{"id":"https://openalex.org/W3112435896","doi":"https://doi.org/10.1109/tim.2020.3043112","title":"Hybrid Thermal Modeling to Predict LED Thermal Behavior in Hybrid Electronics","display_name":"Hybrid Thermal Modeling to Predict LED Thermal Behavior in Hybrid Electronics","publication_year":2020,"publication_date":"2020-12-08","ids":{"openalex":"https://openalex.org/W3112435896","doi":"https://doi.org/10.1109/tim.2020.3043112","mag":"3112435896"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3043112","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3043112","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078177009","display_name":"Esa Hannila","orcid":"https://orcid.org/0000-0002-0840-0565"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Esa Hannila","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]"],"raw_orcid":"https://orcid.org/0000-0002-0840-0565","affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086621591","display_name":"Noora Heinilehto","orcid":"https://orcid.org/0000-0002-3452-4836"},"institutions":[{"id":"https://openalex.org/I87653560","display_name":"VTT Technical Research Centre of Finland","ror":"https://ror.org/04b181w54","country_code":"FI","type":"nonprofit","lineage":["https://openalex.org/I4210089493","https://openalex.org/I87653560"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Noora Heinilehto","raw_affiliation_strings":["VTT Technical Research Center of Finland Ltd., Oulu, Finland"],"raw_orcid":"https://orcid.org/0000-0002-3452-4836","affiliations":[{"raw_affiliation_string":"VTT Technical Research Center of Finland Ltd., Oulu, Finland","institution_ids":["https://openalex.org/I87653560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083175940","display_name":"Kari Remes","orcid":"https://orcid.org/0000-0002-4371-7939"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Kari Remes","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]"],"raw_orcid":"https://orcid.org/0000-0002-4371-7939","affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084212587","display_name":"Janne Lauri","orcid":"https://orcid.org/0000-0002-6463-9941"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Janne Lauri","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]"],"raw_orcid":"https://orcid.org/0000-0002-6463-9941","affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044276913","display_name":"Kimmo Ker\u00e4nen","orcid":"https://orcid.org/0000-0002-6539-0666"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Kimmo Keranen","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]"],"raw_orcid":"https://orcid.org/0000-0002-6539-0666","affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]","institution_ids":["https://openalex.org/I98381234"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087171304","display_name":"Tapio Fabritius","orcid":"https://orcid.org/0000-0003-4729-8740"},"institutions":[{"id":"https://openalex.org/I98381234","display_name":"University of Oulu","ror":"https://ror.org/03yj89h83","country_code":"FI","type":"education","lineage":["https://openalex.org/I98381234"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Tapio Fabritius","raw_affiliation_strings":["Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]"],"raw_orcid":"https://orcid.org/0000-0003-4729-8740","affiliations":[{"raw_affiliation_string":"Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland","institution_ids":["https://openalex.org/I98381234"]},{"raw_affiliation_string":"[Optoelectronics and Measurement Techniques Research Unit, Faculty of Information Technology and Electrical Engineering (ITEE), University of Oulu, Oulu, Finland]","institution_ids":["https://openalex.org/I98381234"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.121,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.44846976,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12897","display_name":"Structural Analysis of Composite Materials","score":0.9825000166893005,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12897","display_name":"Structural Analysis of Composite Materials","score":0.9825000166893005,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.965499997138977,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10121","display_name":"Building Energy and Comfort Optimization","score":0.9570000171661377,"subfield":{"id":"https://openalex.org/subfields/2215","display_name":"Building and Construction"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/multiphysics","display_name":"Multiphysics","score":0.8179552555084229},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.7234677076339722},{"id":"https://openalex.org/keywords/light-emitting-diode","display_name":"Light-emitting diode","score":0.6468929648399353},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.6129175424575806},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5962292551994324},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.5440499186515808},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.48821547627449036},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.46300604939460754},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.4543435573577881},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39832258224487305},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3693455457687378},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.33073586225509644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31389176845550537},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2904984652996063},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.19236162304878235},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.17720726132392883},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.16692060232162476},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.11669838428497314}],"concepts":[{"id":"https://openalex.org/C46435376","wikidata":"https://www.wikidata.org/wiki/Q1829750","display_name":"Multiphysics","level":3,"score":0.8179552555084229},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.7234677076339722},{"id":"https://openalex.org/C176666156","wikidata":"https://www.wikidata.org/wiki/Q25504","display_name":"Light-emitting diode","level":2,"score":0.6468929648399353},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.6129175424575806},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5962292551994324},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.5440499186515808},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.48821547627449036},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.46300604939460754},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.4543435573577881},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39832258224487305},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3693455457687378},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.33073586225509644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31389176845550537},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2904984652996063},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.19236162304878235},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.17720726132392883},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.16692060232162476},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.11669838428497314},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2020.3043112","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3043112","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:oulu.fi:nbnfi-fe202101071181","is_oa":false,"landing_page_url":"http://urn.fi/urn:nbn:fi-fe202101071181","pdf_url":null,"source":{"id":"https://openalex.org/S4306400284","display_name":"University of Oulu Repository (University of Oulu)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I98381234","host_organization_name":"University of Oulu","host_organization_lineage":["https://openalex.org/I98381234"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6499999761581421}],"awards":[{"id":"https://openalex.org/G1814317392","display_name":null,"funder_award_id":"Dnro 3944/31/2014","funder_id":"https://openalex.org/F4320328501","funder_display_name":"Business Finland"},{"id":"https://openalex.org/G2130381209","display_name":null,"funder_award_id":"320017","funder_id":"https://openalex.org/F4320321108","funder_display_name":"Academy of Finland"},{"id":"https://openalex.org/G56413866","display_name":null,"funder_award_id":"A74080","funder_id":"https://openalex.org/F4320335322","funder_display_name":"European Regional Development Fund"}],"funders":[{"id":"https://openalex.org/F4320321108","display_name":"Academy of Finland","ror":"https://ror.org/05k73zm37"},{"id":"https://openalex.org/F4320328501","display_name":"Business Finland","ror":"https://ror.org/05bgf9v38"},{"id":"https://openalex.org/F4320335322","display_name":"European Regional Development Fund","ror":"https://ror.org/00k4n6c32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1967946360","https://openalex.org/W1972152245","https://openalex.org/W1999430083","https://openalex.org/W2002047919","https://openalex.org/W2005974006","https://openalex.org/W2013876596","https://openalex.org/W2036931096","https://openalex.org/W2045279221","https://openalex.org/W2052431182","https://openalex.org/W2060615158","https://openalex.org/W2071739550","https://openalex.org/W2086607465","https://openalex.org/W2112565951","https://openalex.org/W2118194821","https://openalex.org/W2194214845","https://openalex.org/W2543444800","https://openalex.org/W2602554784","https://openalex.org/W2604789278","https://openalex.org/W2751819004","https://openalex.org/W2766014412","https://openalex.org/W2782629930","https://openalex.org/W2790462309","https://openalex.org/W2801365015","https://openalex.org/W2900245527","https://openalex.org/W2922361413","https://openalex.org/W2945762567","https://openalex.org/W2952325702","https://openalex.org/W2969358222","https://openalex.org/W2972912909","https://openalex.org/W2997039106","https://openalex.org/W3036956570","https://openalex.org/W3038334136","https://openalex.org/W6650759999","https://openalex.org/W6735917595"],"related_works":["https://openalex.org/W2187459221","https://openalex.org/W3200296812","https://openalex.org/W4313854556","https://openalex.org/W2597097523","https://openalex.org/W2216557144","https://openalex.org/W2755682450","https://openalex.org/W2030898604","https://openalex.org/W3112435896","https://openalex.org/W2777767996","https://openalex.org/W3038334136"],"abstract_inverted_index":{"Hybrid":[0],"structural":[1,227],"electronics":[2],"(HSE)":[3],"consists":[4],"of":[5,15,35,80,86,115,158,181],"printed":[6],"electronics,":[7,10],"conventional":[8],"rigid":[9],"and":[11,23,107,127,149,172,179,230],"load-bearing":[12],"supporting":[13],"parts":[14],"a":[16,111,142,159,223],"device":[17],"(plastic,":[18],"glass":[19],"etc.).":[20],"Extra-large":[21],"area":[22],"flexible":[24],"lighting":[25],"elements":[26,85,229],"with":[27,74,90,190,213],"embedded":[28,61],"light-emitting":[29],"diodes":[30],"(LEDs)":[31],"are":[32,60,136,186],"an":[33,102],"example":[34],"such":[36],"applications.":[37],"LEDs":[38,59],"can":[39,219],"be":[40,67,220],"used,":[41],"for":[42,51,225],"example,":[43],"as":[44,222],"light":[45],"sources,":[46],"to":[47,100,120,153],"create":[48],"smart":[49],"surfaces":[50],"the":[52,58,63,77,116,121,155,182,196,199,216],"architectural":[53],"or":[54],"automotive":[55],"industry.":[56],"Once":[57],"into":[62],"structure,":[64],"they":[65],"cannot":[66],"replaced.":[68],"To":[69],"make":[70],"sustainable":[71],"HSE":[72,87],"products":[73],"long":[75],"lifetime,":[76,108],"new":[78],"type":[79],"designs":[81],"is":[82,98,151,170],"needed.":[83],"The":[84,168,177],"undergo":[88],"conditions":[89],"elevated":[91],"thermal":[92,132,147,156,184,191],"stresses":[93],"while":[94],"in":[95,166,174,235],"operation.":[96],"That":[97],"known":[99],"have":[101],"impact":[103],"on":[104,162,195],"their":[105,232],"performance":[106,233],"thus":[109],"making":[110],"proper":[112],"heat":[113],"management":[114,133],"LED":[117,161,228],"crucial.":[118],"Due":[119],"novel":[122],"additive":[123],"manufacturing":[124],"methods,":[125],"structures,":[126],"unconventional":[128],"material":[129],"combinations,":[130],"many":[131],"related":[134],"aspects":[135],"not":[137],"known.":[138],"In":[139],"this":[140],"study,":[141],"two-step":[143],"hybrid":[144],"method,":[145],"including":[146],"modeling":[148],"measurements,":[150],"used":[152,165,221],"estimate":[154],"behavior":[157,185],"surface-mounted":[160],"polymer":[163],"substrate":[164],"HSE.":[167],"model":[169,202,218],"created":[171],"simulated":[173],"COMSOL":[175],"Multiphysics.":[176],"validity":[178],"accuracy":[180],"model's":[183],"verified":[187],"through":[188],"measurements":[189],"transient":[192],"measurements.":[193,214],"Based":[194],"experimental":[197],"verification,":[198],"proposed":[200],"simulation":[201],"only":[203],"has":[204],"small":[205],"(less":[206],"than":[207],"2%)":[208],"temperature":[209],"variations":[210],"when":[211],"compared":[212],"Hence,":[215],"developed":[217],"basis":[224],"designing":[226],"predicting":[231],"characteristics":[234],"different":[236],"user":[237],"cases.":[238]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}