{"id":"https://openalex.org/W2973122325","doi":"https://doi.org/10.1109/tim.2019.2928381","title":"Guest Editors\u2019 Foreword Special Section on the 2018 IEEE International Workshop on Applied Measurements for Power Systems (AMPS 2018) Bologna, Italy, September 26\u201328, 2018","display_name":"Guest Editors\u2019 Foreword Special Section on the 2018 IEEE International Workshop on Applied Measurements for Power Systems (AMPS 2018) Bologna, Italy, September 26\u201328, 2018","publication_year":2019,"publication_date":"2019-09-13","ids":{"openalex":"https://openalex.org/W2973122325","doi":"https://doi.org/10.1109/tim.2019.2928381","mag":"2973122325"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2928381","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2019.2928381","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/8836328/08836354.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/19/8836328/08836354.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066443434","display_name":"Roberto Ferrero","orcid":"https://orcid.org/0000-0001-7820-9021"},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Roberto Ferrero","raw_affiliation_strings":["University of Liverpool, Liverpool, U.K"],"raw_orcid":"https://orcid.org/0000-0001-7820-9021","affiliations":[{"raw_affiliation_string":"University of Liverpool, Liverpool, U.K","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074674050","display_name":"Sara Sulis","orcid":"https://orcid.org/0000-0002-8848-426X"},"institutions":[{"id":"https://openalex.org/I172446870","display_name":"University of Cagliari","ror":"https://ror.org/003109y17","country_code":"IT","type":"education","lineage":["https://openalex.org/I172446870"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Sara Sulis","raw_affiliation_strings":["University of Cagliari, Cagliari, Italy"],"raw_orcid":"https://orcid.org/0000-0002-8848-426X","affiliations":[{"raw_affiliation_string":"University of Cagliari, Cagliari, Italy","institution_ids":["https://openalex.org/I172446870"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"68","issue":"10","first_page":"3799","last_page":"3800"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.6068999767303467,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.6068999767303467,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/special-section","display_name":"Special section","score":0.8675999641418457},{"id":"https://openalex.org/keywords/section","display_name":"Section (typography)","score":0.5063408613204956},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.477543443441391},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.45798081159591675},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.439222514629364},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.43828457593917847},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.42816779017448425},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4153001308441162},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.340854287147522},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23955011367797852},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13225418329238892}],"concepts":[{"id":"https://openalex.org/C2993458768","wikidata":"https://www.wikidata.org/wiki/Q3477549","display_name":"Special section","level":2,"score":0.8675999641418457},{"id":"https://openalex.org/C2780129039","wikidata":"https://www.wikidata.org/wiki/Q1931107","display_name":"Section (typography)","level":2,"score":0.5063408613204956},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.477543443441391},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.45798081159591675},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.439222514629364},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.43828457593917847},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.42816779017448425},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4153001308441162},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.340854287147522},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23955011367797852},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13225418329238892},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2928381","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2019.2928381","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/8836328/08836354.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/tim.2019.2928381","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tim.2019.2928381","pdf_url":"https://ieeexplore.ieee.org/ielx7/19/8836328/08836354.pdf","source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2973122325.pdf","grobid_xml":"https://content.openalex.org/works/W2973122325.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2560853036","https://openalex.org/W2566696415","https://openalex.org/W1563787543","https://openalex.org/W4249026152","https://openalex.org/W4244585678","https://openalex.org/W2909241626","https://openalex.org/W2890304493","https://openalex.org/W590015412","https://openalex.org/W4211021113","https://openalex.org/W2966241533"],"abstract_inverted_index":{"The":[0,50],"IEEE":[1],"International":[2],"Workshop":[3],"on":[4,46,69],"Applied":[5],"Measurements":[6],"for":[7,35],"Power":[8,26],"Systems":[9],"(AMPS)":[10],"is":[11],"the":[12,19,36,40,72],"main":[13],"event":[14],"promoted":[15],"by":[16],"TC-39":[17],"of":[18,42,57,71],"Instrumentation":[20],"and":[21,66],"Measurement":[22],"Society":[23],"(Measurements":[24],"in":[25,77],"Systems).":[27],"In":[28],"its":[29],"ninth":[30],"edition,":[31],"it":[32],"was":[33],"held":[34],"first":[37],"time":[38],"at":[39],"University":[41],"Bologna,":[43,44],"Italy,":[45],"September":[47],"26\u201328,":[48],"2018.":[49],"workshop":[51],"continued":[52],"a":[53],"very":[54],"successful":[55],"history":[56],"fruitful":[58],"scientific":[59],"discussion":[60],"among":[61],"researchers":[62],"from":[63],"both":[64],"academia":[65],"industry,":[67],"focusing":[68],"some":[70],"most":[73],"important":[74],"measurement":[75],"challenges":[76],"modern":[78],"power":[79],"systems.":[80]},"counts_by_year":[{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}