{"id":"https://openalex.org/W3094821939","doi":"https://doi.org/10.1109/tim.2020.3035257","title":"A Novel Fault Leakage Current Detection Method With Protection Deadzone Elimination","display_name":"A Novel Fault Leakage Current Detection Method With Protection Deadzone Elimination","publication_year":2020,"publication_date":"2020-11-02","ids":{"openalex":"https://openalex.org/W3094821939","doi":"https://doi.org/10.1109/tim.2020.3035257","mag":"3094821939"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3035257","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3035257","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039799646","display_name":"Kui Li","orcid":"https://orcid.org/0000-0002-3866-6700"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Kui Li","raw_affiliation_strings":["Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-3866-6700","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017343765","display_name":"Jingyi Lin","orcid":"https://orcid.org/0000-0003-3511-9389"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingyi Lin","raw_affiliation_strings":["Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-3511-9389","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039949603","display_name":"Feng Niu","orcid":"https://orcid.org/0000-0003-2465-647X"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Feng Niu","raw_affiliation_strings":["Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0003-2465-647X","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Yao Wang","orcid":"https://orcid.org/0000-0001-7253-6056"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Wang","raw_affiliation_strings":["Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0001-7253-6056","affiliations":[{"raw_affiliation_string":"Key Laboratory of Electromagnetic Field and Electrical Apparatus Reliability of Hebei Province, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]},{"raw_affiliation_string":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100340644","display_name":"Qian Li","orcid":"https://orcid.org/0000-0003-0359-5604"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Qian Li","raw_affiliation_strings":["China Road and Bridge Corporation, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-0359-5604","affiliations":[{"raw_affiliation_string":"China Road and Bridge Corporation, Beijing, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101828696","display_name":"Zhitao Guo","orcid":"https://orcid.org/0000-0002-4790-1039"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhitao Guo","raw_affiliation_strings":["School of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-4790-1039","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030352944","display_name":"Yi Wu","orcid":"https://orcid.org/0000-0002-4761-7791"},"institutions":[{"id":"https://openalex.org/I184843921","display_name":"Hebei University of Technology","ror":"https://ror.org/018hded08","country_code":"CN","type":"education","lineage":["https://openalex.org/I184843921"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yi Wu","raw_affiliation_strings":["School of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-4761-7791","affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Hebei University of Technology, Tianjin, China","institution_ids":["https://openalex.org/I184843921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5039799646"],"corresponding_institution_ids":["https://openalex.org/I184843921"],"apc_list":null,"apc_paid":null,"fwci":1.5605,"has_fulltext":false,"cited_by_count":30,"citation_normalized_percentile":{"value":0.83439376,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.7320433259010315},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5167445540428162},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.48038846254348755},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.4788815379142761},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4466615915298462},{"id":"https://openalex.org/keywords/dead-zone","display_name":"Dead zone","score":0.43090981245040894},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3496997356414795},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3157395124435425},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2540978789329529},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.12623357772827148},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.08479198813438416}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.7320433259010315},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5167445540428162},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.48038846254348755},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.4788815379142761},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4466615915298462},{"id":"https://openalex.org/C63840607","wikidata":"https://www.wikidata.org/wiki/Q1236263","display_name":"Dead zone","level":2,"score":0.43090981245040894},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3496997356414795},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3157395124435425},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2540978789329529},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.12623357772827148},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.08479198813438416},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2020.3035257","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3035257","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G6498804954","display_name":null,"funder_award_id":"E2019202124","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"},{"id":"https://openalex.org/G6729314158","display_name":null,"funder_award_id":"E2020202042","funder_id":"https://openalex.org/F4320322163","funder_display_name":"Natural Science Foundation of Hebei Province"},{"id":"https://openalex.org/G962255988","display_name":null,"funder_award_id":"51977059","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322163","display_name":"Natural Science Foundation of Hebei Province","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1903548326","https://openalex.org/W1969352377","https://openalex.org/W1998634773","https://openalex.org/W2015649487","https://openalex.org/W2021791450","https://openalex.org/W2048578734","https://openalex.org/W2082783722","https://openalex.org/W2088804340","https://openalex.org/W2095841848","https://openalex.org/W2096217851","https://openalex.org/W2133782211","https://openalex.org/W2135360943","https://openalex.org/W2155172405","https://openalex.org/W2312569258","https://openalex.org/W2321928245","https://openalex.org/W2388715575","https://openalex.org/W2523417368","https://openalex.org/W2537950952","https://openalex.org/W2587618232","https://openalex.org/W2971613638","https://openalex.org/W3012190034"],"related_works":["https://openalex.org/W2387106869","https://openalex.org/W2047025451","https://openalex.org/W2141074708","https://openalex.org/W2560215812","https://openalex.org/W2166984559","https://openalex.org/W2050200476","https://openalex.org/W4385301753","https://openalex.org/W2171501125","https://openalex.org/W2617234683","https://openalex.org/W2375947351"],"abstract_inverted_index":{"Residual":[0],"current":[1,27,43,52,65,77,107,121],"device":[2],"is":[3,36,91,124],"an":[4],"important":[5],"switch":[6],"apparatus":[7],"to":[8,30,56,99,126],"ensure":[9],"the":[10,16,32,40,50,57,63,67,101,104,115,118,128,131],"safe":[11],"and":[12,84,94,110,117],"reliable":[13],"operation":[14],"of":[15,62,69,75,103,114,130],"power":[17],"distribution":[18],"system.":[19],"This":[20],"article":[21],"proposes":[22],"a":[23,85,111],"novel":[24],"fault":[25,88],"leakage":[26,42,51,64,70,76,87,106,120],"detection":[28,44,108,122],"method":[29,48],"eliminate":[31],"protection":[33,89],"deadzone":[34],"that":[35],"typically":[37],"associated":[38],"with":[39],"classical":[41,116],"method.":[45,133],"The":[46],"proposed":[47,105,119,132],"takes":[49],"variation":[53,78],"in":[54,82],"addition":[55],"instantaneous":[58],"root-mean-square":[59],"(rms)":[60],"value":[61],"as":[66],"indicator":[68],"fault.":[71],"Three":[72],"mathematical":[73],"models":[74],"calculation":[79],"are":[80,97],"illustrated":[81],"detail":[83],"multilevel":[86],"strategy":[90],"proposed.":[92],"Simulation":[93],"experimental":[95],"results":[96],"presented":[98],"validate":[100],"effectiveness":[102],"method,":[109],"comparative":[112],"evaluation":[113],"methods":[123],"conducted":[125],"verify":[127],"superiority":[129]},"counts_by_year":[{"year":2025,"cited_by_count":8},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":4}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}