{"id":"https://openalex.org/W2974389404","doi":"https://doi.org/10.1109/tim.2019.2941360","title":"Using Programmable Josephson Voltage Standard for Static and Dynamic Gain Characterization of Integrating ADC","display_name":"Using Programmable Josephson Voltage Standard for Static and Dynamic Gain Characterization of Integrating ADC","publication_year":2019,"publication_date":"2019-09-18","ids":{"openalex":"https://openalex.org/W2974389404","doi":"https://doi.org/10.1109/tim.2019.2941360","mag":"2974389404"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2941360","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2941360","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://avesis.kocaeli.edu.tr/publication/details/03986824-0995-40e8-bfcd-eec0d80056ee/oai","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103281119","display_name":"Tezg\u00fcl Co\u015fkun \u00d6zt\u00fcrk","orcid":"https://orcid.org/0000-0002-0477-4674"},"institutions":[{"id":"https://openalex.org/I4210124062","display_name":"T\u00fcbitak National Metrology Institute","ror":"https://ror.org/02zcjdk53","country_code":"TR","type":"facility","lineage":["https://openalex.org/I4210124062"]}],"countries":["TR"],"is_corresponding":true,"raw_author_name":"Tezgul Coskun Ozturk","raw_affiliation_strings":["T\u00dcB\u0130TAK Ulusal Metroloji Enstit\u00fcs\u00fc (UME), Kocaeli, Turkey"],"raw_orcid":"https://orcid.org/0000-0002-0477-4674","affiliations":[{"raw_affiliation_string":"T\u00dcB\u0130TAK Ulusal Metroloji Enstit\u00fcs\u00fc (UME), Kocaeli, Turkey","institution_ids":["https://openalex.org/I4210124062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110212741","display_name":"Sarp Ert\u00fcrk","orcid":null},"institutions":[{"id":"https://openalex.org/I51826884","display_name":"Kocaeli \u00dcniversitesi","ror":"https://ror.org/0411seq30","country_code":"TR","type":"education","lineage":["https://openalex.org/I51826884"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Sarp Erturk","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Faculty of Engineering, Kocaeli Universitesi, Kocaeli, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Faculty of Engineering, Kocaeli Universitesi, Kocaeli, Turkey","institution_ids":["https://openalex.org/I51826884"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076532406","display_name":"Ali Tangel","orcid":"https://orcid.org/0000-0002-0569-6399"},"institutions":[{"id":"https://openalex.org/I51826884","display_name":"Kocaeli \u00dcniversitesi","ror":"https://ror.org/0411seq30","country_code":"TR","type":"education","lineage":["https://openalex.org/I51826884"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Ali Tangel","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Faculty of Engineering, Kocaeli Universitesi, Kocaeli, Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Faculty of Engineering, Kocaeli Universitesi, Kocaeli, Turkey","institution_ids":["https://openalex.org/I51826884"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015365882","display_name":"Mehedin Arifovi\u00e7","orcid":"https://orcid.org/0000-0002-8616-7287"},"institutions":[{"id":"https://openalex.org/I4210124062","display_name":"T\u00fcbitak National Metrology Institute","ror":"https://ror.org/02zcjdk53","country_code":"TR","type":"facility","lineage":["https://openalex.org/I4210124062"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Mehedin Arifovic","raw_affiliation_strings":["T\u00dcB\u0130TAK Ulusal Metroloji Enstit\u00fcs\u00fc (UME), Kocaeli, Turkey"],"raw_orcid":"https://orcid.org/0000-0002-8616-7287","affiliations":[{"raw_affiliation_string":"T\u00dcB\u0130TAK Ulusal Metroloji Enstit\u00fcs\u00fc (UME), Kocaeli, Turkey","institution_ids":["https://openalex.org/I4210124062"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5103281119"],"corresponding_institution_ids":["https://openalex.org/I4210124062"],"apc_list":null,"apc_paid":null,"fwci":0.4843,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.66130262,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"69","issue":"7","first_page":"4425","last_page":"4435"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.983299970626831,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6530877947807312},{"id":"https://openalex.org/keywords/analog-to-digital-converter","display_name":"Analog-to-digital converter","score":0.5162694454193115},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.44684097170829773},{"id":"https://openalex.org/keywords/integral-nonlinearity","display_name":"Integral nonlinearity","score":0.44518277049064636},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.44383394718170166},{"id":"https://openalex.org/keywords/traceability","display_name":"Traceability","score":0.4396533668041229},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.43935877084732056},{"id":"https://openalex.org/keywords/dynamic-testing","display_name":"Dynamic testing","score":0.4365115761756897},{"id":"https://openalex.org/keywords/differential-nonlinearity","display_name":"Differential nonlinearity","score":0.432117223739624},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.43189141154289246},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36390185356140137},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2632972300052643},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2374381124973297},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.12058031558990479},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1068044900894165}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6530877947807312},{"id":"https://openalex.org/C2777271169","wikidata":"https://www.wikidata.org/wiki/Q190169","display_name":"Analog-to-digital converter","level":3,"score":0.5162694454193115},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.44684097170829773},{"id":"https://openalex.org/C130829357","wikidata":"https://www.wikidata.org/wiki/Q1665386","display_name":"Integral nonlinearity","level":4,"score":0.44518277049064636},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.44383394718170166},{"id":"https://openalex.org/C153876917","wikidata":"https://www.wikidata.org/wiki/Q899704","display_name":"Traceability","level":2,"score":0.4396533668041229},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.43935877084732056},{"id":"https://openalex.org/C198824145","wikidata":"https://www.wikidata.org/wiki/Q442770","display_name":"Dynamic testing","level":2,"score":0.4365115761756897},{"id":"https://openalex.org/C71217194","wikidata":"https://www.wikidata.org/wiki/Q575958","display_name":"Differential nonlinearity","level":3,"score":0.432117223739624},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43189141154289246},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36390185356140137},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2632972300052643},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2374381124973297},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.12058031558990479},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1068044900894165},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tim.2019.2941360","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2941360","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:03986824-0995-40e8-bfcd-eec0d80056ee","is_oa":true,"landing_page_url":"https://avesis.kocaeli.edu.tr/publication/details/03986824-0995-40e8-bfcd-eec0d80056ee/oai","pdf_url":null,"source":{"id":"https://openalex.org/S7407055291","display_name":"Kocaeli \u00dcniversitesi - AVES\u0130S","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:03986824-0995-40e8-bfcd-eec0d80056ee","is_oa":true,"landing_page_url":"https://avesis.kocaeli.edu.tr/publication/details/03986824-0995-40e8-bfcd-eec0d80056ee/oai","pdf_url":null,"source":{"id":"https://openalex.org/S7407055291","display_name":"Kocaeli \u00dcniversitesi - AVES\u0130S","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/17","display_name":"Partnerships for the goals","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1968304866","https://openalex.org/W1974140108","https://openalex.org/W1977377847","https://openalex.org/W2003867184","https://openalex.org/W2009254132","https://openalex.org/W2017951488","https://openalex.org/W2036856904","https://openalex.org/W2037397915","https://openalex.org/W2054258554","https://openalex.org/W2058958240","https://openalex.org/W2096989336","https://openalex.org/W2104074527","https://openalex.org/W2121382939","https://openalex.org/W2131729362","https://openalex.org/W2140530035","https://openalex.org/W2158928027","https://openalex.org/W2170375577","https://openalex.org/W2510767962","https://openalex.org/W2566706182","https://openalex.org/W2768744112","https://openalex.org/W2782966584","https://openalex.org/W2921508558","https://openalex.org/W3102130313"],"related_works":["https://openalex.org/W2025217054","https://openalex.org/W2557005923","https://openalex.org/W2010414704","https://openalex.org/W2337962489","https://openalex.org/W2020763429","https://openalex.org/W4293085241","https://openalex.org/W1497465692","https://openalex.org/W2131872006","https://openalex.org/W2032723334","https://openalex.org/W1979402805"],"abstract_inverted_index":{"In":[0],"this":[1],"article,":[2],"programmable":[3],"Josephson":[4],"voltage":[5],"standard":[6],"(PJVS)":[7],"is":[8,29,37,50,58,67,77,128,137],"used":[9],"for":[10,21,39,88,150],"static":[11,35,54,73,145],"and":[12,74,113,146,160],"dynamic":[13,75,96,147],"analog-to-digital":[14],"converter":[15],"(ADC)":[16],"characterization.":[17],"A":[18],"mathematical":[19],"tool":[20],"investigating":[22],"the":[23,27,48,101,105,109,117,125,134,140,144],"quantum":[24],"state":[25],"of":[26,34,47,95,104,116,121,133,158],"measurement":[28,93,110],"given.":[30,129],"The":[31,42,52,69,92,130],"model":[32],"function":[33],"gain":[36,55,70,97,141,148],"derived":[38],"uncertainty":[40,122],"evaluation.":[41],"measured":[43,53],"integral":[44],"nonlinearity":[45],"(INL)":[46],"ADC":[49,62],"presented.":[51,59],"versus":[56],"time":[57],"Dynamic":[60],"integrating":[61],"(IADC)":[63],"characterization":[64],"using":[65],"PJVS":[66],"described.":[68],"difference":[71,142],"between":[72,143,154],"gains":[76],"investigated":[78],"up":[79],"to":[80,138],"500":[81],"Hz,":[82],"also":[83],"at":[84],"small":[85],"integration":[86],"times":[87],"different":[89],"sampling":[90],"conditions.":[91],"errors":[94],"are":[98],"evaluated":[99],"by":[100,124],"circuit":[102],"analysis":[103],"stray":[106],"components":[107],"in":[108],"setup,":[111],"noises,":[112],"spectrum":[114],"estimation":[115,123],"results.":[118],"An":[119],"example":[120],"work":[126,136],"done":[127],"main":[131],"contribution":[132],"presented":[135],"use":[139],"parameters":[149],"establishing":[151],"direct":[152],"traceability":[153],"SI":[155],"(International":[156],"System":[157],"Units)":[159],"digital":[161],"metrology.":[162]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}