{"id":"https://openalex.org/W2948028754","doi":"https://doi.org/10.1109/tim.2019.2920700","title":"A High-Sensitivity Resonant Tangential E-Probe With Loaded Improved Dipole and Embedded Integrated Balun","display_name":"A High-Sensitivity Resonant Tangential E-Probe With Loaded Improved Dipole and Embedded Integrated Balun","publication_year":2019,"publication_date":"2019-06-04","ids":{"openalex":"https://openalex.org/W2948028754","doi":"https://doi.org/10.1109/tim.2019.2920700","mag":"2948028754"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2920700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2920700","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100606290","display_name":"Jianwei Wang","orcid":"https://orcid.org/0000-0002-4028-8198"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jianwei Wang","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027985916","display_name":"Zhaowen Yan","orcid":"https://orcid.org/0000-0003-0994-7578"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaowen Yan","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034182755","display_name":"Wei Liu","orcid":"https://orcid.org/0000-0002-3880-7075"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wei Liu","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017747634","display_name":"Donglin Su","orcid":"https://orcid.org/0000-0003-4852-0569"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Donglin Su","raw_affiliation_strings":["School of Electronic and Information Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Electronic and Information Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100367769","display_name":"Xin Yan","orcid":"https://orcid.org/0000-0001-7481-8516"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Yan","raw_affiliation_strings":["EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100761733","display_name":"Jun Fan","orcid":"https://orcid.org/0000-0001-5674-033X"},"institutions":[{"id":"https://openalex.org/I20382870","display_name":"Missouri University of Science and Technology","ror":"https://ror.org/00scwqd12","country_code":"US","type":"education","lineage":["https://openalex.org/I20382870"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jun Fan","raw_affiliation_strings":["EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA"],"affiliations":[{"raw_affiliation_string":"EMC Laboratory, Missouri University of Science and Technology, Rolla, MO, USA","institution_ids":["https://openalex.org/I20382870"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5100606290"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":1.8096,"has_fulltext":false,"cited_by_count":55,"citation_normalized_percentile":{"value":0.85522569,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"68","issue":"8","first_page":"3042","last_page":"3044"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/balun","display_name":"Balun","score":0.8420766592025757},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.7188153266906738},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.625251054763794},{"id":"https://openalex.org/keywords/resonator","display_name":"Resonator","score":0.5558750629425049},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.551017701625824},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.49782276153564453},{"id":"https://openalex.org/keywords/resonance","display_name":"Resonance (particle physics)","score":0.4522646963596344},{"id":"https://openalex.org/keywords/rlc-circuit","display_name":"RLC circuit","score":0.447734534740448},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.40851685404777527},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.366452693939209},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3629039525985718},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3589822053909302},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.280071496963501},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2531607747077942},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2517625093460083},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.1806744635105133},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.16645601391792297},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.08407554030418396}],"concepts":[{"id":"https://openalex.org/C114489654","wikidata":"https://www.wikidata.org/wiki/Q805838","display_name":"Balun","level":3,"score":0.8420766592025757},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.7188153266906738},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.625251054763794},{"id":"https://openalex.org/C97126364","wikidata":"https://www.wikidata.org/wiki/Q349669","display_name":"Resonator","level":2,"score":0.5558750629425049},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.551017701625824},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.49782276153564453},{"id":"https://openalex.org/C139210041","wikidata":"https://www.wikidata.org/wiki/Q2145840","display_name":"Resonance (particle physics)","level":2,"score":0.4522646963596344},{"id":"https://openalex.org/C89880566","wikidata":"https://www.wikidata.org/wiki/Q323477","display_name":"RLC circuit","level":4,"score":0.447734534740448},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.40851685404777527},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.366452693939209},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3629039525985718},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3589822053909302},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.280071496963501},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2531607747077942},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2517625093460083},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.1806744635105133},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.16645601391792297},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.08407554030418396}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2019.2920700","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2920700","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6200000047683716}],"awards":[{"id":"https://openalex.org/G2904211840","display_name":null,"funder_award_id":"61427803","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6990995154","display_name":null,"funder_award_id":"61271044","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1966732226","https://openalex.org/W1976231106","https://openalex.org/W2020750445","https://openalex.org/W2093820492","https://openalex.org/W2517518879","https://openalex.org/W2604136476","https://openalex.org/W2765097732","https://openalex.org/W2804515523","https://openalex.org/W2886897736"],"related_works":["https://openalex.org/W2011144988","https://openalex.org/W1510532200","https://openalex.org/W4386249970","https://openalex.org/W2422781170","https://openalex.org/W2160660340","https://openalex.org/W2979048520","https://openalex.org/W2128088947","https://openalex.org/W4366495452","https://openalex.org/W2134249095","https://openalex.org/W2143601536"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,15,33],"high-sensitivity":[4],"resonant":[5,21,79,139],"probe":[6,22,80],"for":[7,96],"capturing":[8],"tangential":[9],"E-field":[10],"component":[11],"is":[12,89,112],"fabricated":[13],"on":[14],"four-layer":[16],"printed":[17],"circuit":[18,132],"board.":[19],"The":[20,101,119],"consists":[23],"of":[24,37,76,83,106,121],"an":[25,46],"improved":[26],"dipole":[27],"employed":[28],"to":[29,51,56,136],"further":[30],"enhance":[31],"sensitivity,":[32],"resonator":[34],"made":[35],"up":[36],"open-":[38],"and":[39,45,60,93,98,127,130],"short-circuit":[40],"stubs":[41],"achieving":[42],"specific":[43],"resonance,":[44],"integrated":[47],"Marchand":[48],"balun":[49],"used":[50],"transform":[52],"the":[53,57,62,69,73,77,107,122,138],"differential-mode":[54],"voltage":[55],"single-end":[58],"output":[59],"match":[61],"instrument":[63],"port":[64],"impedance":[65],"match.":[66],"Compared":[67],"with":[68],"referenced":[70],"broadband":[71],"probe,":[72],"relative":[74],"sensitivity":[75,103],"proposed":[78],"in":[81,104],"terms":[82,105],"|S":[84],"<sub":[85],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[86,116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">12</sub>":[87],"|":[88],"enhanced":[90],"by":[91],"13.21":[92],"14.82":[94],"dB":[95],"simulation":[97],"measurement,":[99],"respectively.":[100],"absolute":[102],"noise-equivalent":[108],"field":[109],"strength":[110],"(NEFS)":[111],"26.4":[113],"dB\u03bcV(Hz)":[114],"<sup":[115],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1/2</sup>":[117],".":[118],"measurements":[120],"passive":[123],"circuits":[124],"(microstrip":[125],"lines":[126],"coupled":[128],"lines)":[129],"active":[131],"module":[133],"are":[134],"conducted":[135],"validate":[137],"probe.":[140]},"counts_by_year":[{"year":2025,"cited_by_count":15},{"year":2024,"cited_by_count":12},{"year":2023,"cited_by_count":13},{"year":2022,"cited_by_count":12},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-03-27T05:58:40.876381","created_date":"2025-10-10T00:00:00"}