{"id":"https://openalex.org/W3127355574","doi":"https://doi.org/10.1109/tim.2021.3055810","title":"Measurement of the Effective Efficiency of Thermoelectric Power Sensors Using a Thermal Voltage Converter From 1 kHz to 1 MHz","display_name":"Measurement of the Effective Efficiency of Thermoelectric Power Sensors Using a Thermal Voltage Converter From 1 kHz to 1 MHz","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3127355574","doi":"https://doi.org/10.1109/tim.2021.3055810","mag":"3127355574"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3055810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3055810","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5033332663","display_name":"Tae\u2010Weon Kang","orcid":"https://orcid.org/0000-0002-7457-6585"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tae-Weon Kang","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-7457-6585","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102879355","display_name":"Jeong\u2010Il Park","orcid":"https://orcid.org/0000-0003-0911-1594"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeong-Il Park","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-0911-1594","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064983376","display_name":"Chihyun Cho","orcid":"https://orcid.org/0000-0003-2506-576X"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Chihyun Cho","raw_affiliation_strings":["Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0003-2506-576X","affiliations":[{"raw_affiliation_string":"Electromagnetic Wave Metrology Group, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039610271","display_name":"No-Weon Kang","orcid":"https://orcid.org/0000-0002-0492-5831"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"No-Weon Kang","raw_affiliation_strings":["Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-0492-5831","affiliations":[{"raw_affiliation_string":"Division of Physical Metrology, Korea Research Institute of Standards and Science, Daejeon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2034,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.48663068,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.6903570890426636},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.64835524559021},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"Uncertainty analysis","score":0.5780697464942932},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5470420718193054},{"id":"https://openalex.org/keywords/rf-power-amplifier","display_name":"RF power amplifier","score":0.5203494429588318},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.45930325984954834},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45054376125335693},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.44353923201560974},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4262131452560425},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39789456129074097},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.352273166179657},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2634722590446472},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.24781140685081482},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1673637330532074},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.08014458417892456},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07213518023490906}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.6903570890426636},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.64835524559021},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.5780697464942932},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5470420718193054},{"id":"https://openalex.org/C196054291","wikidata":"https://www.wikidata.org/wiki/Q7276624","display_name":"RF power amplifier","level":4,"score":0.5203494429588318},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.45930325984954834},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45054376125335693},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.44353923201560974},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4262131452560425},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39789456129074097},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.352273166179657},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2634722590446472},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.24781140685081482},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1673637330532074},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.08014458417892456},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07213518023490906},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3055810","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3055810","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8500000238418579,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G1293311204","display_name":null,"funder_award_id":"KRISS-2021-GP2021-0002","funder_id":"https://openalex.org/F4320322103","funder_display_name":"Korea Research Institute of Standards and Science"}],"funders":[{"id":"https://openalex.org/F4320322103","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1490773500","https://openalex.org/W1522319254","https://openalex.org/W1588079666","https://openalex.org/W1991698782","https://openalex.org/W2004788724","https://openalex.org/W2019153209","https://openalex.org/W2043129347","https://openalex.org/W2049474623","https://openalex.org/W2071690532","https://openalex.org/W2085767250","https://openalex.org/W2093151983","https://openalex.org/W2120345591","https://openalex.org/W2130374136","https://openalex.org/W2130956556","https://openalex.org/W2156947441","https://openalex.org/W2758489754","https://openalex.org/W2900373830","https://openalex.org/W3012056495","https://openalex.org/W3086741195","https://openalex.org/W7070767854"],"related_works":["https://openalex.org/W4312671192","https://openalex.org/W2387053421","https://openalex.org/W3209221379","https://openalex.org/W4205181462","https://openalex.org/W1980751682","https://openalex.org/W2156294920","https://openalex.org/W3139964550","https://openalex.org/W2376953431","https://openalex.org/W3193712762","https://openalex.org/W2949799777"],"abstract_inverted_index":{"Frequency":[0],"extension":[1],"of":[2,25,54,63,69,89,128,136,138,148,156,186,192],"the":[3,22,50,55,60,64,80,87,90,100,113,123,126,134,153,163,171,183,199],"RF":[4,61,75,81,84,101,172],"power":[5,28,53,76],"standard":[6,74],"using":[7],"a":[8,26,31,35,105,167,174,189],"thermal":[9],"voltage":[10,62,85],"converter":[11],"(TVC)":[12],"has":[13],"been":[14],"accomplished":[15],"down":[16],"to":[17,47,98,125,159],"1":[18,157,160],"kHz.":[19],"To":[20],"measure":[21,49,99],"effective":[23],"efficiency":[24],"thermoelectric":[27],"sensor":[29],"(PS),":[30],"reference":[32,65],"TVC":[33,42,66],"with":[34,198],"built-in":[36],"tee":[37],"is":[38,77,96,140,178],"employed.":[39,179],"A":[40,92],"modified":[41],"measurement":[43,107,164,184],"system":[44],"enables":[45],"us":[46],"automatically":[48],"dc":[51,71],"substituted":[52],"PS":[56],"as":[57,59],"well":[58],"in":[67,130,152],"terms":[68],"RF-":[70],"difference.":[72],"The":[73,118],"obtained":[78],"from":[79,122],"conductance":[82],"and":[83,112],"at":[86,188],"input":[88,169],"PS.":[91],"vector":[93],"network":[94],"analyzer":[95],"used":[97],"conductance,":[102,173],"which":[103,194],"causes":[104],"significant":[106],"uncertainty.":[108],"Associated":[109],"theoretical":[110],"consideration":[111],"uncertainty":[114,120,139,185],"analysis":[115],"are":[116],"included.":[117],"expanded":[119],"evaluated":[121],"Guide":[124],"Expression":[127],"Uncertainty":[129],"Measurement":[131],"(GUM),":[132],"i.e.,":[133],"law":[135],"propagation":[137],"1.5%":[141],"($k":[142],"=":[143],"1.84$":[144],",":[145],"95%":[146,190],"level":[147,191],"confidence,":[149,193],"trapezoidal":[150],"distribution)":[151],"frequency":[154],"range":[155],"kHz":[158],"MHz.":[161],"Because":[162],"model":[165],"includes":[166],"nonlinear":[168],"quantity,":[170],"Monte":[175],"Carlo":[176],"method":[177],"Simulated":[180],"results":[181],"give":[182],"1.6%":[187],"show":[195],"good":[196],"agreement":[197],"GUM.":[200]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}