{"id":"https://openalex.org/W3093914592","doi":"https://doi.org/10.1109/tim.2020.3033377","title":"Liftoff Tolerant Pancake Eddy-Current Sensor for the Thickness and Spacing Measurement of Nonmagnetic Plates","display_name":"Liftoff Tolerant Pancake Eddy-Current Sensor for the Thickness and Spacing Measurement of Nonmagnetic Plates","publication_year":2020,"publication_date":"2020-10-23","ids":{"openalex":"https://openalex.org/W3093914592","doi":"https://doi.org/10.1109/tim.2020.3033377","mag":"3093914592"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3033377","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2020.3033377","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09237995.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09237995.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100732226","display_name":"Mingyang Lu","orcid":"https://orcid.org/0000-0002-1076-7825"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Mingyang Lu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K"],"raw_orcid":"https://orcid.org/0000-0002-1076-7825","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002312361","display_name":"Xiaobai Meng","orcid":"https://orcid.org/0000-0003-0696-4137"},"institutions":[{"id":"https://openalex.org/I35870678","display_name":"University of Northampton","ror":"https://ror.org/04jp2hx10","country_code":"GB","type":"education","lineage":["https://openalex.org/I35870678"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Xiaobai Meng","raw_affiliation_strings":["Faculty of Art, Science and Technology, University of Northampton, Northampton, U.K"],"raw_orcid":"https://orcid.org/0000-0003-0696-4137","affiliations":[{"raw_affiliation_string":"Faculty of Art, Science and Technology, University of Northampton, Northampton, U.K","institution_ids":["https://openalex.org/I35870678"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000255892","display_name":"Ruochen Huang","orcid":"https://orcid.org/0000-0003-4292-6816"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Ruochen Huang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K"],"raw_orcid":"https://orcid.org/0000-0003-4292-6816","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100443540","display_name":"Liming Chen","orcid":"https://orcid.org/0000-0003-2720-2297"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Liming Chen","raw_affiliation_strings":["School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K"],"raw_orcid":"https://orcid.org/0000-0003-2720-2297","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009569523","display_name":"Anthony Peyton","orcid":"https://orcid.org/0000-0002-5740-348X"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Anthony Peyton","raw_affiliation_strings":["School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K"],"raw_orcid":"https://orcid.org/0000-0002-5740-348X","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100732225","display_name":"Wuliang Yin","orcid":"https://orcid.org/0000-0001-5927-3052"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wuliang Yin","raw_affiliation_strings":["School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K"],"raw_orcid":"https://orcid.org/0000-0001-5927-3052","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, The University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.115,"has_fulltext":true,"cited_by_count":41,"citation_normalized_percentile":{"value":0.94651439,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/eddy-current-sensor","display_name":"Eddy-current sensor","score":0.834740400314331},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"Eddy-current testing","score":0.7497380375862122},{"id":"https://openalex.org/keywords/eddy-current","display_name":"Eddy current","score":0.6172569394111633},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.5602335929870605},{"id":"https://openalex.org/keywords/radius","display_name":"RADIUS","score":0.551741898059845},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5486130118370056},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.502396821975708},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.49407556653022766},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.49302908778190613},{"id":"https://openalex.org/keywords/intersection","display_name":"Intersection (aeronautics)","score":0.45724865794181824},{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.4281465411186218},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4070166349411011},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2600432336330414},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2491629421710968},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.184120774269104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18310752511024475},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18148112297058105},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14478003978729248}],"concepts":[{"id":"https://openalex.org/C2777897478","wikidata":"https://www.wikidata.org/wiki/Q23718891","display_name":"Eddy-current sensor","level":3,"score":0.834740400314331},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.7497380375862122},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.6172569394111633},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.5602335929870605},{"id":"https://openalex.org/C178635117","wikidata":"https://www.wikidata.org/wiki/Q747499","display_name":"RADIUS","level":2,"score":0.551741898059845},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5486130118370056},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.502396821975708},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.49407556653022766},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.49302908778190613},{"id":"https://openalex.org/C64543145","wikidata":"https://www.wikidata.org/wiki/Q162942","display_name":"Intersection (aeronautics)","level":2,"score":0.45724865794181824},{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.4281465411186218},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4070166349411011},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2600432336330414},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2491629421710968},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.184120774269104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18310752511024475},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18148112297058105},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14478003978729248},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2020.3033377","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2020.3033377","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09237995.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:pure.atira.dk:openaire/83dc11aa-3182-471c-87fc-27e10e5f8832","is_oa":true,"landing_page_url":"https://research.manchester.ac.uk/en/publications/83dc11aa-3182-471c-87fc-27e10e5f8832","pdf_url":null,"source":{"id":"https://openalex.org/S4306400662","display_name":"Research Explorer (The University of Manchester)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I28407311","host_organization_name":"University of Manchester","host_organization_lineage":["https://openalex.org/I28407311"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Lu, M, Meng, X, Huang, R, Chen, L, Peyton, A & Yin, W 2020, 'Lift-off tolerant pancake eddy-current sensor for the thickness and spacing measurement of non-magnetic plates', IEEE Transactions on Instrumentation and Measurement, vol. 70, 9237995. https://doi.org/10.1109/tim.2020.3033377","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/tim.2020.3033377","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2020.3033377","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/9259274/09237995.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4999955137","display_name":"Real-time In-line Microstructural Engineering (RIME)","funder_award_id":"EP/P027237/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G788688093","display_name":null,"funder_award_id":"EP/P027237/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3093914592.pdf","grobid_xml":"https://content.openalex.org/works/W3093914592.grobid-xml"},"referenced_works_count":37,"referenced_works":["https://openalex.org/W83567045","https://openalex.org/W425268100","https://openalex.org/W1145079248","https://openalex.org/W1606198554","https://openalex.org/W1976805286","https://openalex.org/W1989824271","https://openalex.org/W1992356160","https://openalex.org/W2029414476","https://openalex.org/W2054142131","https://openalex.org/W2056299959","https://openalex.org/W2066691070","https://openalex.org/W2076193114","https://openalex.org/W2085550696","https://openalex.org/W2086722400","https://openalex.org/W2089938574","https://openalex.org/W2100788482","https://openalex.org/W2166207675","https://openalex.org/W2283879601","https://openalex.org/W2318904059","https://openalex.org/W2393874818","https://openalex.org/W2556157439","https://openalex.org/W2600651690","https://openalex.org/W2620969290","https://openalex.org/W2784727120","https://openalex.org/W2895926920","https://openalex.org/W2903808615","https://openalex.org/W2945440045","https://openalex.org/W2964175251","https://openalex.org/W2983477691","https://openalex.org/W2986280842","https://openalex.org/W2990170946","https://openalex.org/W2992597369","https://openalex.org/W3017172165","https://openalex.org/W3092086034","https://openalex.org/W3100670071","https://openalex.org/W3123679236","https://openalex.org/W6783474964"],"related_works":["https://openalex.org/W2744634501","https://openalex.org/W2085805524","https://openalex.org/W2003522138","https://openalex.org/W4296871629","https://openalex.org/W2551942315","https://openalex.org/W2333795440","https://openalex.org/W2101351116","https://openalex.org/W1973763794","https://openalex.org/W4384009611","https://openalex.org/W2120224426"],"abstract_inverted_index":{"The":[0],"liftoff":[1,35,51,65,80,189,206,241],"spacing":[2,66,190,207,242],"distance":[3,71],"between":[4,126],"the":[5,11,16,22,44,50,54,64,70,89,93,100,103,106,133,147,152,157,160,164,175,185,188,198,205,240],"eddy":[6],"current":[7],"(EC)":[8],"sensor":[9,28,83,107,150,166],"and":[10,19,38,121,128,151,191,208,225,236],"test":[12,101],"piece":[13],"will":[14],"influence":[15],"detected":[17,161],"signals":[18],"accuracy":[20],"of":[21,33,46,59,92,105,136,163,174,187,193,217,233],"measurement.":[23],"Various":[24],"techniques":[25],"including":[26],"novel":[27],"designs,":[29],"features":[30],"(liftoff":[31],"point":[32],"intersection,":[34],"invariance":[36],"phenomenon),":[37],"algorithms":[39,180],"have":[40,61,141,181],"been":[41,85,142,168,182],"proposed":[42,183,199],"for":[43,69,184,239],"compensation":[45],"error":[47,216,221],"caused":[48],"by":[49],"effect":[52],"using":[53,145,197],"EC":[55],"sensor.":[56,155,177,201],"However,":[57],"few":[58],"these":[60],"directly":[62],"measured":[63,212],"distance,":[67],"particularly":[68],"up":[72],"to":[73,99,245],"15":[74,246],"mm.":[75,247],"In":[76],"this":[77],"article,":[78],"a":[79,111,117,214],"tolerant":[81],"pancake":[82,114,149,200],"has":[84,167],"designed.":[86],"By":[87],"analyzing":[88],"sensitive":[90],"region":[91],"magnetic":[94],"vector":[95],"potential":[96],"change":[97],"(due":[98],"piece),":[102],"receiver":[104],"is":[108],"designed":[109,148,165],"as":[110],"circular":[112],"spiral":[113],"coil":[115],"with":[116,213],"large":[118],"mean":[119],"radius":[120],"span":[122],"length":[123],"(the":[124],"difference":[125],"inner":[127],"outer":[129],"radius).":[130],"Experiments":[131],"on":[132],"inductance":[134],"measurement":[135,186],"three":[137],"different":[138],"nonmagnetic":[139],"samples":[140,195],"carried":[143],"out":[144],"both":[146],"previous":[153],"triple-helix":[154,176],"From":[156],"experiment":[158],"results,":[159],"signal":[162],"proven":[169],"much":[170],"larger":[171],"than":[172],"that":[173,204],"Besides,":[178],"simplified":[179],"thickness":[192,209],"non-magnetic":[194],"when":[196],"Results":[202],"show":[203],"can":[210],"be":[211],"small":[215],"0.14":[218],"mm":[219],"(absolute":[220],"under":[222,229],"209.66":[223],"kHz),":[224],"1.35%":[226],"(relative":[227],"error,":[228],"low":[230],"working":[231],"frequencies":[232],"142,":[234],"238,":[235],"338":[237],"Hz)":[238],"from":[243],"1":[244]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":19},{"year":2020,"cited_by_count":8}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}