{"id":"https://openalex.org/W2995058944","doi":"https://doi.org/10.1109/tim.2019.2959294","title":"Design, Modeling, and Experimental Verification of a Hall-Effect-Based Linear Instrumentation System for Through-Shaft Angle Sensing","display_name":"Design, Modeling, and Experimental Verification of a Hall-Effect-Based Linear Instrumentation System for Through-Shaft Angle Sensing","publication_year":2019,"publication_date":"2019-12-13","ids":{"openalex":"https://openalex.org/W2995058944","doi":"https://doi.org/10.1109/tim.2019.2959294","mag":"2995058944"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2959294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2959294","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017821358","display_name":"British Ashok Sontakke","orcid":"https://orcid.org/0000-0002-6067-6227"},"institutions":[{"id":"https://openalex.org/I882761360","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14","country_code":"IN","type":"education","lineage":["https://openalex.org/I882761360"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"British Ashok Sontakke","raw_affiliation_strings":["Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","Dept. of Avionics, Indian Inst. of Space Sci. & Technol., Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0002-6067-6227","affiliations":[{"raw_affiliation_string":"Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]},{"raw_affiliation_string":"Dept. of Avionics, Indian Inst. of Space Sci. & Technol., Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041679557","display_name":"C. S. Anoop","orcid":"https://orcid.org/0000-0003-4819-7386"},"institutions":[{"id":"https://openalex.org/I882761360","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14","country_code":"IN","type":"education","lineage":["https://openalex.org/I882761360"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Chandrika Sreekantan Anoop","raw_affiliation_strings":["Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","Dept. of Avionics, Indian Inst. of Space Sci. & Technol., Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0003-4819-7386","affiliations":[{"raw_affiliation_string":"Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]},{"raw_affiliation_string":"Dept. of Avionics, Indian Inst. of Space Sci. & Technol., Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067718793","display_name":"Rahul Kumar","orcid":"https://orcid.org/0000-0003-3452-3160"},"institutions":[{"id":"https://openalex.org/I882761360","display_name":"Indian Institute of Space Science and Technology","ror":"https://ror.org/05k37ht14","country_code":"IN","type":"education","lineage":["https://openalex.org/I882761360"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rahul Kumar","raw_affiliation_strings":["Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","Dept. of Avionics, Indian Inst. of Space Sci. & Technol., Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0003-3452-3160","affiliations":[{"raw_affiliation_string":"Department of Avionics, Indian Institute of Space Science and Technology, Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]},{"raw_affiliation_string":"Dept. of Avionics, Indian Inst. of Space Sci. & Technol., Thiruvananthapuram, India","institution_ids":["https://openalex.org/I882761360"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5079280561","display_name":"Jishnu Vellimana Ramesh","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jishnu Vellimana Ramesh","raw_affiliation_strings":["Department of Electronics and Communication, College of Engineering, Thiruvananthapuram, India"],"raw_orcid":"https://orcid.org/0000-0002-7444-6959","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication, College of Engineering, Thiruvananthapuram, India","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3554,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.65259801,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"69","issue":"5","first_page":"2419","last_page":"2428"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10369","display_name":"Advanced MEMS and NEMS Technologies","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/instrumentation","display_name":"Instrumentation (computer programming)","score":0.7683974504470825},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39674657583236694},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3522418439388275},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.32247495651245117},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3210659623146057},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3070572018623352}],"concepts":[{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.7683974504470825},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39674657583236694},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3522418439388275},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.32247495651245117},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3210659623146057},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3070572018623352},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2959294","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2959294","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1574633900","https://openalex.org/W1987757091","https://openalex.org/W1998756577","https://openalex.org/W2011431440","https://openalex.org/W2012429047","https://openalex.org/W2024354368","https://openalex.org/W2053070779","https://openalex.org/W2053203453","https://openalex.org/W2151442477","https://openalex.org/W2205868801","https://openalex.org/W2297742466","https://openalex.org/W2309224223","https://openalex.org/W2401100436","https://openalex.org/W2528367837","https://openalex.org/W2606302816","https://openalex.org/W2790698107","https://openalex.org/W2792081307","https://openalex.org/W2799261677","https://openalex.org/W2895767866","https://openalex.org/W2934479373","https://openalex.org/W2972522937"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W3148032049"],"abstract_inverted_index":{"This":[0],"article":[1,90],"presents":[2],"a":[3,13,24,31,38,71,82,163,170,203,208],"simple":[4],"instrumentation":[5,158,193],"system":[6,159,194],"for":[7,49],"sensing":[8],"the":[9,50,62,87,92,98,123,130,152,157,167,173,180,191],"angular":[10],"position":[11],"of":[12,20,30,86,97,125,129,156,166,172,198,205],"through":[14],"shaft.":[15],"The":[16,53,64,89,105,141,154,175],"system,":[17],"broadly,":[18],"consists":[19],"two":[21],"parts:":[22],"1)":[23],"Hall-effect-based":[25],"sensor":[26,106,181],"module":[27],"(SM)":[28],"consisting":[29],"twin":[32],"eccentric-disc":[33],"rotating":[34],"arrangement":[35],"and":[36,74,94,100,143,149,169,182,202],"2)":[37],"linearizing":[39],"digital":[40],"converter":[41],"(LDC),":[42],"which":[43],"acts":[44],"as":[45,185],"an":[46,196],"efficient":[47],"interface":[48],"transducer":[51],"part.":[52],"SM":[54,168],"provides":[55],"cubic-natured":[56],"push-pull":[57],"outputs":[58],"with":[59,114],"respect":[60],"to":[61,80,121],"angle.":[63,88],"linearizer":[65,183],"further":[66],"accepts":[67],"these":[68,139],"signals,":[69],"performs":[70],"voltage-to-frequency":[72],"transformation,":[73],"then":[75],"applies":[76],"novel":[77],"linearization":[78],"function":[79],"render":[81],"linear":[83],"direct-digital":[84],"indication":[85],"discusses":[91],"design":[93],"theoretical":[95,115],"modeling":[96],"SM,":[99],"its":[101],"characteristics":[102,107],"are":[103,111,118,135,146],"derived.":[104],"observed":[108],"from":[109,138],"simulation":[110],"in":[112,151],"agreement":[113],"studies.":[116,140],"Simulations":[117],"also":[119,136,147],"extended":[120],"study":[122],"effect":[124],"important":[126],"mechanical/magnetic":[127],"parameters":[128],"SM.":[131],"Optimal":[132],"parameter":[133],"values":[134],"inferred":[137],"LDC":[142],"associated":[144],"methodologies":[145],"studied":[148],"presented":[150],"article.":[153],"performance":[155],"is":[160],"validated":[161],"using":[162],"hardware":[164],"model":[165],"prototype":[171],"LDC.":[174],"experimental":[176],"results":[177],"show":[178,189],"that":[179,190],"work":[184],"expected.":[186],"Interfacing":[187],"tests":[188],"overall":[192],"gives":[195],"accuracy":[197],"less":[199],"than":[200],"0.4%":[201],"resolution":[204],"0.2\u00b0":[206],"over":[207],"wide":[209],"range.":[210]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}