{"id":"https://openalex.org/W2977033258","doi":"https://doi.org/10.1109/tim.2019.2944012","title":"Modeling the AC\u2013DC Transfer Difference of Wideband Cage-Type Current Shunts","display_name":"Modeling the AC\u2013DC Transfer Difference of Wideband Cage-Type Current Shunts","publication_year":2019,"publication_date":"2019-09-26","ids":{"openalex":"https://openalex.org/W2977033258","doi":"https://doi.org/10.1109/tim.2019.2944012","mag":"2977033258"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2944012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2944012","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5006069176","display_name":"G. A. Kyriazis","orcid":"https://orcid.org/0000-0002-7552-3602"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gregory A. Kyriazis","raw_affiliation_strings":["Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil"],"raw_orcid":"https://orcid.org/0000-0002-7552-3602","affiliations":[{"raw_affiliation_string":"Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101835006","display_name":"R. M. Souza","orcid":"https://orcid.org/0000-0001-7540-9896"},"institutions":[{"id":"https://openalex.org/I40891861","display_name":"Instituto Nacional de Metrologia, Qualidade e Tecnologia","ror":"https://ror.org/01f8vhd41","country_code":"BR","type":"government","lineage":["https://openalex.org/I2801200668","https://openalex.org/I2802647933","https://openalex.org/I40891861"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Regiane M. de Souza","raw_affiliation_strings":["Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil"],"raw_orcid":"https://orcid.org/0000-0001-7540-9896","affiliations":[{"raw_affiliation_string":"Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, Brazil","institution_ids":["https://openalex.org/I40891861"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062412967","display_name":"E. Yasuda","orcid":"https://orcid.org/0000-0002-8687-1426"},"institutions":[{"id":"https://openalex.org/I41147313","display_name":"National Institute of Industrial Technology","ror":"https://ror.org/046denk61","country_code":"AR","type":"funder","lineage":["https://openalex.org/I41147313"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Eliana Soledad Yasuda","raw_affiliation_strings":["Instituto Nacional de Tecnolog\u00eda Industrial (INTI), Buenos Aires, Argentina"],"raw_orcid":"https://orcid.org/0000-0002-8687-1426","affiliations":[{"raw_affiliation_string":"Instituto Nacional de Tecnolog\u00eda Industrial (INTI), Buenos Aires, Argentina","institution_ids":["https://openalex.org/I41147313"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001754651","display_name":"Lucas Di Lillo","orcid":"https://orcid.org/0000-0001-9126-1625"},"institutions":[{"id":"https://openalex.org/I41147313","display_name":"National Institute of Industrial Technology","ror":"https://ror.org/046denk61","country_code":"AR","type":"funder","lineage":["https://openalex.org/I41147313"]}],"countries":["AR"],"is_corresponding":false,"raw_author_name":"Lucas Di Lillo","raw_affiliation_strings":["Instituto Nacional de Tecnolog\u00eda Industrial (INTI), Buenos Aires, Argentina"],"raw_orcid":"https://orcid.org/0000-0001-9126-1625","affiliations":[{"raw_affiliation_string":"Instituto Nacional de Tecnolog\u00eda Industrial (INTI), Buenos Aires, Argentina","institution_ids":["https://openalex.org/I41147313"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.332,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.81523003,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"69","issue":"7","first_page":"4436","last_page":"4444"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wideband","display_name":"Wideband","score":0.6851524114608765},{"id":"https://openalex.org/keywords/shunt","display_name":"Shunt (medical)","score":0.6153068542480469},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.5735533833503723},{"id":"https://openalex.org/keywords/transfer-function","display_name":"Transfer function","score":0.5529230833053589},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5299666523933411},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.492511123418808},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.47723984718322754},{"id":"https://openalex.org/keywords/current-source","display_name":"Current source","score":0.46999773383140564},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4577890634536743},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4539863169193268},{"id":"https://openalex.org/keywords/peak-current","display_name":"Peak current","score":0.4129818379878998},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39743542671203613},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38207459449768066},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17732247710227966},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.1184801459312439}],"concepts":[{"id":"https://openalex.org/C2780202535","wikidata":"https://www.wikidata.org/wiki/Q4524457","display_name":"Wideband","level":2,"score":0.6851524114608765},{"id":"https://openalex.org/C2780968331","wikidata":"https://www.wikidata.org/wiki/Q1890115","display_name":"Shunt (medical)","level":2,"score":0.6153068542480469},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.5735533833503723},{"id":"https://openalex.org/C81299745","wikidata":"https://www.wikidata.org/wiki/Q334269","display_name":"Transfer function","level":2,"score":0.5529230833053589},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5299666523933411},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.492511123418808},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.47723984718322754},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.46999773383140564},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4577890634536743},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4539863169193268},{"id":"https://openalex.org/C2982819079","wikidata":"https://www.wikidata.org/wiki/Q1185136","display_name":"Peak current","level":4,"score":0.4129818379878998},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39743542671203613},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38207459449768066},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17732247710227966},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.1184801459312439},{"id":"https://openalex.org/C52859227","wikidata":"https://www.wikidata.org/wiki/Q7877","display_name":"Electrochemistry","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C164705383","wikidata":"https://www.wikidata.org/wiki/Q10379","display_name":"Cardiology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2944012","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2944012","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","id":"https://metadata.un.org/sdg/11","score":0.5899999737739563}],"awards":[{"id":"https://openalex.org/G6622281397","display_name":null,"funder_award_id":"490271/2011-1","funder_id":"https://openalex.org/F4320322025","funder_display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico"}],"funders":[{"id":"https://openalex.org/F4320322025","display_name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","ror":"https://ror.org/03swz6y49"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1524167685","https://openalex.org/W1603733504","https://openalex.org/W1996660488","https://openalex.org/W2000000437","https://openalex.org/W2024885563","https://openalex.org/W2045226176","https://openalex.org/W2073986150","https://openalex.org/W2098727463","https://openalex.org/W2105560431","https://openalex.org/W2108063580","https://openalex.org/W2129169058","https://openalex.org/W2141200692","https://openalex.org/W2141707986","https://openalex.org/W2151940577","https://openalex.org/W2257199776","https://openalex.org/W2324609500","https://openalex.org/W2480882144","https://openalex.org/W2742250972","https://openalex.org/W2894705485","https://openalex.org/W2898836830","https://openalex.org/W2898842999","https://openalex.org/W2899272180","https://openalex.org/W2987996462"],"related_works":["https://openalex.org/W116508656","https://openalex.org/W2410191826","https://openalex.org/W803323728","https://openalex.org/W4308389072","https://openalex.org/W1987689185","https://openalex.org/W3082229950","https://openalex.org/W2965950590","https://openalex.org/W2026548260","https://openalex.org/W2264835939","https://openalex.org/W2361570303"],"abstract_inverted_index":{"A":[0,16,46],"cage-type,":[1],"current-shunt":[2],"construction":[3],"design":[4,28],"was":[5],"adopted":[6],"in":[7,80],"this":[8,27],"article":[9],"as":[10],"prospectively":[11],"having":[12],"a":[13],"wide":[14],"bandwidth.":[15],"lumped":[17],"equivalent":[18],"circuit":[19],"model":[20],"for":[21],"current":[22,55,68],"shunts":[23,37,56],"assembled":[24],"according":[25],"to":[26,44,61],"is":[29],"described":[30],"here.":[31],"The":[32,65],"ac-dc":[33,67],"transfer":[34,69],"differences":[35,70],"of":[36,85],"with":[38,72],"the":[39,63,73,77,81],"nominal":[40],"currents":[41],"from":[42],"0.5":[43],"20":[45],"are":[47],"computed":[48],"using":[49],"standard":[50,78],"two-port":[51],"network":[52],"theory.":[53],"Cage-type":[54],"were":[57],"constructed":[58],"and":[59],"tested":[60],"validate":[62],"model.":[64],"measured":[66],"agree":[71],"predicted":[74],"values":[75],"within":[76],"uncertainties":[79],"whole":[82],"frequency":[83],"range":[84],"interest":[86],"(10":[87],"Hz-100":[88],"kHz).":[89]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":3}],"updated_date":"2026-06-19T17:40:00.097472","created_date":"2025-10-10T00:00:00"}