{"id":"https://openalex.org/W2972291529","doi":"https://doi.org/10.1109/tim.2019.2938905","title":"A Denoising Algorithm for Partial Discharge Measurement Based on the Combination of Wavelet Threshold and Total Variation Theory","display_name":"A Denoising Algorithm for Partial Discharge Measurement Based on the Combination of Wavelet Threshold and Total Variation Theory","publication_year":2019,"publication_date":"2019-09-02","ids":{"openalex":"https://openalex.org/W2972291529","doi":"https://doi.org/10.1109/tim.2019.2938905","mag":"2972291529"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2938905","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2938905","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052090099","display_name":"Ju Tang","orcid":"https://orcid.org/0000-0002-6397-1192"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ju Tang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101701331","display_name":"Siyuan Zhou","orcid":"https://orcid.org/0000-0002-2483-5403"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyuan Zhou","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080564197","display_name":"Cheng Pan","orcid":"https://orcid.org/0000-0003-4735-5047"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Cheng Pan","raw_affiliation_strings":["School of Electrical Engineering and Automation, Wuhan University, Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Wuhan University, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I37461747"],"apc_list":null,"apc_paid":null,"fwci":3.0719,"has_fulltext":false,"cited_by_count":67,"citation_normalized_percentile":{"value":0.92543918,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":"69","issue":"6","first_page":"3428","last_page":"3441"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.8187475204467773},{"id":"https://openalex.org/keywords/wavelet","display_name":"Wavelet","score":0.7277538776397705},{"id":"https://openalex.org/keywords/noise-reduction","display_name":"Noise reduction","score":0.5832768082618713},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5703999996185303},{"id":"https://openalex.org/keywords/ultra-high-frequency","display_name":"Ultra high frequency","score":0.4618045687675476},{"id":"https://openalex.org/keywords/white-noise","display_name":"White noise","score":0.4424256980419159},{"id":"https://openalex.org/keywords/wavelet-transform","display_name":"Wavelet transform","score":0.4314267635345459},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41194969415664673},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.34338605403900146},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3197740614414215},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.27824896574020386},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27711349725723267},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19070136547088623},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07900336384773254},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07485240697860718}],"concepts":[{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.8187475204467773},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.7277538776397705},{"id":"https://openalex.org/C163294075","wikidata":"https://www.wikidata.org/wiki/Q581861","display_name":"Noise reduction","level":2,"score":0.5832768082618713},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5703999996185303},{"id":"https://openalex.org/C96122199","wikidata":"https://www.wikidata.org/wiki/Q628096","display_name":"Ultra high frequency","level":2,"score":0.4618045687675476},{"id":"https://openalex.org/C112633086","wikidata":"https://www.wikidata.org/wiki/Q381287","display_name":"White noise","level":2,"score":0.4424256980419159},{"id":"https://openalex.org/C196216189","wikidata":"https://www.wikidata.org/wiki/Q2867","display_name":"Wavelet transform","level":3,"score":0.4314267635345459},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41194969415664673},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.34338605403900146},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3197740614414215},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.27824896574020386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27711349725723267},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19070136547088623},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07900336384773254},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07485240697860718}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2938905","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2938905","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G7930319854","display_name":null,"funder_award_id":"51607128","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W1088187922","https://openalex.org/W1931803241","https://openalex.org/W1937931689","https://openalex.org/W1964905295","https://openalex.org/W1975377467","https://openalex.org/W1992526455","https://openalex.org/W1996931026","https://openalex.org/W2007627365","https://openalex.org/W2016970698","https://openalex.org/W2018332268","https://openalex.org/W2040657720","https://openalex.org/W2050023599","https://openalex.org/W2080238139","https://openalex.org/W2103559027","https://openalex.org/W2115755118","https://openalex.org/W2146227109","https://openalex.org/W2146842127","https://openalex.org/W2154725633","https://openalex.org/W2158940042","https://openalex.org/W2162013506","https://openalex.org/W2164080904","https://openalex.org/W2274527110","https://openalex.org/W2280127120","https://openalex.org/W2482584425","https://openalex.org/W2602725909","https://openalex.org/W2761642992","https://openalex.org/W2796288942","https://openalex.org/W2910259740","https://openalex.org/W2920214992","https://openalex.org/W4214806317"],"related_works":["https://openalex.org/W2899793462","https://openalex.org/W2393409683","https://openalex.org/W3030614896","https://openalex.org/W2370825978","https://openalex.org/W2167810461","https://openalex.org/W2359152161","https://openalex.org/W3014772742","https://openalex.org/W2362540282","https://openalex.org/W2355917709","https://openalex.org/W2893215781"],"abstract_inverted_index":{"In":[0,33,106],"electrical":[1,20],"engineering,":[2],"partial":[3],"discharge":[4],"(PD)":[5],"measurement":[6],"is":[7,24,39,82,119],"frequently":[8],"employed":[9],"to":[10,59,86,108,122],"detect":[11],"insulation":[12,16],"defects":[13],"and":[14,46,96,135],"judge":[15],"conditions":[17],"of":[18,112,130],"high-voltage":[19],"apparatus.":[21],"However,":[22],"it":[23,81,124],"easily":[25],"corrupted":[26,66],"by":[27,54,67,91,101],"white":[28,68],"noises":[29],"in":[30,41],"the":[31,43,55,71,78,92,102,110,113,136,140,145],"field.":[32],"this":[34],"article,":[35],"a":[36,116],"joint":[37,79],"algorithm":[38,142],"proposed,":[40],"which":[42],"wavelet":[44,93],"threshold":[45,94],"total":[47],"variation":[48],"(TV)":[49],"denoising":[50,104],"methods":[51,74],"are":[52,75,133],"combined":[53],"convex":[56],"optimization":[57],"theory":[58],"denoise":[60],"ultrahigh":[61],"frequency":[62],"(UHF)":[63],"PD":[64],"signals":[65],"noises.":[69],"Since":[70],"two":[72],"respective":[73],"incorporated":[76],"into":[77],"algorithm,":[80,115],"with":[83,125],"high":[84],"potential":[85],"reduce":[87],"oscillation":[88],"error":[89,99],"introduced":[90,100],"method":[95],"eliminate":[97],"stair":[98],"TV":[103],"method.":[105],"order":[107],"validate":[109],"effect":[111],"proposed":[114,141],"numerical":[117],"simulation":[118],"carried":[120],"out":[121],"compare":[123],"several":[126],"existing":[127],"methods.":[128,147],"Indicators":[129],"their":[131],"performance":[132],"computed,":[134],"results":[137],"verify":[138],"that":[139],"outperforms":[143],"all":[144],"other":[146]},"counts_by_year":[{"year":2026,"cited_by_count":7},{"year":2025,"cited_by_count":9},{"year":2024,"cited_by_count":11},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":15},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":4}],"updated_date":"2026-07-25T15:57:00.446498","created_date":"2025-10-10T00:00:00"}