{"id":"https://openalex.org/W3113111312","doi":"https://doi.org/10.1109/tim.2020.3045191","title":"Modulation Transfer Function Measurements Using a Learning Approach From Multiple Diffractive Grids for Optical Cameras","display_name":"Modulation Transfer Function Measurements Using a Learning Approach From Multiple Diffractive Grids for Optical Cameras","publication_year":2020,"publication_date":"2020-12-17","ids":{"openalex":"https://openalex.org/W3113111312","doi":"https://doi.org/10.1109/tim.2020.3045191","mag":"3113111312"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3045191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3045191","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100364838","display_name":"Jin Li","orcid":"https://orcid.org/0000-0003-3581-2933"},"institutions":[{"id":"https://openalex.org/I241749","display_name":"University of Cambridge","ror":"https://ror.org/013meh722","country_code":"GB","type":"education","lineage":["https://openalex.org/I241749"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jin Li","raw_affiliation_strings":["Electrical Engineering Division, University of Cambridge, Cambridge, U.K"],"raw_orcid":"https://orcid.org/0000-0003-3581-2933","affiliations":[{"raw_affiliation_string":"Electrical Engineering Division, University of Cambridge, Cambridge, U.K","institution_ids":["https://openalex.org/I241749"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101692819","display_name":"Yanyan Liu","orcid":"https://orcid.org/0000-0002-1062-4787"},"institutions":[{"id":"https://openalex.org/I106645853","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44","country_code":"CN","type":"education","lineage":["https://openalex.org/I106645853"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanyan Liu","raw_affiliation_strings":["Changchun University of Science and Technology, Jinlin, China"],"raw_orcid":"https://orcid.org/0000-0002-1062-4787","affiliations":[{"raw_affiliation_string":"Changchun University of Science and Technology, Jinlin, China","institution_ids":["https://openalex.org/I106645853"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.3754,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.96786187,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12019","display_name":"Calibration and Measurement Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optical-transfer-function","display_name":"Optical transfer function","score":0.8188908696174622},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6541315317153931},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6123827695846558},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5794728994369507},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.550342321395874},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5368818044662476},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.5335754752159119},{"id":"https://openalex.org/keywords/point-spread-function","display_name":"Point spread function","score":0.5212450623512268},{"id":"https://openalex.org/keywords/image-restoration","display_name":"Image restoration","score":0.49341168999671936},{"id":"https://openalex.org/keywords/iterative-reconstruction","display_name":"Iterative reconstruction","score":0.4550143778324127},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.39706504344940186},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.30500370264053345},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.21280932426452637},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1478048861026764}],"concepts":[{"id":"https://openalex.org/C175231954","wikidata":"https://www.wikidata.org/wiki/Q1942321","display_name":"Optical transfer function","level":2,"score":0.8188908696174622},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6541315317153931},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6123827695846558},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5794728994369507},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.550342321395874},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5368818044662476},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.5335754752159119},{"id":"https://openalex.org/C69179731","wikidata":"https://www.wikidata.org/wiki/Q510427","display_name":"Point spread function","level":2,"score":0.5212450623512268},{"id":"https://openalex.org/C106430172","wikidata":"https://www.wikidata.org/wiki/Q6002272","display_name":"Image restoration","level":4,"score":0.49341168999671936},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.4550143778324127},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.39706504344940186},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.30500370264053345},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.21280932426452637},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1478048861026764},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2020.3045191","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3045191","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:generic.eprints.org:1263844","is_oa":false,"landing_page_url":"http://publications.eng.cam.ac.uk/1263844/","pdf_url":null,"source":{"id":"https://openalex.org/S4406922847","display_name":"Cambridge University Engineering Department Publications Database","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5699999928474426}],"awards":[{"id":"https://openalex.org/G6107969383","display_name":null,"funder_award_id":"XJJLG-2018-07","funder_id":"https://openalex.org/F4320327292","funder_display_name":"Changchun University of Science and Technology"}],"funders":[{"id":"https://openalex.org/F4320327292","display_name":"Changchun University of Science and Technology","ror":"https://ror.org/007mntk44"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1520269914","https://openalex.org/W1795014501","https://openalex.org/W1964250204","https://openalex.org/W1977670753","https://openalex.org/W2022593567","https://openalex.org/W2024474298","https://openalex.org/W2028706184","https://openalex.org/W2034455265","https://openalex.org/W2043960182","https://openalex.org/W2055536840","https://openalex.org/W2085417898","https://openalex.org/W2088909704","https://openalex.org/W2088946548","https://openalex.org/W2094748413","https://openalex.org/W2101303708","https://openalex.org/W2103913786","https://openalex.org/W2105956203","https://openalex.org/W2128428741","https://openalex.org/W2131707078","https://openalex.org/W2138204001","https://openalex.org/W2144304318","https://openalex.org/W2145856043","https://openalex.org/W2147298660","https://openalex.org/W2154090620","https://openalex.org/W2184271904","https://openalex.org/W2249269486","https://openalex.org/W2546877525","https://openalex.org/W2565772015","https://openalex.org/W2588074453","https://openalex.org/W2599237741","https://openalex.org/W2733764470","https://openalex.org/W2735560227","https://openalex.org/W2735592379","https://openalex.org/W2737561763","https://openalex.org/W2767678041","https://openalex.org/W2804784916","https://openalex.org/W2905915339","https://openalex.org/W2965536428","https://openalex.org/W2971748233","https://openalex.org/W2972120791","https://openalex.org/W2985036575","https://openalex.org/W3003979012","https://openalex.org/W6681807782"],"related_works":["https://openalex.org/W2808332603","https://openalex.org/W2541033646","https://openalex.org/W1983478051","https://openalex.org/W2011448867","https://openalex.org/W2538366530","https://openalex.org/W1998091235","https://openalex.org/W1522749619","https://openalex.org/W2810472406","https://openalex.org/W2521685458","https://openalex.org/W2034346935"],"abstract_inverted_index":{"Remote":[0],"sensing":[1,36,195],"images":[2],"are":[3,125,147,159],"easily":[4,160],"degraded":[5],"because":[6,157],"the":[7,13,40,44,47,52,55,59,81,99,110,116,138,141,172,178,184,205],"imaging":[8,111],"process":[9],"is":[10,118,134,181],"influenced":[11],"by":[12,43,127,162],"camera":[14,37],"itself":[15],"link":[16],"(CIL),":[17],"such":[18],"as":[19,151],"optical":[20],"systems,":[21,23],"electronic":[22],"and":[24,165,187,209],"image":[25,60,88,190,212],"sensors.":[26],"The":[27,113,200],"invariant":[28],"modulation":[29],"transfer":[30],"function":[31,155],"(IMTF)":[32],"of":[33,54,83,98,171,193],"a":[34,68,104,152],"remote":[35,194],"can":[38,50,203],"represent":[39],"degeneration":[41,53,192],"produced":[42],"CIL.":[45],"Thus,":[46],"IMTF":[48,64,100,114,139,185],"compensation":[49,89,188,213],"remove":[51],"CIL":[56,117],"to":[57,80,107,136],"improve":[58],"quality.":[61,90],"However,":[62],"conventional":[63],"measurement":[65,77,96],"methods":[66,202],"using":[67,120],"single":[69],"feature":[70],"(e.g.,":[71],"edge":[72],"or":[73],"pulse)":[74],"have":[75],"low":[76,87,168],"accuracy":[78,170,208],"due":[79],"influence":[82],"noises,":[84],"resulting":[85],"in":[86,101,167],"Here,":[91],"we":[92],"propose":[93],"an":[94],"efficient":[95],"method":[97,180],"conjunction":[102],"with":[103,216],"learning":[105,132],"approach":[106,133],"compensate":[108],"for":[109,183,189],"degeneration.":[112],"from":[115,140],"measured":[119],"multiple":[121],"diffractive":[122,142,145],"grids,":[123,143],"which":[124],"generated":[126],"two":[128],"1-D":[129],"gratings.":[130],"A":[131],"proposed":[135,179,201],"estimate":[137],"where":[144],"grids":[146,158],"not":[148],"directly":[149],"used":[150],"point":[153],"spread":[154],"(PSF)":[156],"affected":[161],"various":[163],"noises":[164],"result":[166],"reconstruction":[169,207],"IMTF.":[173],"We":[174],"experimentally":[175],"confirm":[176],"that":[177],"useful":[182],"estimations":[186],"quality":[191,214],"cameras":[196],"under":[197],"noise":[198],"conditions.":[199],"double":[204],"MTF":[206],"yield":[210],"higher":[211],"compared":[215],"traditional":[217],"methods.":[218]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}