{"id":"https://openalex.org/W3094348593","doi":"https://doi.org/10.1109/tim.2020.3032190","title":"Autolabeling-Enhanced Active Learning for Cost-Efficient Surface Defect Visual Classification","display_name":"Autolabeling-Enhanced Active Learning for Cost-Efficient Surface Defect Visual Classification","publication_year":2020,"publication_date":"2020-10-21","ids":{"openalex":"https://openalex.org/W3094348593","doi":"https://doi.org/10.1109/tim.2020.3032190","mag":"3094348593"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3032190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3032190","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004324946","display_name":"Hua Yang","orcid":"https://orcid.org/0000-0002-5430-5630"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Hua Yang","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018410836","display_name":"Kaiyou Song","orcid":"https://orcid.org/0000-0001-8999-2680"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaiyou Song","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084090432","display_name":"Fangqin Mao","orcid":"https://orcid.org/0000-0001-8358-4045"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fangqin Mao","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053892414","display_name":"Zhouping Yin","orcid":"https://orcid.org/0000-0001-5766-2337"},"institutions":[{"id":"https://openalex.org/I47720641","display_name":"Huazhong University of Science and Technology","ror":"https://ror.org/00p991c53","country_code":"CN","type":"education","lineage":["https://openalex.org/I47720641"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhouping Yin","raw_affiliation_strings":["State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China"],"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, China","institution_ids":["https://openalex.org/I47720641"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5004324946"],"corresponding_institution_ids":["https://openalex.org/I47720641"],"apc_list":null,"apc_paid":null,"fwci":2.318,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.90140482,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"15"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11307","display_name":"Domain Adaptation and Few-Shot Learning","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/classifier","display_name":"Classifier (UML)","score":0.7604867219924927},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7580298781394958},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.7504202723503113},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.7243324518203735},{"id":"https://openalex.org/keywords/annotation","display_name":"Annotation","score":0.6053357124328613},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.5624330043792725},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4993910789489746},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4987804889678955}],"concepts":[{"id":"https://openalex.org/C95623464","wikidata":"https://www.wikidata.org/wiki/Q1096149","display_name":"Classifier (UML)","level":2,"score":0.7604867219924927},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7580298781394958},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.7504202723503113},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.7243324518203735},{"id":"https://openalex.org/C2776321320","wikidata":"https://www.wikidata.org/wiki/Q857525","display_name":"Annotation","level":2,"score":0.6053357124328613},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.5624330043792725},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4993910789489746},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4987804889678955}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2020.3032190","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3032190","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[{"id":"https://openalex.org/G3585931114","display_name":null,"funder_award_id":"51875228","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":66,"referenced_works":["https://openalex.org/W123226248","https://openalex.org/W175058090","https://openalex.org/W234388709","https://openalex.org/W1481724387","https://openalex.org/W1522301498","https://openalex.org/W1535602073","https://openalex.org/W1553262910","https://openalex.org/W1580375566","https://openalex.org/W1686810756","https://openalex.org/W1845402413","https://openalex.org/W1981759979","https://openalex.org/W1981772225","https://openalex.org/W1982088376","https://openalex.org/W2018770010","https://openalex.org/W2021732807","https://openalex.org/W2041404167","https://openalex.org/W2085989833","https://openalex.org/W2088866137","https://openalex.org/W2098742124","https://openalex.org/W2104657103","https://openalex.org/W2108598243","https://openalex.org/W2117763124","https://openalex.org/W2160354598","https://openalex.org/W2182919193","https://openalex.org/W2183341477","https://openalex.org/W2194775991","https://openalex.org/W2243397390","https://openalex.org/W2282078507","https://openalex.org/W2318156139","https://openalex.org/W2324566014","https://openalex.org/W2410718017","https://openalex.org/W2418691539","https://openalex.org/W2471138382","https://openalex.org/W2566365295","https://openalex.org/W2568595749","https://openalex.org/W2568998735","https://openalex.org/W2618574054","https://openalex.org/W2625840022","https://openalex.org/W2759824248","https://openalex.org/W2770908349","https://openalex.org/W2774685635","https://openalex.org/W2791709739","https://openalex.org/W2802735793","https://openalex.org/W2901849469","https://openalex.org/W2903158431","https://openalex.org/W2919115771","https://openalex.org/W2951911250","https://openalex.org/W2963446712","https://openalex.org/W2964121744","https://openalex.org/W2964292098","https://openalex.org/W2978725006","https://openalex.org/W3046698617","https://openalex.org/W3091905774","https://openalex.org/W4285719527","https://openalex.org/W6609025380","https://openalex.org/W6628647446","https://openalex.org/W6631190155","https://openalex.org/W6633054130","https://openalex.org/W6634787382","https://openalex.org/W6637373629","https://openalex.org/W6638701278","https://openalex.org/W6686222594","https://openalex.org/W6737985840","https://openalex.org/W6756582200","https://openalex.org/W6756615331","https://openalex.org/W6783596713"],"related_works":["https://openalex.org/W2361861616","https://openalex.org/W2263699433","https://openalex.org/W2377979023","https://openalex.org/W2218034408","https://openalex.org/W2392921965","https://openalex.org/W2358755282","https://openalex.org/W2625833328","https://openalex.org/W1533177136","https://openalex.org/W4380994516","https://openalex.org/W2556260348"],"abstract_inverted_index":{"Active":[0],"learning":[1,22,53,261],"can":[2,153,228,264],"reduce":[3,57,137,266],"the":[4,14,58,93,101,138,159,166,189,197,208,216,219,223,267,279],"human":[5,59,139,204,271],"effort":[6,61,268],"required":[7,62],"for":[8,63,103,122,128,278],"labeling":[9],"training":[10,90,96,162,232,243],"samples":[11,97,121,127,163,200,211,233],"while":[12,239],"preserving":[13],"performance":[15,238],"of":[16,31,88,158,183,282],"visual":[17,29,66,81,280],"classifiers.":[18],"However,":[19],"existing":[20],"active":[21,52,260],"frameworks":[23],"cannot":[24],"be":[25],"used":[26,213],"to":[27,56,117,135,214],"perform":[28],"classification":[30,281],"industrial":[32,250,283],"product":[33,284],"surface":[34,64,285],"defects":[35],"because":[36],"they":[37],"still":[38],"require":[39],"intensive":[40],"manual":[41],"annotation":[42,60,140,272],"efforts.":[43],"In":[44,168],"this":[45,169,184],"study,":[46,170],"we":[47],"propose":[48],"a":[49,73,80,108,142,156,171,236],"cost-efficient":[50],"autolabeling-enhanced":[51],"(ALEAL)":[54],"framework":[55,71],"defect":[65],"classification.":[67],"The":[68],"proposed":[69,116,147,179],"ALEAL":[70,151,227,263],"employs":[72],"deep":[74],"convolutional":[75],"neural":[76],"network":[77,176],"(CNN)":[78],"as":[79,180],"classifier":[82,102],"trained":[83],"from":[84,222],"an":[85,181],"initial":[86],"set":[87],"human-labeled":[89,242],"samples.":[91,195],"Then,":[92],"collected":[94],"unlabeled":[95,161,192,199],"are":[98,201,212],"input":[99],"into":[100],"category":[104],"confidence":[105],"estimation.":[106],"Next,":[107],"novel":[109,143,172],"diverse":[110],"cost-effective":[111],"query":[112],"strategy":[113],"(DCEQS)":[114],"is":[115,146,178,246],"select":[118],"some":[119,125],"high-confidence":[120],"autolabeling":[123,144,185,220],"and":[124,148,193,206,225,234,273],"informative":[126,160],"sample":[129],"proposals":[130],"that":[131,152],"need":[132],"labeling.":[133],"Subsequently,":[134],"further":[136],"effort,":[141],"module":[145,186],"introduced":[149],"in":[150,249,270],"automatically":[154,229],"label":[155,230],"portion":[157],"selected":[164],"by":[165,187,203],"DCEQS.":[167],"attention-based":[173],"similarity":[174,190],"measurement":[175],"(ASMN)":[177],"implementation":[182],"measuring":[188],"between":[191],"labeled":[194,210],"Finally,":[196],"remaining":[198],"annotated":[202],"experts,":[205],"all":[207],"newly":[209],"retrain":[215],"classifier.":[217],"Through":[218],"process":[221],"DCEQS":[224],"ASMN,":[226],"additional":[231],"achieve":[235,274],"competitive":[237],"requiring":[240],"few":[241],"samples,":[244],"which":[245],"highly":[247],"important":[248],"applications.":[251],"Extensive":[252],"experimental":[253],"results":[254],"show":[255],"that,":[256],"compared":[257],"with":[258],"popular":[259],"methods,":[262],"dramatically":[265],"involved":[269],"state-of-the-art":[275],"cost":[276],"efficiency":[277],"defects.":[286]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}