{"id":"https://openalex.org/W3120277478","doi":"https://doi.org/10.1109/tim.2020.3048517","title":"Validating an Isolator to eliminate grounding issues for high-resolution digitizer measurements","display_name":"Validating an Isolator to eliminate grounding issues for high-resolution digitizer measurements","publication_year":2021,"publication_date":"2021-01-01","ids":{"openalex":"https://openalex.org/W3120277478","doi":"https://doi.org/10.1109/tim.2020.3048517","mag":"3120277478"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3048517","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2020.3048517","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09316991.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09316991.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088543176","display_name":"Peter Davis","orcid":"https://orcid.org/0000-0002-4751-9200"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"P.N. Davis","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington TW11 0LW, U"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington TW11 0LW, U","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079541661","display_name":"Paul Wright","orcid":"https://orcid.org/0000-0003-3831-3216"},"institutions":[{"id":"https://openalex.org/I134421475","display_name":"National Physical Laboratory","ror":"https://ror.org/015w2mp89","country_code":"GB","type":"facility","lineage":["https://openalex.org/I134421475"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"P.S. Wright","raw_affiliation_strings":["National Physical Laboratory, Teddington, U.K","National Physical Laboratory, Teddington TW11 0LW, U"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Physical Laboratory, Teddington, U.K","institution_ids":["https://openalex.org/I134421475"]},{"raw_affiliation_string":"National Physical Laboratory, Teddington TW11 0LW, U","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5088543176"],"corresponding_institution_ids":["https://openalex.org/I134421475"],"apc_list":null,"apc_paid":null,"fwci":0.1598,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48272534,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/isolator","display_name":"Isolator","score":0.8992310762405396},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.6713285446166992},{"id":"https://openalex.org/keywords/ground","display_name":"Ground","score":0.6596828699111938},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5466904044151306},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.45050692558288574},{"id":"https://openalex.org/keywords/crosstalk","display_name":"Crosstalk","score":0.42697271704673767},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41790398955345154},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3542135953903198},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.32584500312805176},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1671190857887268}],"concepts":[{"id":"https://openalex.org/C54888747","wikidata":"https://www.wikidata.org/wiki/Q962002","display_name":"Isolator","level":2,"score":0.8992310762405396},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.6713285446166992},{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.6596828699111938},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5466904044151306},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.45050692558288574},{"id":"https://openalex.org/C169822122","wikidata":"https://www.wikidata.org/wiki/Q230187","display_name":"Crosstalk","level":2,"score":0.42697271704673767},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41790398955345154},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3542135953903198},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.32584500312805176},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1671190857887268}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2020.3048517","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2020.3048517","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09316991.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2020.3048517","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2020.3048517","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09316991.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G8326501139","display_name":null,"funder_award_id":"17NRM02","funder_id":"https://openalex.org/F4320338394","funder_display_name":"European Metrology Programme for Innovation and Research"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320338394","display_name":"European Metrology Programme for Innovation and Research","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3120277478.pdf","grobid_xml":"https://content.openalex.org/works/W3120277478.grobid-xml"},"referenced_works_count":10,"referenced_works":["https://openalex.org/W1503384635","https://openalex.org/W1974458804","https://openalex.org/W1999349800","https://openalex.org/W2153551766","https://openalex.org/W2175305999","https://openalex.org/W2176013116","https://openalex.org/W2972623281","https://openalex.org/W2980817529","https://openalex.org/W3048239127","https://openalex.org/W3086289731"],"related_works":["https://openalex.org/W2384049289","https://openalex.org/W2032687465","https://openalex.org/W2388050456","https://openalex.org/W4387060266","https://openalex.org/W1970906042","https://openalex.org/W2378872781","https://openalex.org/W2369885687","https://openalex.org/W2365368514","https://openalex.org/W2338063584","https://openalex.org/W2355844879"],"abstract_inverted_index":{"This":[0],"article":[1],"describes":[2],"a":[3,11,29,42,46],"method":[4,47],"of":[5,72],"isolating":[6],"high-resolution":[7],"digitizers":[8,19],"that":[9],"have":[10],"common":[12,35],"ground":[13],"between":[14,62],"channels.":[15,63],"Isolation":[16],"enables":[17],"the":[18,34,51,57,70,73],"to":[20,24,48],"be":[21],"used":[22,40],"simultaneously":[23],"measure":[25],"multiple":[26],"points":[27],"in":[28,41,59],"circuit":[30],"without":[31],"short-circuiting":[32],"via":[33],"ground.":[36],"The":[37],"isolators,":[38],"when":[39,55],"switch":[43],"formation,":[44],"provide":[45],"cancel":[49],"out":[50],"phase":[52,60],"angle":[53],"errors":[54],"measuring":[56],"difference":[58],"angles":[61],"Various":[64],"tests":[65],"are":[66],"reported,":[67],"which":[68],"assess":[69],"performance":[71],"isolator":[74],"over":[75],"its":[76],"operating":[77],"range.":[78],"These":[79],"include":[80],"temperature":[81],"coefficient,":[82],"linearity,":[83],"gain":[84],"stability":[85],"common-mode":[86],"rejection,":[87],"and":[88],"crosstalk.":[89]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-30T13:55:48.251075","created_date":"2025-10-10T00:00:00"}