{"id":"https://openalex.org/W3123522893","doi":"https://doi.org/10.1109/tim.2021.3053974","title":"Comparison of Low DC Current Traceability Methods and Gas Capacitors AC\u2013DC Dependence","display_name":"Comparison of Low DC Current Traceability Methods and Gas Capacitors AC\u2013DC Dependence","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3123522893","doi":"https://doi.org/10.1109/tim.2021.3053974","mag":"3123522893"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2021.3053974","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3053974","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/11696/72976","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086308147","display_name":"Luca Callegaro","orcid":"https://orcid.org/0000-0001-5997-9960"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Luca Callegaro","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0001-5997-9960","affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004871537","display_name":"Cristina Cassiago","orcid":"https://orcid.org/0000-0001-7153-4569"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Cristina Cassiago","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0001-7153-4569","affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062193640","display_name":"Vincenzo D\u2019Elia","orcid":"https://orcid.org/0000-0001-6924-0430"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Vincenzo D'Elia","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0001-6924-0430","affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029875866","display_name":"E. Gasparotto","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Gasparotto","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0002-0192-303X","affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004211644","display_name":"Emanuele Enrico","orcid":"https://orcid.org/0000-0002-2125-5200"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Emanuele Enrico","raw_affiliation_strings":["Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy"],"raw_orcid":"https://orcid.org/0000-0002-2125-5200","affiliations":[{"raw_affiliation_string":"Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101972192","display_name":"Martin G\u00f6tz","orcid":"https://orcid.org/0000-0002-9281-6626"},"institutions":[{"id":"https://openalex.org/I1285933455","display_name":"Physikalisch-Technische Bundesanstalt","ror":"https://ror.org/05r3f7h03","country_code":"DE","type":"government","lineage":["https://openalex.org/I1285933455","https://openalex.org/I4210136623"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Gotz","raw_affiliation_strings":["Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany"],"raw_orcid":"https://orcid.org/0000-0002-9281-6626","affiliations":[{"raw_affiliation_string":"Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany","institution_ids":["https://openalex.org/I1285933455"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5086308147"],"corresponding_institution_ids":["https://openalex.org/I4210136559"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.0062617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.8244028687477112},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7245498895645142},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.5966528058052063},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5569030046463013},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4861299991607666},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.4616616368293762},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.45096686482429504},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44880348443984985},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.4405778646469116},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.305875301361084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.268873929977417},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.26371753215789795},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21674472093582153},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.13596513867378235},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.11133918166160583},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.0825202465057373},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.07450121641159058}],"concepts":[{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.8244028687477112},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7245498895645142},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.5966528058052063},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5569030046463013},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4861299991607666},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.4616616368293762},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.45096686482429504},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44880348443984985},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.4405778646469116},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.305875301361084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.268873929977417},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.26371753215789795},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21674472093582153},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.13596513867378235},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.11133918166160583},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0825202465057373},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.07450121641159058},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C43617362","wikidata":"https://www.wikidata.org/wiki/Q170050","display_name":"Chromatography","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2021.3053974","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2021.3053974","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:iris.inrim.it:11696/72976","is_oa":true,"landing_page_url":"http://hdl.handle.net/11696/72976","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:iris.inrim.it:11696/72976","is_oa":true,"landing_page_url":"http://hdl.handle.net/11696/72976","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W352914456","https://openalex.org/W1556177135","https://openalex.org/W1646685143","https://openalex.org/W1681823979","https://openalex.org/W1967042209","https://openalex.org/W1969865952","https://openalex.org/W2005679782","https://openalex.org/W2008823736","https://openalex.org/W2026239514","https://openalex.org/W2027722045","https://openalex.org/W2031440703","https://openalex.org/W2034640938","https://openalex.org/W2034870529","https://openalex.org/W2044127202","https://openalex.org/W2064076925","https://openalex.org/W2092652750","https://openalex.org/W2101211489","https://openalex.org/W2105522406","https://openalex.org/W2119332195","https://openalex.org/W2122226759","https://openalex.org/W2139271542","https://openalex.org/W2151709370","https://openalex.org/W2159168525","https://openalex.org/W2159196747","https://openalex.org/W2163337274","https://openalex.org/W2168409019","https://openalex.org/W2525247362","https://openalex.org/W2525912394","https://openalex.org/W2584401840","https://openalex.org/W2588707328","https://openalex.org/W2803129328","https://openalex.org/W2899264187","https://openalex.org/W2911533788","https://openalex.org/W2989459258","https://openalex.org/W3025582554","https://openalex.org/W3086507497","https://openalex.org/W3099345868","https://openalex.org/W3100399333"],"related_works":["https://openalex.org/W2378709054","https://openalex.org/W2077453531","https://openalex.org/W3209492875","https://openalex.org/W2011011149","https://openalex.org/W4381747133","https://openalex.org/W3212531278","https://openalex.org/W2099626417","https://openalex.org/W2019514496","https://openalex.org/W3129126528","https://openalex.org/W2354552488"],"abstract_inverted_index":{"This":[0],"article":[1],"compares":[2],"two":[3,58],"instruments":[4,31],"for":[5],"the":[6,20,45,57,62,74,78,82],"traceable":[7],"measurement":[8],"of":[9,73,77],"dc":[10],"low":[11],"currents,":[12],"a":[13,25],"custom":[14],"capacitance-":[15],"voltage":[16],"(C-V)":[17],"source":[18],"and":[19],"ultrastable":[21],"low-current":[22],"amplifier":[23],"(ULCA),":[24],"commercial":[26],"precision":[27],"transresistance":[28],"amplifier.":[29],"The":[30,38],"are":[32,68],"calibrated":[33],"through":[34],"independent":[35],"traceability":[36],"routes.":[37],"comparison":[39],"base":[40],"relative":[41],"accuracy":[42],"is":[43],"in":[44,61,81,94],"10":[46,63],"<sup":[47,51,64],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[48,52,65],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-6</sup>":[49],"-10":[50],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">-5</sup>":[53,66],"range.":[54],"Differences":[55],"between":[56],"instrument":[59],"readings,":[60],"range,":[67],"interpreted":[69],"as":[70],"an":[71],"effect":[72],"frequency":[75,86],"dependence":[76,87],"capacitor":[79],"employed":[80],"C-V":[83],"source.":[84],"Such":[85],"can":[88],"also":[89],"affect":[90],"primary":[91],"metrology":[92],"experiments":[93],"other":[95],"fields.":[96]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}