{"id":"https://openalex.org/W2972679210","doi":"https://doi.org/10.1109/tim.2019.2941036","title":"Comparison of Multiple Methods for Obtaining P$\\Omega$ Resistances With Low Uncertainties","display_name":"Comparison of Multiple Methods for Obtaining P$\\Omega$ Resistances With Low Uncertainties","publication_year":2019,"publication_date":"2019-09-12","ids":{"openalex":"https://openalex.org/W2972679210","doi":"https://doi.org/10.1109/tim.2019.2941036","mag":"2972679210","pmid":"https://pubmed.ncbi.nlm.nih.gov/32116348"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2941036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2941036","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","pubmed"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7047754","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103165533","display_name":"Kwang Min Yu","orcid":"https://orcid.org/0000-0001-5999-0772"},"institutions":[{"id":"https://openalex.org/I2799611809","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475","country_code":"KR","type":"facility","lineage":["https://openalex.org/I2799611809","https://openalex.org/I2801339556","https://openalex.org/I4210144908","https://openalex.org/I4387152098"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Kwang Min Yu","raw_affiliation_strings":["Korea Research Institute of Standards and Science, Yusong, Daejon, 305-600, Korea","Korea Research Institute of Standards and Science, Daejon, South Korea"],"affiliations":[{"raw_affiliation_string":"Korea Research Institute of Standards and Science, Yusong, Daejon, 305-600, Korea","institution_ids":[]},{"raw_affiliation_string":"Korea Research Institute of Standards and Science, Daejon, South Korea","institution_ids":["https://openalex.org/I2799611809"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043286311","display_name":"Dean G. Jarrett","orcid":"https://orcid.org/0000-0003-1392-423X"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dean G. Jarrett","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039812989","display_name":"Albert F. Rigosi","orcid":"https://orcid.org/0000-0002-8189-3829"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Albert F. Rigosi","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082719299","display_name":"Shamith U. Payagala","orcid":"https://orcid.org/0000-0001-6359-8765"},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shamith U. Payagala","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I1321296531"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076757055","display_name":"Marlin E. Kraft","orcid":null},"institutions":[{"id":"https://openalex.org/I1321296531","display_name":"National Institute of Standards and Technology","ror":"https://ror.org/05xpvk416","country_code":"US","type":"funder","lineage":["https://openalex.org/I1321296531","https://openalex.org/I1343035065"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Marlin E. Kraft","raw_affiliation_strings":["National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","National Institute of Standards and Technology, Gaithersburg, USA"],"affiliations":[{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, MD 20899, USA","institution_ids":["https://openalex.org/I1321296531"]},{"raw_affiliation_string":"National Institute of Standards and Technology, Gaithersburg, USA","institution_ids":["https://openalex.org/I1321296531"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5103165533"],"corresponding_institution_ids":["https://openalex.org/I2799611809"],"apc_list":null,"apc_paid":null,"fwci":0.6451,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.76010745,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"69","issue":"6","first_page":"3729","last_page":"3738"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9681000113487244,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9681000113487244,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/omega","display_name":"Omega","score":0.8004086017608643},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.36209776997566223},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.36091724038124084},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35574081540107727},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3447628617286682},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.322967529296875},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13946595788002014}],"concepts":[{"id":"https://openalex.org/C2779557605","wikidata":"https://www.wikidata.org/wiki/Q9890","display_name":"Omega","level":2,"score":0.8004086017608643},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.36209776997566223},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.36091724038124084},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35574081540107727},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3447628617286682},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.322967529296875},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13946595788002014},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2019.2941036","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2941036","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmid:32116348","is_oa":false,"landing_page_url":"https://pubmed.ncbi.nlm.nih.gov/32116348","pdf_url":null,"source":{"id":"https://openalex.org/S4306525036","display_name":"PubMed","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE transactions on instrumentation and measurement","raw_type":null},{"id":"pmh:oai:pubmedcentral.nih.gov:7047754","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7047754","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"}],"best_oa_location":{"id":"pmh:oai:pubmedcentral.nih.gov:7047754","is_oa":true,"landing_page_url":"https://www.ncbi.nlm.nih.gov/pmc/articles/7047754","pdf_url":null,"source":{"id":"https://openalex.org/S2764455111","display_name":"PubMed Central","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1299303238","host_organization_name":"National Institutes of Health","host_organization_lineage":["https://openalex.org/I1299303238"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Trans Instrum Meas","raw_type":"Text"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6499999761581421}],"awards":[{"id":"https://openalex.org/G2104136844","display_name":null,"funder_award_id":"KRISS-2014-14011031","funder_id":"https://openalex.org/F4320322103","funder_display_name":"Korea Research Institute of Standards and Science"},{"id":"https://openalex.org/G3463728932","display_name":null,"funder_award_id":"14011001","funder_id":"https://openalex.org/F4320322103","funder_display_name":"Korea Research Institute of Standards and Science"}],"funders":[{"id":"https://openalex.org/F4320322103","display_name":"Korea Research Institute of Standards and Science","ror":"https://ror.org/01az7b475"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1533151001","https://openalex.org/W1975403646","https://openalex.org/W1979562229","https://openalex.org/W1992634239","https://openalex.org/W1997898072","https://openalex.org/W2024951342","https://openalex.org/W2029403318","https://openalex.org/W2034359171","https://openalex.org/W2048348297","https://openalex.org/W2060249399","https://openalex.org/W2068137811","https://openalex.org/W2071354645","https://openalex.org/W2078613864","https://openalex.org/W2110400547","https://openalex.org/W2111435280","https://openalex.org/W2140453713","https://openalex.org/W2513432069","https://openalex.org/W4285719527"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W4391375266","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"Capabilities":[0],"for":[1,7,50,119,132,146,154,163],"high":[2,44],"resistance":[3,101],"determinations":[4],"are":[5,69],"essential":[6],"calibration":[8],"of":[9,40,43,67],"currents":[10,36],"below":[11],"1":[12,82,117,120,147],"pA,":[13],"as":[14],"typically":[15,114],"requested":[16],"in":[17],"several":[18,48],"applications,":[19],"including":[20],"semiconductor":[21],"device":[22],"characterization,":[23],"single":[24],"electron":[25],"transport,":[26],"and":[27,63,89,110,124,128,157],"ion":[28],"beam":[29],"technologies.":[30],"This":[31],"need":[32],"to":[33,72,79,138,143,151,160],"calibrate":[34],"low":[35],"warrants":[37],"the":[38,54,106,111,129,133],"expansion":[39],"accessible":[41],"values":[42,109,113],"resistance.":[45],"We":[46],"present":[47],"methods":[49,76],"measuring":[51],"resistances":[52,127],"on":[53],"P\u03a9":[55,83,87,92,123,126],"scale,":[56],"namely":[57],"potentiometry,":[58],"dual":[59],"source":[60],"bridge":[61],"measurements,":[62],"teraohmmeter":[64],"usage,":[65],"all":[66,94],"which":[68],"subsequently":[70],"compared":[71],"theoretical":[73,112],"calculations.":[74],"These":[75],"were":[77,136],"used":[78],"measure":[80],"four":[81],"resistances,":[84],"one":[85,90],"10":[86,122,155],"resistance,":[88,93],"100":[91,125,164],"generated":[95],"by":[96],"wye-delta":[97],"networks":[98],"containing":[99],"three":[100,134],"elements.":[102],"The":[103],"differences":[104],"between":[105,140],"experimentally":[107],"obtained":[108],"agree":[115],"within":[116],"%":[118,142,145,150,153,159,162],"P\u03a9,":[121,148,156],"measurement":[130],"uncertainties":[131],"techniques":[135],"estimated":[137],"be":[139],"0.4":[141],"4.8":[144],"2.8":[149],"5.6":[152],"4.4":[158],"10.2":[161],"P\u03a9.":[165]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1}],"updated_date":"2026-01-13T01:12:25.745995","created_date":"2019-09-19T00:00:00"}