{"id":"https://openalex.org/W3088950075","doi":"https://doi.org/10.1109/tim.2020.3025375","title":"Fault Diagnosis Based on Multiscale Texture Features of Cable Terminal on EMU of High-Speed Railway","display_name":"Fault Diagnosis Based on Multiscale Texture Features of Cable Terminal on EMU of High-Speed Railway","publication_year":2020,"publication_date":"2020-09-21","ids":{"openalex":"https://openalex.org/W3088950075","doi":"https://doi.org/10.1109/tim.2020.3025375","mag":"3088950075"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.3025375","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3025375","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101850012","display_name":"Lei Guo","orcid":"https://orcid.org/0000-0002-3110-8167"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Lei Guo","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103101558","display_name":"Cao Wei-Dong","orcid":"https://orcid.org/0000-0001-5066-1147"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weidong Cao","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033776027","display_name":"Longlei Bai","orcid":"https://orcid.org/0000-0003-3454-2521"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Longlei Bai","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039512948","display_name":"Jingkang Zhang","orcid":"https://orcid.org/0000-0002-8341-8001"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jingkang Zhang","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074482054","display_name":"Limeng Xing","orcid":"https://orcid.org/0000-0003-1699-4030"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Limeng Xing","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070001320","display_name":"Enxin Xiang","orcid":"https://orcid.org/0000-0001-9315-8664"},"institutions":[{"id":"https://openalex.org/I74872605","display_name":"China Southern Power Grid (China)","ror":"https://ror.org/03hkh9419","country_code":"CN","type":"company","lineage":["https://openalex.org/I74872605"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Enxin Xiang","raw_affiliation_strings":["Electric Power Research Institute, Yunnan Power Grid Company Ltd., Kunming, China"],"affiliations":[{"raw_affiliation_string":"Electric Power Research Institute, Yunnan Power Grid Company Ltd., Kunming, China","institution_ids":["https://openalex.org/I74872605"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066087659","display_name":"Lijun Zhou","orcid":"https://orcid.org/0000-0002-6070-0020"},"institutions":[{"id":"https://openalex.org/I4800084","display_name":"Southwest Jiaotong University","ror":"https://ror.org/00hn7w693","country_code":"CN","type":"education","lineage":["https://openalex.org/I4800084"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lijun Zhou","raw_affiliation_strings":["School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Southwest Jiaotong University, Chengdu, China","institution_ids":["https://openalex.org/I4800084"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5101850012"],"corresponding_institution_ids":["https://openalex.org/I4800084"],"apc_list":null,"apc_paid":null,"fwci":1.4396,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.80727852,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":99},"biblio":{"volume":"70","issue":null,"first_page":"1","last_page":"12"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9958000183105469,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9779999852180481,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.6134158968925476},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5800724029541016},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5759131908416748},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.5612305402755737},{"id":"https://openalex.org/keywords/terminal","display_name":"Terminal (telecommunication)","score":0.5460754036903381},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5195427536964417},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4781152606010437},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.47304266691207886},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4421236515045166},{"id":"https://openalex.org/keywords/feature-vector","display_name":"Feature vector","score":0.44081854820251465},{"id":"https://openalex.org/keywords/higher-order-statistics","display_name":"Higher-order statistics","score":0.4285762310028076},{"id":"https://openalex.org/keywords/texture","display_name":"Texture (cosmology)","score":0.41447293758392334},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3648650646209717},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.36449897289276123},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32497912645339966},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.2967444062232971},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2369365096092224},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.19920742511749268},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.1865612268447876},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11296272277832031}],"concepts":[{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.6134158968925476},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5800724029541016},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5759131908416748},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.5612305402755737},{"id":"https://openalex.org/C2779664074","wikidata":"https://www.wikidata.org/wiki/Q3518405","display_name":"Terminal (telecommunication)","level":2,"score":0.5460754036903381},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5195427536964417},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4781152606010437},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.47304266691207886},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4421236515045166},{"id":"https://openalex.org/C83665646","wikidata":"https://www.wikidata.org/wiki/Q42139305","display_name":"Feature vector","level":2,"score":0.44081854820251465},{"id":"https://openalex.org/C2780576426","wikidata":"https://www.wikidata.org/wiki/Q5757980","display_name":"Higher-order statistics","level":4,"score":0.4285762310028076},{"id":"https://openalex.org/C2781195486","wikidata":"https://www.wikidata.org/wiki/Q289436","display_name":"Texture (cosmology)","level":3,"score":0.41447293758392334},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3648650646209717},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.36449897289276123},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32497912645339966},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2967444062232971},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2369365096092224},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.19920742511749268},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.1865612268447876},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11296272277832031},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2020.3025375","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.3025375","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3936356085","display_name":null,"funder_award_id":"2020JDTD0009","funder_id":"https://openalex.org/F4320333335","funder_display_name":"Sichuan Province Science and Technology Support Program"},{"id":"https://openalex.org/G5629531042","display_name":null,"funder_award_id":"51877183","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320333335","display_name":"Sichuan Province Science and Technology Support Program","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W145358992","https://openalex.org/W1065690011","https://openalex.org/W1875028359","https://openalex.org/W1988445395","https://openalex.org/W1999282904","https://openalex.org/W2044465660","https://openalex.org/W2069072543","https://openalex.org/W2110783109","https://openalex.org/W2111077104","https://openalex.org/W2120846928","https://openalex.org/W2130360612","https://openalex.org/W2149507913","https://openalex.org/W2285150994","https://openalex.org/W2409780327","https://openalex.org/W2768874222","https://openalex.org/W2808496542","https://openalex.org/W2892130917","https://openalex.org/W2936534246","https://openalex.org/W2945274917","https://openalex.org/W2951008556","https://openalex.org/W2968182272"],"related_works":["https://openalex.org/W2393409683","https://openalex.org/W2834849852","https://openalex.org/W4282008660","https://openalex.org/W2488364933","https://openalex.org/W2536936696","https://openalex.org/W2955994650","https://openalex.org/W2066632781","https://openalex.org/W2016042781","https://openalex.org/W2294135824","https://openalex.org/W3155062245"],"abstract_inverted_index":{"The":[0,42,63,220],"problem":[1],"to":[2,48,155],"identify":[3,227],"the":[4,26,33,105,108,114,160,165,181,185,190,198,203,234],"type":[5,66,229],"of":[6,13,22,32,37,44,67,107,120,159,162,241],"source":[7],"generating":[8],"discharges":[9],"detected":[10],"during":[11],"campaigns":[12],"partial":[14],"discharge":[15,85,245],"(PD)":[16],"measurements":[17],"in":[18,25,100],"cable":[19,59,70],"terminal":[20,60,71],"is":[21,47,72,237],"utmost":[23],"importance":[24],"quality":[27],"control":[28],"and":[29,54,84,92,117,141,146,189,208,213,231,233],"state":[30],"detection":[31],"power":[34],"supply":[35],"system":[36],"a":[38,50,55,130,151,242],"high-speed":[39,68,121],"railway":[40],"train.":[41],"purpose":[43],"this":[45,127,224],"article":[46,128],"provide":[49],"novel":[51],"PD":[52,61,65,76,82,139,143,163,228,244],"feature":[53,136,217],"potential":[56],"tool":[57],"for":[58],"identification.":[62],"traditional":[64],"train":[69,122],"usually":[73],"identified":[74],"by":[75,96,148,175,210],"test":[77,109],"parameters,":[78],"such":[79],"as":[80],"amplitude,":[81],"times,":[83],"energy.":[86],"These":[87],"features":[88,205],"contain":[89],"limited":[90],"information":[91,137],"are":[93,169,195,206],"easily":[94],"affected":[95],"external":[97],"factors,":[98],"resulting":[99],"large":[101],"numerical":[102],"fluctuations,":[103],"making":[104],"reliability":[106],"results":[110,221],"low,":[111],"which":[112],"makes":[113],"operation,":[115],"maintenance,":[116],"repair":[118],"decision":[119],"cables":[123],"very":[124],"difficult.":[125],"Therefore,":[126],"proposes":[129],"method":[131,225],"that":[132,223,240],"can":[133,226],"extract":[134],"rich":[135],"from":[138,197],"data":[140],"distinguish":[142],"types":[144],"accurately":[145,230],"reliably":[147],"combining":[149],"with":[150,215],"classification":[152],"algorithm.":[153],"First,":[154],"make":[156],"full":[157],"use":[158],"characteristics":[161],"data,":[164],"single-scale":[166],"PRPD":[167,173,200],"images":[168,174],"transformed":[170],"into":[171],"multiscale":[172,199],"using":[176],"image":[177],"pyramid":[178],"theory.":[179],"Then,":[180],"first-order":[182],"texture":[183,187,193],"statistics,":[184,188],"second-order":[186],"higher":[191],"order":[192],"statistics":[194],"extracted":[196],"space.":[201],"Finally,":[202],"input":[204],"optimized":[207],"classified":[209],"random":[211],"forest":[212],"compared":[214],"other":[216],"extraction":[218],"algorithms.":[219],"show":[222],"reliably,":[232],"recognition":[235],"accuracy":[236],"better":[238],"than":[239],"single":[243],"feature.":[246]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":5},{"year":2021,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}