{"id":"https://openalex.org/W2985823868","doi":"https://doi.org/10.1109/tim.2019.2952705","title":"High-Sensitivity Detection of Hazardous Chemical by Special Featured Grating-Assisted Surface Plasmon Resonance Sensor Based on Bimetallic Layer","display_name":"High-Sensitivity Detection of Hazardous Chemical by Special Featured Grating-Assisted Surface Plasmon Resonance Sensor Based on Bimetallic Layer","publication_year":2019,"publication_date":"2019-11-13","ids":{"openalex":"https://openalex.org/W2985823868","doi":"https://doi.org/10.1109/tim.2019.2952705","mag":"2985823868"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2952705","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2952705","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027684114","display_name":"Sanjeev Kumar Raghuwanshi","orcid":"https://orcid.org/0000-0003-3820-2890"},"institutions":[{"id":"https://openalex.org/I189109744","display_name":"Indian Institute of Technology Dhanbad","ror":"https://ror.org/013v3cc28","country_code":"IN","type":"education","lineage":["https://openalex.org/I189109744"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sanjeev Kumar Raghuwanshi","raw_affiliation_strings":["Department of Electronics Engineering, IIT (ISM) Dhanbad, Dhanbad, India"],"raw_orcid":"https://orcid.org/0000-0003-3820-2890","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, IIT (ISM) Dhanbad, Dhanbad, India","institution_ids":["https://openalex.org/I189109744"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089057001","display_name":"Manish Kumar","orcid":"https://orcid.org/0000-0001-9513-2150"},"institutions":[{"id":"https://openalex.org/I189109744","display_name":"Indian Institute of Technology Dhanbad","ror":"https://ror.org/013v3cc28","country_code":"IN","type":"education","lineage":["https://openalex.org/I189109744"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Kumar","raw_affiliation_strings":["Department of Electronics Engineering, IIT (ISM) Dhanbad, Dhanbad, India"],"raw_orcid":"https://orcid.org/0000-0001-9513-2150","affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering, IIT (ISM) Dhanbad, Dhanbad, India","institution_ids":["https://openalex.org/I189109744"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065391306","display_name":"Sumit Kumar Jindal","orcid":"https://orcid.org/0000-0002-9676-3541"},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sumit Kumar Jindal","raw_affiliation_strings":["School of Electronics Engineering (SENSE), Vellore Institute of Technology (VIT), Vellore, India"],"raw_orcid":"https://orcid.org/0000-0002-9676-3541","affiliations":[{"raw_affiliation_string":"School of Electronics Engineering (SENSE), Vellore Institute of Technology (VIT), Vellore, India","institution_ids":["https://openalex.org/I876193797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061480590","display_name":"Ajay Kumar","orcid":"https://orcid.org/0000-0001-7084-7002"},"institutions":[{"id":"https://openalex.org/I187761245","display_name":"National Institute of Technology Jamshedpur","ror":"https://ror.org/01sebzx27","country_code":"IN","type":"education","lineage":["https://openalex.org/I187761245"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ajay Kumar","raw_affiliation_strings":["Department of ECE, National Institute of Technology (NIT), Jamshedpur, India"],"raw_orcid":"https://orcid.org/0000-0001-7084-7002","affiliations":[{"raw_affiliation_string":"Department of ECE, National Institute of Technology (NIT), Jamshedpur, India","institution_ids":["https://openalex.org/I187761245"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102000001","display_name":"Om Prakash","orcid":"https://orcid.org/0000-0002-5918-6554"},"institutions":[{"id":"https://openalex.org/I1289303365","display_name":"Raja Ramanna Centre for Advanced Technology","ror":"https://ror.org/02378jc90","country_code":"IN","type":"facility","lineage":["https://openalex.org/I1289303365","https://openalex.org/I2799351866","https://openalex.org/I3149292468"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Om Prakash","raw_affiliation_strings":["Fiber Grating Lab of Fiber Sensors (FGLFS), Raja Ramanna Centre for Advanced Technology (RRCAT), Indore, India"],"raw_orcid":"https://orcid.org/0000-0002-5918-6554","affiliations":[{"raw_affiliation_string":"Fiber Grating Lab of Fiber Sensors (FGLFS), Raja Ramanna Centre for Advanced Technology (RRCAT), Indore, India","institution_ids":["https://openalex.org/I1289303365"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5027684114"],"corresponding_institution_ids":["https://openalex.org/I189109744"],"apc_list":null,"apc_paid":null,"fwci":0.6978,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.68669498,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":"69","issue":"7","first_page":"5072","last_page":"5080"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10295","display_name":"Plasmonic and Surface Plasmon Research","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10295","display_name":"Plasmonic and Surface Plasmon Research","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10666","display_name":"Photonic Crystals and Applications","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.7932642698287964},{"id":"https://openalex.org/keywords/grating","display_name":"Grating","score":0.7649930715560913},{"id":"https://openalex.org/keywords/metamaterial","display_name":"Metamaterial","score":0.675291121006012},{"id":"https://openalex.org/keywords/surface-plasmon-resonance","display_name":"Surface plasmon resonance","score":0.6387875080108643},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.5880830883979797},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.5475219488143921},{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.510618269443512},{"id":"https://openalex.org/keywords/refractive-index","display_name":"Refractive index","score":0.4968571960926056},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4957066774368286},{"id":"https://openalex.org/keywords/diffraction","display_name":"Diffraction","score":0.49235737323760986},{"id":"https://openalex.org/keywords/surface-plasmon","display_name":"Surface plasmon","score":0.4833957254886627},{"id":"https://openalex.org/keywords/diffraction-grating","display_name":"Diffraction grating","score":0.4432939887046814},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.43676233291625977},{"id":"https://openalex.org/keywords/plasmon","display_name":"Plasmon","score":0.4181120991706848},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.16356167197227478},{"id":"https://openalex.org/keywords/nanoparticle","display_name":"Nanoparticle","score":0.11485129594802856},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.10267189145088196},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08187839388847351}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7932642698287964},{"id":"https://openalex.org/C2777813233","wikidata":"https://www.wikidata.org/wiki/Q1527816","display_name":"Grating","level":2,"score":0.7649930715560913},{"id":"https://openalex.org/C110367647","wikidata":"https://www.wikidata.org/wiki/Q497166","display_name":"Metamaterial","level":2,"score":0.675291121006012},{"id":"https://openalex.org/C106847996","wikidata":"https://www.wikidata.org/wiki/Q898756","display_name":"Surface plasmon resonance","level":3,"score":0.6387875080108643},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5880830883979797},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.5475219488143921},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.510618269443512},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.4968571960926056},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4957066774368286},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.49235737323760986},{"id":"https://openalex.org/C136676167","wikidata":"https://www.wikidata.org/wiki/Q1151829","display_name":"Surface plasmon","level":3,"score":0.4833957254886627},{"id":"https://openalex.org/C126753812","wikidata":"https://www.wikidata.org/wiki/Q653294","display_name":"Diffraction grating","level":3,"score":0.4432939887046814},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.43676233291625977},{"id":"https://openalex.org/C110879396","wikidata":"https://www.wikidata.org/wiki/Q58392","display_name":"Plasmon","level":2,"score":0.4181120991706848},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.16356167197227478},{"id":"https://openalex.org/C155672457","wikidata":"https://www.wikidata.org/wiki/Q61231","display_name":"Nanoparticle","level":2,"score":0.11485129594802856},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.10267189145088196},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08187839388847351},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2952705","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2952705","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G3808905563","display_name":null,"funder_award_id":"34/14/15/2018-BRNS/34102-[DAE (6)/2018-19/575/ECE]","funder_id":"https://openalex.org/F4320320768","funder_display_name":"Department of Atomic Energy, Government of India"}],"funders":[{"id":"https://openalex.org/F4320320768","display_name":"Department of Atomic Energy, Government of India","ror":"https://ror.org/02m388s04"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1967316210","https://openalex.org/W1975430787","https://openalex.org/W2011539969","https://openalex.org/W2017369243","https://openalex.org/W2017658627","https://openalex.org/W2032491762","https://openalex.org/W2040209036","https://openalex.org/W2069890182","https://openalex.org/W2082110158","https://openalex.org/W2084828434","https://openalex.org/W2085806044","https://openalex.org/W2086891790","https://openalex.org/W2093498930","https://openalex.org/W2103145586","https://openalex.org/W2150955499","https://openalex.org/W2155097139","https://openalex.org/W2157609259","https://openalex.org/W2166989768","https://openalex.org/W2167079047","https://openalex.org/W2196001592","https://openalex.org/W2460912125","https://openalex.org/W2464589007","https://openalex.org/W2893052099"],"related_works":["https://openalex.org/W2910747721","https://openalex.org/W2098412915","https://openalex.org/W2073524920","https://openalex.org/W2008856592","https://openalex.org/W2897594299","https://openalex.org/W4283512484","https://openalex.org/W2240569495","https://openalex.org/W2089749866","https://openalex.org/W2351403114","https://openalex.org/W2055615132"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"we":[3],"present":[4],"the":[5,51,66,69,73,78,99,104,111,127,133,152,168,189,214,222,225],"analysis":[6],"of":[7,31,81,98,129,170,216],"a":[8,90,123,148,210],"special":[9,52,174],"featured":[10,53,175],"grating-assisted":[11],"surface":[12],"plasmon":[13],"resonance":[14,130],"(SPR)":[15],"phenomena":[16],"by":[17],"multiple":[18,42],"stacked":[19,41],"metamaterial":[20,47,190,203],"and":[21,34],"silver":[22,35],"layers":[23,48],"as":[24,89],"one":[25],"grating":[26,57,91,100,116],"structure.":[27],"The":[28,115,161,173],"bimetallic":[29],"layer":[30,60,80,101,191,204],"gold":[32],"(Au)":[33],"(Ag)":[36],"has":[37,147,229],"been":[38,119,230],"used":[39,88,166],"with":[40,58,85,177,184,201],"negative":[43,144],"refractive":[44],"index":[45],"(NRI)":[46],"to":[49,64,110,125,220],"explore":[50],"sensing":[54,113,134],"capability.":[55],"NRI":[56,82],"Ag":[59,86],"supports":[61,107],"better":[62,108],"coupling":[63,109],"excite":[65],"multimode":[67],"for":[68,157,167,233],"proposed":[70,105],"structure":[71,92,106,176],"at":[72],"same":[74],"excitation":[75],"condition.":[76],"Hence,":[77,224],"alternating":[79],"material":[83],"along":[84,183],"is":[87,94,137,165,181,199,209],"that":[93,139],"an":[95],"excellent":[96],"combination":[97],"through":[102],"which":[103],"adjacent":[112],"region.":[114,135],"parameters":[117],"have":[118],"optimized":[120],"in":[121,132,213],"such":[122],"way":[124],"enhance":[126,221],"number":[128],"modes":[131],"It":[136],"found":[138],"SPR":[140],"sensor":[141,219],"sensitivity":[142,207,226],"using":[143],"diffraction":[145,159],"order":[146],"larger":[149],"dip,":[150],"while":[151],"resonant":[153],"angle":[154],"became":[155],"wider":[156],"positive":[158],"order.":[160],"transfer":[162],"matrix":[163],"method":[164],"calculation":[169],"various":[171],"parameters.":[172],"corresponding":[178],"response":[179],"graphs":[180],"described":[182],"discussing":[185],"what":[186],"happens":[187],"when":[188],"thickness":[192],"varies":[193],"(and":[194],"vice":[195],"versa).":[196],"Sensitivity":[197],"tunability":[198],"demonstrated":[200],"variable":[202],"thickness.":[205],"A":[206],"study":[208],"significant":[211],"parameter":[212],"design":[215],"any":[217],"high-sensitive":[218],"performance.":[223],"slope":[227],"property":[228],"explored":[231],"further":[232],"each":[234],"case.":[235]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}