{"id":"https://openalex.org/W3124459155","doi":"https://doi.org/10.1109/tim.2021.3053987","title":"An End-to-End Defect Detection Method for Mobile Phone Light Guide Plate via Multitask Learning","display_name":"An End-to-End Defect Detection Method for Mobile Phone Light Guide Plate via Multitask Learning","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3124459155","doi":"https://doi.org/10.1109/tim.2021.3053987","mag":"3124459155"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3053987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3053987","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100623667","display_name":"Yue Li","orcid":"https://orcid.org/0000-0003-4793-9528"},"institutions":[{"id":"https://openalex.org/I1328775524","display_name":"Zhejiang Sci-Tech University","ror":"https://ror.org/03893we55","country_code":"CN","type":"education","lineage":["https://openalex.org/I1328775524"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yue Li","raw_affiliation_strings":["School of Faculty of Mechanical Engineering and Automation, Zhejiang Sci-Tech University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0003-4793-9528","affiliations":[{"raw_affiliation_string":"School of Faculty of Mechanical Engineering and Automation, Zhejiang Sci-Tech University, Hangzhou, China","institution_ids":["https://openalex.org/I1328775524"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101930547","display_name":"Junfeng Li","orcid":"https://orcid.org/0000-0002-1207-3317"},"institutions":[{"id":"https://openalex.org/I1328775524","display_name":"Zhejiang Sci-Tech University","ror":"https://ror.org/03893we55","country_code":"CN","type":"education","lineage":["https://openalex.org/I1328775524"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junfeng Li","raw_affiliation_strings":["School of Faculty of Mechanical Engineering and Automation, Zhejiang Sci-Tech University, Hangzhou, China"],"raw_orcid":"https://orcid.org/0000-0002-1207-3317","affiliations":[{"raw_affiliation_string":"School of Faculty of Mechanical Engineering and Automation, Zhejiang Sci-Tech University, Hangzhou, China","institution_ids":["https://openalex.org/I1328775524"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1328775524"],"apc_list":null,"apc_paid":null,"fwci":4.8097,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.9531555,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"13"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.979200005531311,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.746978223323822},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7044453620910645},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5881443023681641},{"id":"https://openalex.org/keywords/mobile-phone","display_name":"Mobile phone","score":0.5847700238227844},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5581696629524231},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.5512524247169495},{"id":"https://openalex.org/keywords/encoder","display_name":"Encoder","score":0.5219330787658691},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.4984157085418701},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4914802312850952},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.4456093907356262}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.746978223323822},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7044453620910645},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5881443023681641},{"id":"https://openalex.org/C2777421447","wikidata":"https://www.wikidata.org/wiki/Q17517","display_name":"Mobile phone","level":2,"score":0.5847700238227844},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5581696629524231},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.5512524247169495},{"id":"https://openalex.org/C118505674","wikidata":"https://www.wikidata.org/wiki/Q42586063","display_name":"Encoder","level":2,"score":0.5219330787658691},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.4984157085418701},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4914802312850952},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.4456093907356262},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2021.3053987","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3053987","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.46000000834465027}],"awards":[{"id":"https://openalex.org/G8718015563","display_name":null,"funder_award_id":"61374022","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":41,"referenced_works":["https://openalex.org/W1522301498","https://openalex.org/W1901129140","https://openalex.org/W1981759979","https://openalex.org/W2194775991","https://openalex.org/W2419448466","https://openalex.org/W2531409750","https://openalex.org/W2612445135","https://openalex.org/W2749684264","https://openalex.org/W2768955070","https://openalex.org/W2772386856","https://openalex.org/W2794550100","https://openalex.org/W2800240267","https://openalex.org/W2805484002","https://openalex.org/W2825063406","https://openalex.org/W2884195426","https://openalex.org/W2890747436","https://openalex.org/W2913074553","https://openalex.org/W2921598903","https://openalex.org/W2923486253","https://openalex.org/W2944303778","https://openalex.org/W2944794228","https://openalex.org/W2960155470","https://openalex.org/W2963037463","https://openalex.org/W2964121744","https://openalex.org/W2967610771","https://openalex.org/W2988072185","https://openalex.org/W3014641072","https://openalex.org/W3022419825","https://openalex.org/W3035414587","https://openalex.org/W3104156061","https://openalex.org/W4293406525","https://openalex.org/W4293584584","https://openalex.org/W4297775537","https://openalex.org/W6631190155","https://openalex.org/W6639824700","https://openalex.org/W6687483927","https://openalex.org/W6717372056","https://openalex.org/W6737664043","https://openalex.org/W6750227808","https://openalex.org/W6766029800","https://openalex.org/W6767071366"],"related_works":["https://openalex.org/W4375867731","https://openalex.org/W4390516098","https://openalex.org/W2181948922","https://openalex.org/W2384362569","https://openalex.org/W2142795561","https://openalex.org/W4205302943","https://openalex.org/W2561132942","https://openalex.org/W2611989081","https://openalex.org/W3155418658","https://openalex.org/W4243199227"],"abstract_inverted_index":{"Automatic":[0],"vision-based":[1],"defect":[2,22,40,98,115,145],"detection":[3,41,146],"on":[4,153,160,171,191],"the":[5,17,21,24,39,49,53,73,86,93,104,112,118,122,126,129,137,144,154,161,172,189,192,204,207],"mobile":[6,43,140,155,173],"light":[7],"guide":[8],"plate":[9],"(LGP)":[10],"is":[11,46,57,89,132],"a":[12,63,165],"challenging":[13],"task":[14],"due":[15],"to":[16,68,80,91,134],"low":[18],"contrast":[19],"between":[20],"and":[23,28,72,121,164,178,199],"background,":[25],"uneven":[26],"brightness,":[27],"complex":[29],"gradient":[30],"texture.":[31],"An":[32],"end-to-end":[33],"multitask":[34,54],"learning":[35,55],"network":[36,56],"architecture":[37],"for":[38,111],"of":[42,52,96,114,125,139,167,206],"phone":[44,141,156,174],"LGP":[45,157,175],"proposed.":[47],"First,":[48],"main":[50],"structure":[51,67],"designed.":[58],"The":[59,184],"encoder":[60,66],"part":[61,76],"uses":[62],"similar":[64],"U-Net":[65],"obtain":[69],"multiscale":[70,83,105,119],"features,":[71],"feature":[74,78,106],"fusion":[75,79],"adopts":[77],"interact":[81],"with":[82],"features.":[84],"Second,":[85],"segmentation":[87,127],"head":[88,131],"designed":[90,133],"complete":[92],"precise":[94],"location":[95],"each":[97],"in":[99,210],"an":[100],"image":[101],"by":[102],"using":[103],"fusion,":[107],"which":[108,202],"prepares":[109],"it":[110],"quantification":[113],"characteristics.":[116],"Combining":[117],"features":[120],"output":[123],"mask":[124],"head,":[128],"classification":[130],"accurately":[135],"detect":[136],"defects":[138],"LGP.":[142],"Finally,":[143],"data":[147,176,181,194],"set":[148,177,182],"has":[149],"been":[150],"constructed":[151],"based":[152],"images":[158],"collected":[159],"industrial":[162],"site,":[163],"lot":[166],"experiments":[168],"are":[169],"performed":[170],"Kolektor":[179],"surface-defect":[180],"(KolektorSDD).":[183],"experimental":[185],"results":[186],"show":[187],"that":[188],"F1-score":[190],"two":[193],"sets":[195],"can":[196],"reach":[197],"99.67%":[198],"96.77%,":[200],"respectively,":[201],"verifies":[203],"effectiveness":[205],"method":[208],"proposed":[209],"this":[211],"article.":[212]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":14},{"year":2021,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}