{"id":"https://openalex.org/W2956435558","doi":"https://doi.org/10.1109/tim.2019.2928348","title":"Enhanced Microcontroller Interface of Resistive Sensors Through Resistance-to-Time Converter","display_name":"Enhanced Microcontroller Interface of Resistive Sensors Through Resistance-to-Time Converter","publication_year":2019,"publication_date":"2019-07-12","ids":{"openalex":"https://openalex.org/W2956435558","doi":"https://doi.org/10.1109/tim.2019.2928348","mag":"2956435558"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2928348","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2928348","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052935683","display_name":"Ramya Anandanatarajan","orcid":"https://orcid.org/0000-0002-9133-9768"},"institutions":[{"id":"https://openalex.org/I122964287","display_name":"National Institute of Technology Tiruchirappalli","ror":"https://ror.org/047x65e68","country_code":"IN","type":"education","lineage":["https://openalex.org/I122964287"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ramya Anandanatarajan","raw_affiliation_strings":["Department of Instrumentation and Control Engineering, National Institute of Technology, Tiruchirappalli, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Instrumentation and Control Engineering, National Institute of Technology, Tiruchirappalli, India","institution_ids":["https://openalex.org/I122964287"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072908811","display_name":"M. Umapathy","orcid":"https://orcid.org/0000-0001-6732-8447"},"institutions":[{"id":"https://openalex.org/I122964287","display_name":"National Institute of Technology Tiruchirappalli","ror":"https://ror.org/047x65e68","country_code":"IN","type":"education","lineage":["https://openalex.org/I122964287"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Umapathy Mangalanathan","raw_affiliation_strings":["Department of Instrumentation and Control Engineering, National Institute of Technology, Tiruchirappalli, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Instrumentation and Control Engineering, National Institute of Technology, Tiruchirappalli, India","institution_ids":["https://openalex.org/I122964287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107988875","display_name":"Uma Gandhi","orcid":"https://orcid.org/0000-0003-0626-6304"},"institutions":[{"id":"https://openalex.org/I122964287","display_name":"National Institute of Technology Tiruchirappalli","ror":"https://ror.org/047x65e68","country_code":"IN","type":"education","lineage":["https://openalex.org/I122964287"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Uma Gandhi","raw_affiliation_strings":["Department of Instrumentation and Control Engineering, National Institute of Technology, Tiruchirappalli, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Instrumentation and Control Engineering, National Institute of Technology, Tiruchirappalli, India","institution_ids":["https://openalex.org/I122964287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I122964287"],"apc_list":null,"apc_paid":null,"fwci":4.2766,"has_fulltext":false,"cited_by_count":43,"citation_normalized_percentile":{"value":0.94777141,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":"69","issue":"6","first_page":"2698","last_page":"2706"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.7830196619033813},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.5745787024497986},{"id":"https://openalex.org/keywords/standard-deviation","display_name":"Standard deviation","score":0.5256639122962952},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4271990656852722},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.41576358675956726},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.3447273373603821},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.3226877450942993},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3175413906574249},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3046140968799591},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.1848745346069336}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.7830196619033813},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.5745787024497986},{"id":"https://openalex.org/C22679943","wikidata":"https://www.wikidata.org/wiki/Q159375","display_name":"Standard deviation","level":2,"score":0.5256639122962952},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4271990656852722},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.41576358675956726},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.3447273373603821},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.3226877450942993},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3175413906574249},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3046140968799591},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.1848745346069336}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2928348","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2928348","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5099999904632568}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W287569203","https://openalex.org/W1996889858","https://openalex.org/W2028190589","https://openalex.org/W2048054330","https://openalex.org/W2065151132","https://openalex.org/W2086585907","https://openalex.org/W2106135696","https://openalex.org/W2112666476","https://openalex.org/W2121827286","https://openalex.org/W2144409314","https://openalex.org/W2146230722","https://openalex.org/W2150753711","https://openalex.org/W2163581411","https://openalex.org/W2192101823","https://openalex.org/W2313288771","https://openalex.org/W2330679179","https://openalex.org/W2604294062","https://openalex.org/W2725064640","https://openalex.org/W3005609619","https://openalex.org/W4232815361","https://openalex.org/W4245349740","https://openalex.org/W6773298421"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4316095964","https://openalex.org/W2383001583","https://openalex.org/W2131084560","https://openalex.org/W2771395446","https://openalex.org/W3112038843","https://openalex.org/W3094215878","https://openalex.org/W2088310429","https://openalex.org/W3209836052","https://openalex.org/W2161641032"],"abstract_inverted_index":{"Systems":[0],"using":[1],"microcontrollers":[2],"make":[3],"the":[4,10,52,56,61,66,72,99,106,138,149,164,168,186,189,235],"interface":[5],"of":[6,55,125,137,148,157,163,188,191,231,234],"a":[7,42],"transducer":[8],"with":[9,76,119,238],"digital":[11],"world":[12],"much":[13],"easier.":[14],"They":[15],"build":[16],"smart,":[17],"lucid,":[18],"compact,":[19],"cheap,":[20],"and":[21,115,135,145,160,172,194,199,216,220],"less":[22],"power":[23],"consuming":[24],"electronic":[25],"interfaces.":[26],"Limited":[27],"acquisition":[28,53,121,229],"time":[29,54,75,230],"is":[30],"critical":[31],"for":[32],"many":[33],"industrial":[34],"applications.":[35],"Single-element":[36],"resistive":[37],"sensors":[38],"are":[39],"used":[40],"on":[41],"large":[43],"scale.":[44],"An":[45],"attempt":[46],"has":[47,227],"been":[48,82,142],"made":[49,83],"to":[50,60,71,87,90,102,213],"reduce":[51,88],"measuring":[57],"system":[58,151],"compared":[59],"existing":[62],"work":[63,96],"which":[64],"converts":[65],"change":[67,73,107],"in":[68,74,84,108,167,218,241],"sensor":[69],"resistance":[70],"three":[77],"charge\u2013discharge":[78,92],"cycles.":[79,93],"Efforts":[80],"have":[81,141],"this":[85,89],"paper":[86],"two":[91],"The":[94,123,155,223],"proposed":[95,139,150,165,224],"also":[97],"compensates":[98],"errors":[100,159,193],"due":[101],"lead":[103,109],"wire":[104,110],"resistance,":[105,111],"port":[112],"pin":[113],"resistances,":[114],"varying":[116],"ambient":[117],"temperature":[118],"reduced":[120],"time.":[122],"mean":[124,156,190],"absolute":[126,158,192],"errors,":[127],"standard":[128,161,195],"deviation,":[129],"integral":[130],"squared":[131],"error":[132],"(ISE),":[133],"nonlinearity,":[134],"hysteresis":[136],"method":[140,166,226,237],"computed.":[143],"Simulation":[144],"experimentation":[146],"study":[147],"provided":[152],"encouraging":[153],"results.":[154],"deviation":[162,196],"simulation":[169,219],"were":[170,197],"0.07":[171],"0.08":[173],"<inline-formula":[174,201],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[175,202],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">":[176,203],"<tex-math":[177,204],"notation=\"LaTeX\">$\\Omega":[178,205],"$":[179,206],"</tex-math></inline-formula>":[180,207],",":[181,208],"respectively.":[182,209,222],"Furthermore,":[183],"during":[184],"experimentation,":[185,221],"values":[187],"0.11":[198,200],"ISE":[210],"was":[211],"found":[212],"be":[214],"0.09":[215],"0.19":[217],"two-cycle":[225],"an":[228],"only":[232],"60%":[233],"three-cycle":[236],"no":[239],"reduction":[240],"performance.":[242]},"counts_by_year":[{"year":2026,"cited_by_count":3},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":6},{"year":2020,"cited_by_count":10}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}