{"id":"https://openalex.org/W3097223218","doi":"https://doi.org/10.1109/tim.2020.3034615","title":"Multimodal Two-Phase Flow Measurement Using Dual Plane ECT and GRT","display_name":"Multimodal Two-Phase Flow Measurement Using Dual Plane ECT and GRT","publication_year":2020,"publication_date":"2020-10-29","ids":{"openalex":"https://openalex.org/W3097223218","doi":"https://doi.org/10.1109/tim.2020.3034615","mag":"3097223218"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3034615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3034615","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11250/2757374","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086709632","display_name":"Stian Husevik Stavland","orcid":"https://orcid.org/0000-0002-1126-3354"},"institutions":[{"id":"https://openalex.org/I4432739","display_name":"University of Bergen","ror":"https://ror.org/03zga2b32","country_code":"NO","type":"education","lineage":["https://openalex.org/I4432739"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Stian Husevik Stavland","raw_affiliation_strings":["University of Bergen, Bergen, Norway"],"raw_orcid":"https://orcid.org/0000-0002-1126-3354","affiliations":[{"raw_affiliation_string":"University of Bergen, Bergen, Norway","institution_ids":["https://openalex.org/I4432739"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088058882","display_name":"Yessica Arellano","orcid":"https://orcid.org/0000-0003-4300-627X"},"institutions":[{"id":"https://openalex.org/I173888879","display_name":"SINTEF","ror":"https://ror.org/01f677e56","country_code":"NO","type":"facility","lineage":["https://openalex.org/I173888879"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Yessica Arellano","raw_affiliation_strings":["Gas Technology, SINTEF Energy Research, Trondheim, Norway"],"raw_orcid":"https://orcid.org/0000-0003-4300-627X","affiliations":[{"raw_affiliation_string":"Gas Technology, SINTEF Energy Research, Trondheim, Norway","institution_ids":["https://openalex.org/I173888879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103089617","display_name":"A. Hunt","orcid":"https://orcid.org/0000-0002-9407-3838"},"institutions":[{"id":"https://openalex.org/I2803026322","display_name":"Centre for Process Innovation","ror":"https://ror.org/01aetpp13","country_code":"GB","type":"facility","lineage":["https://openalex.org/I2803026322"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Andy Hunt","raw_affiliation_strings":["Atout Process Ltd., New Milton, U.K"],"raw_orcid":"https://orcid.org/0000-0002-9407-3838","affiliations":[{"raw_affiliation_string":"Atout Process Ltd., New Milton, U.K","institution_ids":["https://openalex.org/I2803026322"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048099702","display_name":"Rachid Maad","orcid":"https://orcid.org/0000-0003-3167-5599"},"institutions":[{"id":"https://openalex.org/I4432739","display_name":"University of Bergen","ror":"https://ror.org/03zga2b32","country_code":"NO","type":"education","lineage":["https://openalex.org/I4432739"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Rachid Maad","raw_affiliation_strings":["University of Bergen, Bergen, Norway"],"raw_orcid":"https://orcid.org/0000-0003-3167-5599","affiliations":[{"raw_affiliation_string":"University of Bergen, Bergen, Norway","institution_ids":["https://openalex.org/I4432739"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038030358","display_name":"B.T. Hjertaker","orcid":"https://orcid.org/0000-0001-8775-0637"},"institutions":[{"id":"https://openalex.org/I4432739","display_name":"University of Bergen","ror":"https://ror.org/03zga2b32","country_code":"NO","type":"education","lineage":["https://openalex.org/I4432739"]}],"countries":["NO"],"is_corresponding":false,"raw_author_name":"Bjorn Tore Hjertaker","raw_affiliation_strings":["University of Bergen, Bergen, Norway"],"raw_orcid":"https://orcid.org/0000-0001-8775-0637","affiliations":[{"raw_affiliation_string":"University of Bergen, Bergen, Norway","institution_ids":["https://openalex.org/I4432739"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9366,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.7535561,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12537","display_name":"Flow Measurement and Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.8171404004096985},{"id":"https://openalex.org/keywords/flow","display_name":"Flow (mathematics)","score":0.6176155805587769},{"id":"https://openalex.org/keywords/flow-measurement","display_name":"Flow measurement","score":0.5604643225669861},{"id":"https://openalex.org/keywords/flow-velocity","display_name":"Flow velocity","score":0.5467126369476318},{"id":"https://openalex.org/keywords/volumetric-flow-rate","display_name":"Volumetric flow rate","score":0.5175594687461853},{"id":"https://openalex.org/keywords/cross-section","display_name":"Cross section (physics)","score":0.5130516290664673},{"id":"https://openalex.org/keywords/multiphase-flow","display_name":"Multiphase flow","score":0.5102887153625488},{"id":"https://openalex.org/keywords/phase","display_name":"Phase (matter)","score":0.4822860062122345},{"id":"https://openalex.org/keywords/two-phase-flow","display_name":"Two-phase flow","score":0.4746580421924591},{"id":"https://openalex.org/keywords/tomography","display_name":"Tomography","score":0.4680369198322296},{"id":"https://openalex.org/keywords/mechanics","display_name":"Mechanics","score":0.4526630640029907},{"id":"https://openalex.org/keywords/plane","display_name":"Plane (geometry)","score":0.4144865870475769},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3803970217704773},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28700923919677734},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2485867440700531},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.23738494515419006},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.2264864444732666},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.196934312582016}],"concepts":[{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.8171404004096985},{"id":"https://openalex.org/C38349280","wikidata":"https://www.wikidata.org/wiki/Q1434290","display_name":"Flow (mathematics)","level":2,"score":0.6176155805587769},{"id":"https://openalex.org/C16302685","wikidata":"https://www.wikidata.org/wiki/Q15091623","display_name":"Flow measurement","level":2,"score":0.5604643225669861},{"id":"https://openalex.org/C166693061","wikidata":"https://www.wikidata.org/wiki/Q5462119","display_name":"Flow velocity","level":3,"score":0.5467126369476318},{"id":"https://openalex.org/C172120300","wikidata":"https://www.wikidata.org/wiki/Q1134348","display_name":"Volumetric flow rate","level":2,"score":0.5175594687461853},{"id":"https://openalex.org/C52234038","wikidata":"https://www.wikidata.org/wiki/Q17128025","display_name":"Cross section (physics)","level":2,"score":0.5130516290664673},{"id":"https://openalex.org/C2779379648","wikidata":"https://www.wikidata.org/wiki/Q1559665","display_name":"Multiphase flow","level":2,"score":0.5102887153625488},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.4822860062122345},{"id":"https://openalex.org/C144308804","wikidata":"https://www.wikidata.org/wiki/Q232997","display_name":"Two-phase flow","level":3,"score":0.4746580421924591},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.4680369198322296},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.4526630640029907},{"id":"https://openalex.org/C17825722","wikidata":"https://www.wikidata.org/wiki/Q17285","display_name":"Plane (geometry)","level":2,"score":0.4144865870475769},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3803970217704773},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28700923919677734},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2485867440700531},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.23738494515419006},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.2264864444732666},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.196934312582016},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2020.3034615","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3034615","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:sintef.brage.unit.no:11250/2757374","is_oa":true,"landing_page_url":"https://hdl.handle.net/11250/2757374","pdf_url":null,"source":{"id":"https://openalex.org/S4306401716","display_name":"Duo Research Archive (University of Oslo)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184942183","host_organization_name":"University of Oslo","host_organization_lineage":["https://openalex.org/I184942183"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"70","raw_type":"info:eu-repo/semantics/other"}],"best_oa_location":{"id":"pmh:oai:sintef.brage.unit.no:11250/2757374","is_oa":true,"landing_page_url":"https://hdl.handle.net/11250/2757374","pdf_url":null,"source":{"id":"https://openalex.org/S4306401716","display_name":"Duo Research Archive (University of Oslo)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I184942183","host_organization_name":"University of Oslo","host_organization_lineage":["https://openalex.org/I184942183"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"70","raw_type":"info:eu-repo/semantics/other"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1966285133","https://openalex.org/W1983517672","https://openalex.org/W2000064615","https://openalex.org/W2000241688","https://openalex.org/W2042732750","https://openalex.org/W2043010718","https://openalex.org/W2094156918","https://openalex.org/W2105910484","https://openalex.org/W2106505294","https://openalex.org/W2106822551","https://openalex.org/W2153427534","https://openalex.org/W2176355320","https://openalex.org/W2479005531","https://openalex.org/W2693994341","https://openalex.org/W2883835355","https://openalex.org/W2903958931","https://openalex.org/W2972585287","https://openalex.org/W3039070470","https://openalex.org/W3042962005","https://openalex.org/W4253133988","https://openalex.org/W4285719527","https://openalex.org/W6676058284","https://openalex.org/W6739610758","https://openalex.org/W6753485681"],"related_works":["https://openalex.org/W2221118401","https://openalex.org/W2599381897","https://openalex.org/W3175649433","https://openalex.org/W2378223409","https://openalex.org/W2530737419","https://openalex.org/W2044450417","https://openalex.org/W3042445073","https://openalex.org/W2594988164","https://openalex.org/W2116674942","https://openalex.org/W2523593148"],"abstract_inverted_index":{"This":[0,104],"work":[1,236],"assesses":[2,106],"the":[3,50,54,57,61,67,81,90,100,107,116,122,126,137,146,163,182,187,194,206,238,241],"accuracy":[4,65,152,224,239],"of":[5,31,46,52,60,66,83,89,109,125,139,145,153,186,225,240,266],"two-phase":[6,47,91,230],"flow":[7,33,48,62,68,85,184,203,231],"measurement,":[8],"based":[9],"on":[10,136,244],"cross":[11,102],"correlation":[12],"(XC)":[13],"and":[14,56,75,98,166,248],"cross-spectrum":[15],"(CS)":[16],"velocity":[17,55,69,118,164,199],"computation,":[18],"using":[19,214],"dual":[20],"plane":[21],"nonintrusive":[22],"electrical":[23],"capacitance":[24],"tomography":[25,42,242],"(ECT),":[26],"over":[27,205],"a":[28,77,140,177,215,262],"broad":[29],"spectrum":[30],"horizontal":[32],"configurations,":[34],"combined":[35,168],"with":[36,169],"fraction":[37,174,246],"distribution":[38,119,144,175],"measurements":[39,165],"from":[40,176],"gamma-ray":[41],"(GRT).":[43],"The":[44,64,87,142,190,227],"measurement":[45,51,232,247],"encompasses":[49],"both":[53,94,202],"phase":[58,173],"concentration":[59],"components.":[63],"is":[70,148,160,167],"still":[71],"an":[72],"open":[73],"discussion":[74],"remains":[76],"key":[78],"challenge":[79],"in":[80,95,221,234,257],"field":[82],"multiphase":[84],"measurement.":[86],"velocities":[88,147],"components":[92,267],"vary,":[93],"between":[96],"them":[97],"across":[99],"pipe":[101],"section.":[103],"study":[105],"use":[108],"XC":[110,208],"techniques":[111],"as":[112],"methods":[113],"for":[114,150,162,201,229],"calculating":[115],"cross-sectional":[117,172],"by":[120,260],"deriving":[121],"transit":[123],"time":[124],"fluid":[127],"flowing":[128],"through":[129],"two":[130,188],"parallel":[131],"ECT":[132,159],"sensor":[133],"arrays":[134],"mounted":[135],"perimeter":[138],"pipe.":[141],"spectral":[143],"assessed":[149],"improved":[151],"individual":[154],"component":[155],"velocities.":[156,268],"A":[157],"dual-plane":[158],"adopted":[161],"state-of-the-art":[170],"density-based":[171],"GRT":[178],"system":[179],"to":[180,252,254],"measure":[181],"volumetric":[183],"rates":[185],"phases.":[189],"results":[191],"show":[192],"that":[193],"CS":[195],"method":[196,228],"provides":[197],"enhanced":[198],"estimation":[200,223],"phases":[204],"conventional":[207],"technique.":[209],"Further":[210],"improvement":[211],"was":[212],"reported":[213],"simple":[216],"predictive":[217],"correction":[218],"model":[219],"resulting":[220],"flowrate":[222],"\u00b110%.":[226],"suggested":[233],"this":[235],"leverages":[237],"systems":[243],"accurate":[245,264],"fast":[249],"data":[250],"acquisition":[251],"lead":[253],"potential":[255],"enhancement":[256],"process":[258],"control":[259],"enabling":[261],"more":[263],"prediction":[265]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":4}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}