{"id":"https://openalex.org/W2997740534","doi":"https://doi.org/10.1109/tim.2019.2961574","title":"Using a Natural Ratio to Compare DC and AC Resistances","display_name":"Using a Natural Ratio to Compare DC and AC Resistances","publication_year":2019,"publication_date":"2019-12-24","ids":{"openalex":"https://openalex.org/W2997740534","doi":"https://doi.org/10.1109/tim.2019.2961574","mag":"2997740534","pmid":"https://pubmed.ncbi.nlm.nih.gov/33132410"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2961574","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2961574","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7594435","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103165533","display_name":"Kwang Min Yu","orcid":"https://orcid.org/0000-0001-5999-0772"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Kwang Min Yu","raw_affiliation_strings":["Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043286311","display_name":"Dean G. Jarrett","orcid":"https://orcid.org/0000-0003-1392-423X"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dean G. Jarrett","raw_affiliation_strings":["Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091498998","display_name":"Andrew D. Koffman","orcid":"https://orcid.org/0000-0002-9628-0187"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Andrew D. Koffman","raw_affiliation_strings":["Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039812989","display_name":"Albert F. Rigosi","orcid":"https://orcid.org/0000-0002-8189-3829"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Albert F. Rigosi","raw_affiliation_strings":["Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082719299","display_name":"Shamith U. Payagala","orcid":"https://orcid.org/0000-0001-6359-8765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]},{"id":"https://openalex.org/I4210147263","display_name":"Material Measurement Laboratory","ror":"https://ror.org/04a0y3b96","country_code":"US","type":"government","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065","https://openalex.org/I4210147263"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shamith U. Payagala","raw_affiliation_strings":["Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"Quantum Measurement Division, National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I4210147263","https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101642282","display_name":"Kwon Sang Ryu","orcid":"https://orcid.org/0000-0003-0405-1190"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kwon Sang Ryu","raw_affiliation_strings":["Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019265938","display_name":"Jeon Hong Kang","orcid":"https://orcid.org/0000-0002-4518-5120"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeon Hong Kang","raw_affiliation_strings":["Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100750927","display_name":"Sang-Hwa Lee","orcid":"https://orcid.org/0000-0001-7153-7962"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Hwa Lee","raw_affiliation_strings":["Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea"],"affiliations":[{"raw_affiliation_string":"Center for Electricity and Magnetism, Korea Research Institute of Standards and Science, Daejon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5103165533"],"corresponding_institution_ids":["https://openalex.org/I2799611809"],"apc_list":null,"apc_paid":null,"fwci":0.1206,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.4978311,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"69","issue":"8","first_page":"5614","last_page":"5619"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9948999881744385,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9930999875068665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.44751641154289246},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.44133156538009644},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3617088198661804},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34719204902648926},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3027684688568115}],"concepts":[{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44751641154289246},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44133156538009644},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3617088198661804},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34719204902648926},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3027684688568115}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2019.2961574","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2961574","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmid:33132410","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/33132410","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on instrumentation and measurement","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:7594435","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7594435","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:pubmedcentral.nih.gov:7594435","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7594435","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W36474312","https://openalex.org/W1968814407","https://openalex.org/W1978766769","https://openalex.org/W1985473792","https://openalex.org/W1986633732","https://openalex.org/W2000380891","https://openalex.org/W2006432513","https://openalex.org/W2014716209","https://openalex.org/W2032869870","https://openalex.org/W2067897982","https://openalex.org/W2089546912","https://openalex.org/W2090296656","https://openalex.org/W2104343737","https://openalex.org/W2140236223","https://openalex.org/W2175523226","https://openalex.org/W2512396694","https://openalex.org/W2549395780","https://openalex.org/W2755544209","https://openalex.org/W2903286131","https://openalex.org/W2913077483","https://openalex.org/W2950051361","https://openalex.org/W3099127978","https://openalex.org/W3100475095","https://openalex.org/W3102714176"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W4404995717","https://openalex.org/W2016187641","https://openalex.org/W4404725684","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W4409278740","https://openalex.org/W2898370298"],"abstract_inverted_index":{"The":[0,61,117],"simulation":[1,119],"and":[2,9,22,31,59,91,114,142],"construction":[3],"of":[4,41,55,75,107,135],"a":[5,16,45,73,88,132,160],"direct":[6],"current":[7,11],"(DC)":[8],"alternating":[10],"(AC)":[12],"resistor,":[13],"based":[14,83,94],"on":[15,84,95],"silicon":[17],"wafer,":[18],"has":[19],"been":[20],"described":[21],"demonstrated.":[23],"By":[24],"applying":[25],"the":[26,32,39,42,56,85,92,96,102,123,139,149],"van":[27],"der":[28],"Pauw":[29],"method":[30],"Thompson-Lampard":[33],"theorem,":[34],"to":[35,126,153],"within":[36,127,154],"approximations":[37],"accommodating":[38],"conditions":[40],"resistor's":[43],"construction,":[44],"constant":[46,62],"resistance":[47],"ratio,":[48,63,104],"(\u03c0/ln2)<sup>2</sup>,":[49],"was":[50],"derived":[51],"that":[52],"is":[53],"independent":[54],"sample":[57],"resistivity":[58],"thickness.":[60],"valued":[64],"at":[65,158],"approximately":[66],"20.5,":[67],"can":[68],"theoretically":[69],"be":[70],"used":[71],"as":[72],"basis":[74],"comparison":[76],"between":[77],"two":[78],"distinct":[79],"calibration":[80],"chains,":[81],"one":[82],"traceability":[86],"from":[87,169],"calculable":[89],"capacitor":[90],"other":[93],"quantum":[97],"Hall":[98],"effect.":[99],"To":[100],"support":[101],"calculated":[103,150],"several":[105],"sets":[106],"simulations":[108],"were":[109],"performed":[110],"for":[111],"both":[112],"DC":[113,118,141],"AC":[115,143],"cases.":[116],"results":[120,146],"agreed":[121,147],"with":[122,148,157],"ratio":[124,151],"value":[125,152],"0.035":[128],"%":[129,162],"when":[130],"using":[131],"wafer":[133],"thickness":[134],"0.53":[136],"mm.":[137],"Additionally,":[138],"experimental":[140],"(1":[144],"kHz)":[145],"0.23":[155],"%,":[156],"most":[159],"0.06":[161],"standard":[163],"uncertainty":[164],"before":[165],"point":[166],"contact":[167],"errors":[168],"device":[170],"fabrication.":[171]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}