{"id":"https://openalex.org/W3014781330","doi":"https://doi.org/10.1109/tim.2020.2985186","title":"Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations","display_name":"Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations","publication_year":2020,"publication_date":"2020-04-02","ids":{"openalex":"https://openalex.org/W3014781330","doi":"https://doi.org/10.1109/tim.2020.2985186","mag":"3014781330"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2020.2985186","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.2985186","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057441425","display_name":"Benedikt Kohlhepp","orcid":"https://orcid.org/0000-0002-0651-6839"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Benedikt Kohlhepp","raw_affiliation_strings":["Department of Electromagnetic Fields, Faculty of Engineering, Friedrich-Alexander University of Erlangen-N\u00fcrnberg (FAU), Erlangen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Electromagnetic Fields, Faculty of Engineering, Friedrich-Alexander University of Erlangen-N\u00fcrnberg (FAU), Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5015733621","display_name":"Daniel K\u00fcbrich","orcid":"https://orcid.org/0000-0002-1039-7924"},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Daniel Kubrich","raw_affiliation_strings":["Department of Electromagnetic Fields, Faculty of Engineering, Friedrich-Alexander University of Erlangen-N\u00fcrnberg (FAU), Erlangen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Electromagnetic Fields, Faculty of Engineering, Friedrich-Alexander University of Erlangen-N\u00fcrnberg (FAU), Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074780569","display_name":"Marvin Tannhauser","orcid":"https://orcid.org/0000-0002-4443-8042"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Marvin Tannhauser","raw_affiliation_strings":["Siemens AG, N\u00fcrnberg, Germany"],"affiliations":[{"raw_affiliation_string":"Siemens AG, N\u00fcrnberg, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101413195","display_name":"A. Hoffmann","orcid":"https://orcid.org/0000-0001-8816-6782"},"institutions":[{"id":"https://openalex.org/I1325886976","display_name":"Siemens (Germany)","ror":"https://ror.org/059mq0909","country_code":"DE","type":"company","lineage":["https://openalex.org/I1325886976"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Andreas Hoffmann","raw_affiliation_strings":["Siemens AG, F\u00fcrth, Germany"],"affiliations":[{"raw_affiliation_string":"Siemens AG, F\u00fcrth, Germany","institution_ids":["https://openalex.org/I1325886976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110678852","display_name":"Thomas D\u00fcrbaum","orcid":null},"institutions":[{"id":"https://openalex.org/I181369854","display_name":"Friedrich-Alexander-Universit\u00e4t Erlangen-N\u00fcrnberg","ror":"https://ror.org/00f7hpc57","country_code":"DE","type":"education","lineage":["https://openalex.org/I181369854"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Durbaum","raw_affiliation_strings":["Department of Electromagnetic Fields, Faculty of Engineering, Friedrich-Alexander University of Erlangen-N\u00fcrnberg (FAU), Erlangen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Electromagnetic Fields, Faculty of Engineering, Friedrich-Alexander University of Erlangen-N\u00fcrnberg (FAU), Erlangen, Germany","institution_ids":["https://openalex.org/I181369854"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5057441425"],"corresponding_institution_ids":["https://openalex.org/I181369854"],"apc_list":null,"apc_paid":null,"fwci":2.7661,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.90633807,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"69","issue":"10","first_page":"7740","last_page":"7751"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/clamping","display_name":"Clamping","score":0.7802035808563232},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5746150612831116},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5096089839935303},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46916016936302185},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4508396089076996},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.43768948316574097},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.4238497018814087},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.42032143473625183},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.41239356994628906},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.31120565533638},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.16839903593063354}],"concepts":[{"id":"https://openalex.org/C84111939","wikidata":"https://www.wikidata.org/wiki/Q5125465","display_name":"Clamping","level":2,"score":0.7802035808563232},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5746150612831116},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5096089839935303},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46916016936302185},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4508396089076996},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.43768948316574097},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.4238497018814087},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.42032143473625183},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.41239356994628906},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.31120565533638},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.16839903593063354},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2020.2985186","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2020.2985186","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8399999737739563,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W642739503","https://openalex.org/W2003558756","https://openalex.org/W2128164156","https://openalex.org/W2129203753","https://openalex.org/W2135331478","https://openalex.org/W2167002393","https://openalex.org/W2170965074","https://openalex.org/W2222829179","https://openalex.org/W2507848851","https://openalex.org/W2746756262","https://openalex.org/W2889148968","https://openalex.org/W2891260114","https://openalex.org/W2989927868","https://openalex.org/W3018217921","https://openalex.org/W3173708122","https://openalex.org/W4230361664","https://openalex.org/W6688787056","https://openalex.org/W6797633798"],"related_works":["https://openalex.org/W2047192493","https://openalex.org/W2174558087","https://openalex.org/W2070688558","https://openalex.org/W3216900515","https://openalex.org/W2375323968","https://openalex.org/W820893600","https://openalex.org/W2365637644","https://openalex.org/W4232260776","https://openalex.org/W3139069345","https://openalex.org/W2417422674"],"abstract_inverted_index":{"GaN-HEMTs":[0,145],"impress":[1],"with":[2,99,143],"excellent":[3],"properties,":[4],"and":[5,95],"therefore":[6],"power":[7,31],"electronics":[8],"engineers":[9],"pay":[10],"a":[11,69,76],"lot":[12],"of":[13,101,135],"attention":[14],"to":[15,54,60,88],"them.":[16],"However,":[17],"during":[18],"switching":[19,97],"operation":[20],"some":[21],"devices":[22],"show":[23],"increased":[24],"ON-state":[25,43,64,91],"resistance.":[26],"Since,":[27],"for":[28,72],"switch":[29,109],"mode":[30],"supply":[32],"designers,":[33],"the":[34,42,46,51,62,90,102,119,136,152],"internal":[35],"device":[36],"structure":[37],"is":[38,50,139],"not":[39],"apparent,":[40],"measuring":[41],"resistance":[44,92],"under":[45,93,111],"targeted":[47],"operating":[48,124],"conditions":[49,98],"only":[52],"method":[53],"gain":[55],"this":[56,66],"information.":[57],"In":[58,105],"order":[59],"characterize":[61],"dynamic":[63],"resistance,":[65],"article":[67],"proposes":[68],"clamping":[70,137],"circuit":[71,138],"accurate":[73],"measurement.":[74],"Using":[75],"high-resolution":[77],"digitizer":[78],"card":[79],"ensures":[80],"precise":[81],"results.":[82],"The":[83,148],"presented":[84,140],"measurement":[85],"setup":[86],"allows":[87],"measure":[89],"hard":[94,112],"soft":[96,116],"parameters":[100],"intended":[103],"application.":[104],"inverter":[106],"applications,":[107],"each":[108],"works":[110],"as":[113,115,146],"well":[114],"switching.":[117],"Therefore,":[118],"transition":[120],"between":[121],"these":[122],"two":[123],"modes":[125],"must":[126],"also":[127],"be":[128],"studied":[129],"in":[130],"detail.":[131],"Finally,":[132],"an":[133],"extension":[134],"allowing":[141],"measurements":[142],"high-voltage":[144],"well.":[147],"initial":[149],"results":[150],"verify":[151],"improved":[153],"setup.":[154]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":7},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}