorithm":[22,109],"is":[23,51,78,83],"analyzed.":[24],"Expressions":[25],"for":[26],"mean":[28],"square":[29],"errors":[30],"(MSEs)":[31],"both":[33],"are":[35],"derived":[36,55,81],"in":[37],"case":[39],"pure":[41],"noisy":[43],"sine":[44],"waves":[45],"assuming":[46],"that":[47,63],"small.":[52],"From":[53],"expressions":[56],"a":[57],"constraint":[58,82],"uncertainty":[61],"ensuring":[62],"MSEs":[65],"reach":[72],"corresponding":[74],"Cram\u00e9r-Rao":[75],"Lower":[76],"Bounds":[77],"determined.":[79],"The":[80],"applied":[84],"to":[85,96],"two":[86],"different":[87],"state-of-the-art":[88],"Interpolated":[89],"Discrete":[90],"Fourier":[91],"Transform":[92],"(IpDFT)":[93],"determine":[97],"number":[99],"observed":[101],"cycles":[103],"above":[104],"which":[105],"2PSF":[108],"provides":[110],"statistical":[111],"efficient":[112],"estimates.":[116]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}