{"id":"https://openalex.org/W3096218176","doi":"https://doi.org/10.1109/tim.2020.3031208","title":"High-Precision ADC Testing With Relaxed Reference Voltage Stationarity","display_name":"High-Precision ADC Testing With Relaxed Reference Voltage Stationarity","publication_year":2020,"publication_date":"2020-10-26","ids":{"openalex":"https://openalex.org/W3096218176","doi":"https://doi.org/10.1109/tim.2020.3031208","mag":"3096218176"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3031208","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3031208","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5079364320","display_name":"Vivek Varier","orcid":"https://orcid.org/0000-0002-1550-2287"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Vivek Varier","raw_affiliation_strings":["The University of Texas at Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070329670","display_name":"Nan Sun","orcid":"https://orcid.org/0000-0002-5536-8385"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nan Sun","raw_affiliation_strings":["The University of Texas at Austin, Austin, TX, USA"],"affiliations":[{"raw_affiliation_string":"The University of Texas at Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5079364320"],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":0.3433,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.55509776,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.71947181224823},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7070413827896118},{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.6291128396987915},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5820103883743286},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.558003842830658},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5578824877738953},{"id":"https://openalex.org/keywords/voltage-reference","display_name":"Voltage reference","score":0.5045243501663208},{"id":"https://openalex.org/keywords/effective-number-of-bits","display_name":"Effective number of bits","score":0.4248684346675873},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.42321568727493286},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.4152466356754303},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4040795564651489},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23236560821533203},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.2319934368133545},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2062077522277832},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.19043919444084167},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11762645840644836},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10269704461097717}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.71947181224823},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7070413827896118},{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.6291128396987915},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5820103883743286},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.558003842830658},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5578824877738953},{"id":"https://openalex.org/C44351266","wikidata":"https://www.wikidata.org/wiki/Q1465532","display_name":"Voltage reference","level":3,"score":0.5045243501663208},{"id":"https://openalex.org/C16671190","wikidata":"https://www.wikidata.org/wiki/Q505579","display_name":"Effective number of bits","level":3,"score":0.4248684346675873},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.42321568727493286},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.4152466356754303},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4040795564651489},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23236560821533203},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2319934368133545},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2062077522277832},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.19043919444084167},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11762645840644836},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10269704461097717},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2020.3031208","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3031208","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1654121615","https://openalex.org/W2041846279","https://openalex.org/W2089767053","https://openalex.org/W2096636711","https://openalex.org/W2120402734","https://openalex.org/W2137446533","https://openalex.org/W2150395713","https://openalex.org/W2157668551","https://openalex.org/W2781391663","https://openalex.org/W2810102918","https://openalex.org/W2900411301","https://openalex.org/W2910213624","https://openalex.org/W2969667166","https://openalex.org/W6636960064","https://openalex.org/W6681928805"],"related_works":["https://openalex.org/W2914701507","https://openalex.org/W2905521207","https://openalex.org/W2168717468","https://openalex.org/W4386387962","https://openalex.org/W2942784010","https://openalex.org/W2982346272","https://openalex.org/W2984632578","https://openalex.org/W2341231357","https://openalex.org/W4378223939","https://openalex.org/W4205455251"],"abstract_inverted_index":{"This":[0],"article":[1],"seeks":[2],"to":[3,44,98,117],"simplify":[4],"the":[5,14,23,29,33,45,60,65,71,83,86,90,93,100,105],"scope":[6],"of":[7,17,32,85,92],"on-chip":[8],"built-in":[9],"self-test":[10],"(BIST)":[11],"schemes":[12,113],"for":[13,28,76],"static":[15],"testing":[16,37],"analog-to-digital":[18],"converters":[19],"(ADCs)":[20],"by":[21],"relaxing":[22],"precision":[24],"and":[25,49,89],"constancy":[26],"requirements":[27],"reference":[30,94],"voltage":[31],"system.":[34],"The":[35],"proposed":[36,72],"methodology":[38],"is":[39,108],"based":[40],"on":[41,64],"appropriate":[42],"modifications":[43],"\u201cstimulus":[46],"error":[47],"identification":[48],"removal":[50],"(SEIR)\u201d":[51],"algorithm":[52,73],"(Jin":[53],"et":[54],"al.,":[55],"2005),":[56],"which":[57],"already":[58],"addresses":[59],"stringent":[61],"linearity":[62,107],"constraints":[63],"input":[66,87],"stimulus.":[67],"Simulation":[68],"results":[69],"with":[70],"are":[74,96],"presented":[75],"a":[77],"prototype":[78],"14-bit":[79],"SAR":[80],"ADC,":[81],"wherein":[82],"nonlinearities":[84],"signal":[88],"nonstationarities":[91],"voltages":[95],"estimated":[97],"obtain":[99],"actual":[101],"ADC":[102,106],"performance.":[103],"Once":[104],"known,":[109],"standard":[110],"digital":[111],"calibration":[112],"can":[114],"be":[115],"employed":[116],"achieve":[118],"higher":[119],"resolution.":[120]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}