{"id":"https://openalex.org/W2942041893","doi":"https://doi.org/10.1109/tim.2019.2905884","title":"Identification of RF&MW Microcalorimeter Weak Points by Means of Uncertainty Analysis","display_name":"Identification of RF&MW Microcalorimeter Weak Points by Means of Uncertainty Analysis","publication_year":2019,"publication_date":"2019-04-25","ids":{"openalex":"https://openalex.org/W2942041893","doi":"https://doi.org/10.1109/tim.2019.2905884","mag":"2942041893"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2019.2905884","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2905884","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"type":"article","indexed_in":["arxiv","crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2107.00547","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009686210","display_name":"L. Oberto","orcid":"https://orcid.org/0000-0003-4073-0561"},"institutions":[{"id":"https://openalex.org/I4210136559","display_name":"Istituto Nazionale di Ricerca Metrologica","ror":"https://ror.org/03vn1bh77","country_code":"IT","type":"facility","lineage":["https://openalex.org/I4210104593","https://openalex.org/I4210136559","https://openalex.org/I4392021227"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Luca Oberto","raw_affiliation_strings":["Nanoscience and Materials Division, Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Nanoscience and Materials Division, Istituto Nazionale di Ricerca Metrologica (INRIM), Turin, Italy","institution_ids":["https://openalex.org/I4210136559"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5009686210"],"corresponding_institution_ids":["https://openalex.org/I4210136559"],"apc_list":null,"apc_paid":null,"fwci":0.1206,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.44348608,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"68","issue":"6","first_page":"1948","last_page":"1954"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.8042877912521362},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.8001128435134888},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.5666375756263733},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5561578273773193},{"id":"https://openalex.org/keywords/data-acquisition","display_name":"Data acquisition","score":0.5035645365715027},{"id":"https://openalex.org/keywords/a-priori-and-a-posteriori","display_name":"A priori and a posteriori","score":0.5006909370422363},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.49773576855659485},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.49216359853744507},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4793073236942291},{"id":"https://openalex.org/keywords/uncertainty-analysis","display_name":"Uncertainty analysis","score":0.4610231816768646},{"id":"https://openalex.org/keywords/coaxial","display_name":"Coaxial","score":0.45951902866363525},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.45578187704086304},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44505321979522705},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4297485947608948},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3735553026199341},{"id":"https://openalex.org/keywords/simulation","display_name":"Simulation","score":0.20069989562034607},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16202285885810852},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13429179787635803},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.1025974452495575}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8042877912521362},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.8001128435134888},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.5666375756263733},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5561578273773193},{"id":"https://openalex.org/C163985040","wikidata":"https://www.wikidata.org/wiki/Q1172399","display_name":"Data acquisition","level":2,"score":0.5035645365715027},{"id":"https://openalex.org/C75553542","wikidata":"https://www.wikidata.org/wiki/Q178161","display_name":"A priori and a posteriori","level":2,"score":0.5006909370422363},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.49773576855659485},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.49216359853744507},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4793073236942291},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.4610231816768646},{"id":"https://openalex.org/C51221625","wikidata":"https://www.wikidata.org/wiki/Q1751466","display_name":"Coaxial","level":2,"score":0.45951902866363525},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.45578187704086304},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44505321979522705},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4297485947608948},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3735553026199341},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.20069989562034607},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16202285885810852},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13429179787635803},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.1025974452495575},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tim.2019.2905884","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2019.2905884","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},{"id":"pmh:oai:arXiv.org:2107.00547","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2107.00547","pdf_url":"https://arxiv.org/pdf/2107.00547","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"pmh:oai:iris.inrim.it:11696/60407","is_oa":true,"landing_page_url":"http://hdl.handle.net/11696/60407","pdf_url":null,"source":{"id":"https://openalex.org/S4306400708","display_name":"CINECA IRIS Institutional Research Information System (IRIS Istituto Nazionale di Ricerca Metrologica)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I27837315","host_organization_name":"University of Michigan","host_organization_lineage":["https://openalex.org/I27837315"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2107.00547","is_oa":true,"landing_page_url":"http://arxiv.org/abs/2107.00547","pdf_url":"https://arxiv.org/pdf/2107.00547","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.47999998927116394,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1522319254","https://openalex.org/W1530777352","https://openalex.org/W1949997712","https://openalex.org/W1988095506","https://openalex.org/W1994384461","https://openalex.org/W1999674132","https://openalex.org/W2034662472","https://openalex.org/W2051026549","https://openalex.org/W2055577514","https://openalex.org/W2123015244","https://openalex.org/W2136959914","https://openalex.org/W2329954402","https://openalex.org/W2533252699","https://openalex.org/W2792288991","https://openalex.org/W2899363898","https://openalex.org/W4299973078"],"related_works":["https://openalex.org/W3212153563","https://openalex.org/W3130844878","https://openalex.org/W4312671192","https://openalex.org/W2387053421","https://openalex.org/W3015838480","https://openalex.org/W2071668446","https://openalex.org/W1980429525","https://openalex.org/W4205181462","https://openalex.org/W3139964550","https://openalex.org/W1486069742"],"abstract_inverted_index":{"Microcalorimeters":[0],"are":[1,23,86,139,150],"used":[2,170],"by":[3,58,96,142],"National":[4],"Metrology":[5],"Institutes":[6],"(NMIs)":[7],"for":[8],"the":[9,12,27,38,73,77,82,98,111,122,133,179,196,199,203],"realization":[10],"of":[11,40,45,55,124,144,198,202],"radio":[13],"frequency":[14],"and":[15,44,61,130,166,201],"microwaves":[16],"(RF&MW)":[17],"primary":[18],"power":[19,57],"standard.":[20],"Since":[21],"they":[22,92],"not":[24,87],"available":[25],"on":[26,110,153],"market,":[28],"NMIs":[29],"have":[30,107,157],"to":[31,66,71,89,131,194,208],"design":[32,39],"their":[33],"own":[34],"systems.":[35,49],"It":[36,184],"involves":[37],"complex":[41],"mechanical":[42,78],"structures":[43],"low-noise":[46],"data":[47,83],"acquisition":[48,84],"Resulting":[50],"setups":[51],"allow":[52],"precision":[53],"measurements":[54],"RF&MW":[56],"applying":[59],"difficult":[60],"time-consuming":[62],"measurement":[63,100,134,204],"techniques.":[64],"Weaknesses":[65],"be":[67,94,168,209],"addressed":[68],"in":[69,76,81,171],"order":[70],"improve":[72],"performance,":[74],"whether":[75],"structure":[79],"or":[80,175],"electronics,":[85],"easy":[88],"identify.":[90],"Anyway,":[91],"can":[93,167],"found":[95],"analyzing":[97],"microcalorimeter":[99,120],"uncertainty.":[101,135],"In":[102],"recent":[103],"years,":[104],"several":[105],"improvements":[106],"been":[108,158],"made":[109],"[Istituto":[112],"Nazionale":[113],"di":[114],"Ricerca":[115],"Metrologica":[116],"(INRIM),":[117],"Italy]":[118],"coaxial":[119],"with":[121],"aim":[123],"making":[125],"its":[126],"operation":[127],"more":[128],"stable":[129],"reduce":[132],"Its":[136],"weak":[137],"points":[138],"here":[140,162],"analyzed":[141],"means":[143],"a":[145,192],"comprehensive":[146],"uncertainty":[147,155],"budget.":[148],"Details":[149],"also":[151],"given":[152],"how":[154],"contributions":[156],"determined.":[159],"The":[160],"method":[161],"applied":[163],"is":[164,182,185],"general":[165],"conveniently":[169],"many":[172],"other":[173],"fields":[174],"applications,":[176],"provided":[177],"that":[178,206],"analytical":[180],"model":[181],"known.":[183],"useful":[186],"while":[187],"designing":[188],"an":[189],"experiment":[190],"and/or":[191],"posteriori":[193],"identify":[195],"parts":[197],"apparatus":[200],"setup":[205],"needs":[207],"optimized.":[210]},"counts_by_year":[{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2019-05-03T00:00:00"}